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RESEARCH PRODUCT
Polarization phenomena in Al/p-CdTe/Pt X-ray detectors
Fabio PrincipatoLeonardo AbbeneM. GalloA.a. Turturicisubject
PhysicsNuclear and High Energy PhysicsSpectrometerPhysics::Instrumentation and Detectorsbusiness.industryX-ray detectorchemistry.chemical_elementBiasingAcceptorCadmium telluride photovoltaicsSchottky CdTe detectorCondensed Matter::Materials SciencechemistryPolarizationElectric fieldActivation energyX-rayandgamma ray spectroscopyOptoelectronicsbusinessPolarization (electrochemistry)InstrumentationIndiumdescription
Over the last decades, CdTe detectors are widely used for the development of room temperature X-ray and gamma ray spectrometers. Typically, high resolution CdTe detectors are fabricated with blocking contacts (indium, aluminum) ensuring low leakage currents and high electric field for optimum charge collection. As well known, time instability under bias voltage (termed as polarization) is the major drawback of CdTe diode detectors. Polarization phenomena cause a progressive degradation of the spectroscopic performance with time, due to hole trapping and detrapping from deep acceptors levels. In this work, we studied the polarization phenomenon on new Al/p-CdTe/Pt detectors, manufactured by Acrorad (Japan), through electrical and spectroscopic approaches. In particular, we investigated on the time degradation of the spectroscopic response of the detectors at different temperatures, voltages and energies. Current transient measurements were also performed to better understand the properties of the deep acceptor levels and their correlation with the polarization effect.
| year | journal | country | edition | language |
|---|---|---|---|---|
| 2013-12-01 | Nuclear Instruments and Methods in Physics Research Section A: Accelerators, Spectrometers, Detectors and Associated Equipment |