Search results for "Cavity magnetron"
showing 6 items of 16 documents
Effect of germanium addition on the properties of reactively sputtered ZrN films
2005
For the first time, Zr-Ge-N films were deposited on silicon and steel substrates by sputtering a Zr-Ge composite target in reactive Ar-N2 mixture. The films were characterised by electron probe microanalysis, X-ray diffraction, micro-Raman spectroscopy and depth-sensing indentation. The effects of the Ge content and substrate bias voltage on the films' structure, internal stress, hardness and oxidation resistance were investigated. Substrate bias strongly influenced the chemical composition of the films being observed by means of a steep decrease in the Ge content for negative bias voltages higher than -80 V. In these cases, a significant hardness improvement was registered. For -100 V bias…
Electrochemically shape-controlled transformation of magnetron sputtered platinum films into platinum nanostructures enclosed by high-index facets
2017
Abstract A new method based on transformation of magnetron sputtered platinum thin films into platinum nanostructures enclosed by high-index facets, using electrochemical potential cycling in a twin working electrode system is reported. The controllable formation of various Pt nanostructures, described in this paper, indicates that this method can be used to control a selective growth of high purity Pt nanostructures with specific shapes (facets or edges). The method opens up new possibilities for electrochemical preparation of nanostructured Pt catalysts at high yield.
Physicochemical characterisation of thermally aged anodic films on magnetron sputtered niobium
2010
The influence of thermal aging, at intermediate temperature (1h at 250°C) and in different environments, on the electronic and solid-state properties of stabilized 160 nm thick amorphous anodic niobia, grown on magnetron sputtered niobium metal, has been studied. A detailed physicochemical characterisation of the a-Nb2O5/0.5M H2SO4 electrolyte junction has been carried out by means of photocurrent and electrochemical impedance spectroscopy as well by differential admittance measurements. A change in the optical band gap (3.45 eV) of niobia film has been observed after aging (3.30 eV) at 250°C in air for 1 hour. A cathodic shift (0.15-0.2 Volt) in the flat band potential of the junction has …
Image charge shift in high-precision Penning traps
2019
An ion in a Penning trap induces image charges on the surfaces of the trap electrodes. These induced image charges are used to detect the ion's motional frequencies, but they also create an additional electric field, which shifts the free-space cyclotron frequency typically at a relative level of several ${10}^{\ensuremath{-}11}$. In various high-precision Penning-trap experiments, systematics and their uncertainties are dominated by this so-called image charge shift (ICS). The ICS is investigated in this work by a finite-element simulation and by a dedicated measurement technique. Theoretical and experimental results are in excellent agreement. The measurement is using singly stored ions a…
Preparation and x-ray pole-figure characterization of DC-sputtered Bi-2201, Bi-2212 and Bi-2223 thin films
1997
Thin films of the three members of the superconducting series , n = 1,2,3, were prepared by diode sputtering. X-ray characterization shows that all the films are single phase and c-axis oriented and in addition they are epitaxially grown. The latter is found by x-ray pole-figure measurements taken with a four-circle diffractometer. These are emphasized in this work. AC susceptibility measurements show that, while the 2201 films are not superconducting until 4 K, the transition temperatures of the 2212 films are 82 K - 90 K and of the 2223 films 84 K - 89 K.
Structure and composition of sputter-deposited nickel-tungsten oxide films
2011
Films of mixed nickel-tungsten oxide, denoted NixW1-x oxide, were prepared by reactive DC magnetron co-sputtering from metallic targets and were characterized by Rutherford backscattering spectrometry. X-ray photoelectron spectroscopy, X-ray diffractometry and Raman spectroscopy. A consistent picture of the structure and composition emerged, and at x<0.50 the films comprised a mixture of amorphous WO3 and nanosized NiWO4, at x = 0.50 the nanosized NiWO4 phase was dominating, and at x>0.50 the films contained nanosized NiO and NiWO4.