Search results for "Cross Section"
showing 10 items of 3111 documents
"Table 1" of "First measurement of the quark to photon fragmentation function"
1995
2-jet events. Variable Z has been defined as E(gamma)/(E(gamma)+E(had)), where E(gamma) is the energy of the hard photon in 'photon-jet', E(had) is the energy of the rest hadrons in jet. Ycut is jet resolution parameter (see paper).
"Table 2" of "First measurement of the quark to photon fragmentation function"
1995
2-jet events. Variable Z has been defined as E(gamma)/(E(gamma)+E(had)), where E(gamma) is the energy of the hard photon in 'photon-jet', E(had) is the energy of the rest hadrons in jet. Ycut is jet resolution parameter (see paper).
"Table 5" of "First measurement of the quark to photon fragmentation function"
1995
3-JET events. Variable Z has been defined as E(gamma)/(E(gamma)+E(had)), where E(gamma) is the energy of the hard photon in 'photon-jet', E(had) is the energy of the rest hadrons in jet. Ycut is jet resolution parameter (see paper).
"Table 6" of "First measurement of the quark to photon fragmentation function"
1995
3-JET events. Variable Z has been defined as E(gamma)/(E(gamma)+E(had)), where E(gamma) is the energy of the hard photon in 'photon-jet', E(had) is the energy of the rest hadrons in jet. Ycut is jet resolution parameter (see paper).
"Table 7" of "First measurement of the quark to photon fragmentation function"
1995
3-JET events. Variable Z has been defined as E(gamma)/(E(gamma)+E(had)), where E(gamma) is the energy of the hard photon in 'photon-jet', E(had) is the energy of the rest hadrons in jet. Ycut is jet resolution parameter (see paper).
Know your full potential: Quantitative Kelvin probe force microscopy on nanoscale electrical devices
2018
In this study we investigate the influence of the operation method in Kelvin probe force microscopy (KPFM) on the measured potential distribution. KPFM is widely used to map the nanoscale potential distribution in operating devices, e.g., in thin film transistors or on cross sections of functional solar cells. Quantitative surface potential measurements are crucial for understanding the operation principles of functional nanostructures in these electronic devices. Nevertheless, KPFM is prone to certain imaging artifacts, such as crosstalk from topography or stray electric fields. Here, we compare different amplitude modulation (AM) and frequency modulation (FM) KPFM methods on a reference s…
Simultaneous measurement of the muon neutrino charged-current cross section on oxygen and carbon without pions in the final state at T2K
2020
Authors: K. Abe,56 N. Akhlaq,45 R. Akutsu,57 A. Ali,32 C. Alt,11 C. Andreopoulos,54,34 L. Anthony,21 M. Antonova,19 S. Aoki,31 A. Ariga,2 T. Arihara,59 Y. Asada,69 Y. Ashida,32 E. T. Atkin,21 Y. Awataguchi,59 S. Ban,32 M. Barbi,46 G. J. Barker,66 G. Barr,42 D. Barrow,42 M. Batkiewicz-Kwasniak,15 A. Beloshapkin,26 F. Bench,34 V. Berardi,22 L. Berns,58 S. Bhadra,70 S. Bienstock,53 S. Bolognesi,6 T. Bonus,68 B. Bourguille,18 S. B. Boyd,66 A. Bravar,13 D. Bravo Berguño,1 C. Bronner,56 S. Bron,13 A. Bubak,51 M. Buizza Avanzini ,10 T. Campbell,7 S. Cao,16 S. L. Cartwright,50 M. G. Catanesi,22 A. Cervera,19 D. Cherdack,17 N. Chikuma,55 G. Christodoulou,12 M. Cicerchia,24,† J. Coleman,34 G. Collazu…
"Table 5" of "In-medium modifications of the pi pi interaction in photon-induced reactions."
2005
Differential cross section for PI0PI+/- production with a Carbon target. Errors are statistical only.
"Table 2" of "C-12 (gamma,p) B-11 cross-section from 80 to 157 MeV"
1995
EX = 7 (FROM 6.5 TO 8.0 MEV). ANGULAR BINS OF 5 DEG WIDTH.
"Table 3" of "C-12 (gamma,p) B-11 cross-section from 80 to 157 MeV"
1995
EX = 13 (FROM 12.0 TO 13.5 MEV). ANGULAR BINS OF 5 DEG WIDTH.