Search results for "CdTe"
showing 10 items of 26 documents
Digital performance improvements of a CdTe pixel detector for high flux energy-resolved X-ray imaging
2015
Abstract Photon counting detectors with energy resolving capabilities are desired for high flux X-ray imaging. In this work, we present the performance of a pixelated Schottky Al/p-CdTe/Pt detector (4×4) coupled to a custom-designed digital readout electronics for high flux measurements. The detector (4×4×2 mm 3 ) has an anode layout based on an array of 16 pixels with a geometric pitch of 1 mm (pixel size of 0.6 mm). The 4-channel readout electronics is able to continuously digitize and process the signals from each pixel, performing multi-parameter analysis (event arrival time, pulse shape, pulse height, pulse time width, etc.) even at high fluxes and at different throughput and energy re…
Polarization phenomena in Al/p-CdTe/Pt X-ray detectors
2013
Over the last decades, CdTe detectors are widely used for the development of room temperature X-ray and gamma ray spectrometers. Typically, high resolution CdTe detectors are fabricated with blocking contacts (indium, aluminum) ensuring low leakage currents and high electric field for optimum charge collection. As well known, time instability under bias voltage (termed as polarization) is the major drawback of CdTe diode detectors. Polarization phenomena cause a progressive degradation of the spectroscopic performance with time, due to hole trapping and detrapping from deep acceptors levels. In this work, we studied the polarization phenomenon on new Al/p-CdTe/Pt detectors, manufactured by …
Electrical Characterization of CdTe pixel detectors with Al Schottky anode
2014
Abstract Pixelated Schottky Al/p-CdTe/Pt detectors are very attractive devices for high-resolution X-ray spectroscopic imaging, even though they suffer from bias-induced time instability (polarization). In this work, we present the results of the electrical characterization of a (4×4) pixelated Schottky Al/p-CdTe/Pt detector. Current–voltage ( I–V ) characteristics and current transients were investigated at different temperatures. The results show deep levels that play a dominant role in the charge transport mechanism. The conduction mechanism is dominated by the space charge limited current (SCLC) both under forward bias and at high reverse bias. Schottky barrier height of the Al/CdTe con…
Performance of a digital CdTe X-ray spectrometer in low and high counting rate environment
2010
Abstract The high performances of CdTe detectors for X-ray and gamma ray spectroscopy are already well known. Among the traditional semiconductor spectrometers, CdTe detectors show high detection efficiency and good room temperature performance and are well suited for the development of compact detection systems. In this work, we investigated the performance of a CdTe detector coupled with a custom digital pulse processing (DPP) system for X-ray spectroscopy. The DPP method, implemented on a PC platform, performs a pile-up inspection and a pulse height analysis of the preamplifier output pulses, digitized by a 14-bit, 100 MHz ADC. The spectroscopic results point out the excellent performanc…
Fenomeni di polarizzazione in rivelatori Al/CdTe/Pt per spettroscopia X e gamma
2014
L’uso dei rivelatori a semiconduttore ha avuto, negli anni, un’importanza strategica nella spettroscopia X e gamma (1 keV – 2 MeV), con eccellenti risultati sia in applicazioni mediche che astrofisiche. L’imaging medicale (mammografia, tomografia computerizzata), il monitoraggio ambientale (radiazione di fondo), rivelatori da piano focale per telescopi X in astrofisica e sistemi di fluorescenza a raggi X nei Beni Culturali ne rappresentano alcune importanti applicazioni. I rivelatori a semiconduttore hanno trovato largo impiego grazie alle loro interessanti proprietà soprattutto se confrontate con i sistemi di rivelazione tradizionali (a gas e scintillatori); un migliore rapporto segnale-ru…
Digital CZT detector system for high flux energy-resolved X-ray imaging
2017
Photon counting arrays with energy resolving capabilities are recently desired for the next-generation X-ray imaging systems. In this work, we present the performance of a 2 mm thick CZT pixel detector, with pixel pitches of 500 mu m and 250 mu m, coupled to a fast and low noise ASIC (PIXIE ASIC), characterized by only the preamplifier stage. A 16-channel digital readout electronics was used to continuously digitize and process each output channel from the PIXIE ASIC, performing multi-parameter analysis (event arrival time, pulse shape, pulse height) at low and high input counting rates (ICRs). The spectroscopic response of the system to monochromatic X-ray and gamma ray sources, at both lo…
Direct Measurement of Mammographic X-Ray Spectra with a Digital CdTe Detection System
2012
In this work we present a detection system, based on a CdTe detector and an innovative digital pulse processing (DPP) system, for high-rate X-ray spectroscopy in mammography (1–30 keV). The DPP system performs a height and shape analysis of the detector pulses, sampled and digitized by a 14-bit, 100 MHz ADC. We show the results of the characterization of the detection system both at low and high photon counting rates by using monoenergetic X-ray sources and a nonclinical X-ray tube. The detection system exhibits excellent performance up to 830 kcps with an energy resolution of 4.5% FWHM at 22.1 keV. Direct measurements of clinical molybdenum X-ray spectra were carried out by using a pinhole…
Time-dependent electric field in Al/CdTe/Pt detectors
2015
Abstract Al/CdTe/Pt detectors are very attractive devices for high-resolution X-ray spectroscopy, even though they suffer from bias-induced time instability (polarization). Polarization phenomena cause a progressive time-degradation of the spectroscopic performance of the detectors, due to hole trapping and detrapping from deep acceptor levels that directly control the electric field distribution. In this work we present experimental investigations on the electric field profile of planar Al/CdTe/Pt detectors by means of Pockels effect measurements. The time/temperature dependence of the electric field was investigated in a long time window (up to 10 h) and the correlation with the reverse c…
Characterization of Al-Schottky CdTe detectors
2011
In the last decades, great efforts are being devoted to the development of CdTe detectors for high resolution X-ray and gamma ray spectroscopy. Recently, new rectifying contacts based on aluminum (Al) are very appealing in the development of CdTe detectors with low leakage currents and anode pixellization. In this work, we report on preliminary results of electrical and spectroscopic investigations on Schottky CdTe diode detectors (4.1 × 4.1 × 0.75 and 4.1 × 4.1 × 2 mm3) with Au/Ti/Al/CdTe/Pt electrode configuration. The detectors are characterized by very low leakage currents even at room temperature (26 pA at 25 °C under a bias voltage of −100 V for the 2 mm thick detector). Polarization …
Experimental results from Al/p-CdTe/Pt X-ray detectors
2013
Recently, Al/CdTe/Pt detectors have been proposed for the development of high resolution X-ray spectrometers. Due to the low leakage currents, these detectors allow high electric fields and the pixellization of anodes with the possibility to realize single charge carrier sensing detectors. In this work, we report on the results of electrical and spectroscopic investigations on CdTe diode detectors with Al/CdTe/Pt electrode configuration (4.1×4.1×0.75 and 4.1×4.1×2 mm3). The detectors are characterized by very low leakage currents in the reverse bias operation: 0.3 nA at 25 °C and 2.4 pA at -25 °C under a bias voltage of -1000 V. The spectroscopic performance of the detectors at both low and…