Search results for "Atomic force microscopy"
showing 10 items of 208 documents
Monitoring the formation of biosilica catalysed by histidine-tagged silicatein.
2004
Surface bound silicatein retains its biocatalytic activity, which was demonstrated by monitoring the immobilisation of silicatein using a histidine-tag chelating anchor and the subsequent biosilicification of SiO(2) on surfaces by surface plasmon resonance spectroscopy, atomic force microscopy and scanning electron microscopy.
Single quantum dot emission at telecom wavelengths from metamorphic InAs/InGaAs nanostructures grown on GaAs substrates
2011
3 figuras, 3 páginas.
Formation and Evolution of Nanoscale Metal Structures on ITO Surface by Nanosecond Laser Irradiations of Thin Au and Ag Films
2012
The effect of nanosecond laser irradiations on 5 nm thick sputter-deposited Au and Ag films on Indium-Tin-Oxide surface is investigated by atomic force microscopy (AFM) and scanning electron microscopy (SEM). After 500, 750, and 1000 mJ/cm 2 fluence irradiations, the breakup of the Au and Ag films into nanoscale islands is observed as a consequence of fast melting and solidification processes. The mean nanoparticles size and surface density are quantified, as a function of the laser fluence, by the AFM and SEM analyses. In particular, the comparison between the Au and Ag islands reveals the formation of larger islands in the case of Ag for each fixed fluence. The mechanism of the nanoscale …
The zero field self-organization of cobalt/surfactant nanocomposite thin films
2009
Cobalt nanostructures have been prepared by a chemical route based on the Co(II) reduction in the confined space of cobalt bis(2-ethylhexyl)sulfosuccinate (Co(DEHSS)(2)) reverse micelles dispersed in n-heptane. This procedure involves the rapid formation of surfactant softly coated Co nanostructures followed by a slow separation process of the magnetic-field responsive Co/surfactant nanocomposites from the liquid phase. The detailed structure of thin films of the Co/surfactant nanocomposites has been investigated by scanning force microscopy (SFM). The thin films were characterized by different anisotropic features. Micrometric long domains of self-aligned ellipsoidal NPs (tens of nanometer…
Lateral force microscopy of multiwalled carbon nanotubes
2009
Carbon nanotubes are usually imaged with the atomic force microscope (AFM) in non-contact mode. However, in many applications, such as mechanical manipulation or elasticity measurements, contact mode is used. The forces affecting the nanotube are then considerable and not fully understood. In this work lateral forces were measured during contact mode imaging with an AFM across a carbon nanotube. We found that, qualitatively, both magnitude and sign of the lateral forces to the AFM tip were independent of scan direction and can be concluded to arise from the tip slipping on the round edges of the nanotube. The dependence on the normal force applied to the tip and on the ratio between nanotub…
Magnetoelectric coupling driven by inverse magnetostriction in multiferroic BiMn3Mn4O12
2013
By means of neutron powder diffraction, we investigated the effect of the polar Bi$^{3+}$ ion on the magnetic ordering of the Mn$^{3+}$ ions in BiMn$_3$Mn$_4$O$_{12}$, the counterpart with \textit{quadruple} perovskite structure of the \textit{simple} perovskite BiMnO$_3$. The data are consistent with a \textit{noncentrosymmetric} spacegroup $Im$ which contrasts the \textit{centrosymmetric} one $I2/m$ previously reported for the isovalent and isomorphic compound LaMn$_3$Mn$_4$O$_{12}$, which gives evidence of a Bi$^{3+}$-induced polarization of the lattice. At low temperature, the two Mn$^{3+}$ sublattices of the $A'$ and $B$ sites order antiferromagnetically (AFM) in an independent manner …
Some experimental issues of AFM tip blind estimation. The effect of noise and resolution
2006
The convolution of tip shape on sample topography can introduce significant inaccuracy in an AFM image, when the tip radius is comparable to the typical dimension of the sample features to be observed. The blind estimation method allows one to obtain information on the AFM tip through an unknown characterizer sample and thus to perform the deconvolution of the tip shape from an image. When applying the blind estimation method to determine the AFM tip shape, some apparently trivial issues relating to the experimental operating parameters must be taken into account. In this paper, the effects of the operating parameters, e.g., sampling intervals (resolution) and instrumental noise, have been …
Application of atomic and nuclear techniques to the study of inhomogeneities in electrodeposited α-particle sources
2002
Three α-particle sources made by different methods of electrodeposition were analysed using α-particle spectrometry, Rutherford backscattering (RBS), and atomic force microscopy (AFM) on several surface zones. The thickness and homogeneity of these sources was studied using RBS, and the results were analysed jointly with those obtained with α-particle spectrometry and AFM techniques. The comparison of the electrodeposition methods showed that the most homogeneous electrodeposited zones corresponded to the source made with a stirring cathode.
Nanostructuring and strengthening of LiF crystals by swift heavy ions: AFM, XRD and nanoindentation study
2012
Abstract Modifications of the structure and micromechanical properties of LiF crystals under high-fluence irradiation (10 11 –10 13 ions cm −2 ) with swift C, Ti, Au and U ions of the specific energy of 11.1 MeV/u have been studied. In the case of heavy ions (U, Au), the AFM and SEM results reveal the bulk nanostructure consisting of columnar grains with nano-scale dimensions (50–100 nm). For lighter C ions the structure enriched with prismatic dislocation loops has been observed. High-resolution XRD reciprocal space maps for nano-structured LiF expose a mosaic-type structure with low-angle boundaries between grains.
MeV–GeV ion induced dislocation loops in LiF crystals
2014
Abstract Formation of prismatic dislocation loops and evolution of dislocation structure in LiF crystals irradiated with swift 238U and 36S ions of specific energy 11 MeV/u at fluences up to 1013 ions cm−2 has been investigated using chemical etching and AFM. It has been shown that prismatic dislocations are formed in the stage of track overlapping above threshold fluences Φ ≈ 109 U cm−2 and Φ ≈ 1010 S cm−2. The diameter of dislocation loops reaches 600–1000 nm for 238U ions and 200 nm for 36S ions. The dislocations created by 238U ions are arranged in rows along the direction of ion beam, whereas 36S ions create freely distributed dislocation loops each of them being oriented along the ion…