Search results for "Crystallographic"

showing 10 items of 202 documents

Combustion wave structure during the MoSi2 synthesis by Mechanically-Activated Self-propagating High-temperature Synthesis (MASHS): In situ time-reso…

2006

Abstract In situ synchrotron time-resolved X-ray diffraction experiments coupled with an infrared imaging camera have been used to reveal the combustion wave structure during the production of MoSi2 by Mechanically Activated Self-propagating High-temperature Synthesis (MASHS). The fast combustion front exhibits a form described as an ‘equilibrium structure’ where the chemical reaction is the sole major driving force. In the MASHS process, oxide-free interfaces between Mo and Si nanocrystallites enhance the reaction Mo+2Si→MoSi2. Exhaustive time-resolved investigations show a possible solid-state process in the first second of the reaction within the combustion front. If preheating is added,…

[SPI.OTHER]Engineering Sciences [physics]/OtherDiffractionMaterials science[ SPI.OTHER ] Engineering Sciences [physics]/OtherSelf-propagating high-temperature synthesis[ PHYS.COND.CM-MS ] Physics [physics]/Condensed Matter [cond-mat]/Materials Science [cond-mat.mtrl-sci]02 engineering and technologyCombustion7. Clean energy01 natural sciencesChemical reactionlaw.inventionmechanical allowing and millingReaction ratelaw0103 physical sciencesThermalMaterials Chemistryphase transformation (crystallographic aspects kinetics and mechanismsBall mill010302 applied physicsMechanical Engineeringreaction synthesisMetals and Alloys[CHIM.MATE]Chemical Sciences/Material chemistryGeneral Chemistry021001 nanoscience & nanotechnologyvarious[PHYS.COND.CM-MS] Physics [physics]/Condensed Matter [cond-mat]/Materials Science [cond-mat.mtrl-sci]SynchrotronsilicidesCrystallographyChemical engineeringMechanics of Materials[ CHIM.MATE ] Chemical Sciences/Material chemistry[PHYS.COND.CM-MS]Physics [physics]/Condensed Matter [cond-mat]/Materials Science [cond-mat.mtrl-sci]0210 nano-technology
researchProduct

Defects in oxide glasses

2005

An insight into the present understanding of point defects in the simplest and the most radiation-resistant oxide glass, glassy silicon dioxide (silica) is presented. The defects and their generation processes in glassy and α-quartz forms of silicon dioxide are significantly different. The only defect, confirmed to be similar in both materials, is oxygen vacancy. In silica, additional defects of dangling bond type are generated from precursor sites formed by strained Si-O bonds, and by modifier ions. The optical absorption spectra of silica are dominated by paramagnetic dangling bond type defects: silicon dangling bond (“E′-center”) and oxygen dangling bond (“non-bridging oxygen hole center…

chemistry.chemical_compoundMaterials scienceSiliconchemistrySilicon dioxideRadicalVacancy defectDangling bondOxideMoleculechemistry.chemical_elementPhotochemistryCrystallographic defectphysica status solidi (c)
researchProduct

Optical properties of lithium niobate single crystals

2005

Studies of thermal and γ-irradiation effects on the optical properties in congruous lithium niobate single crystals containing Y, Mg, Gd, B, and Zn dopants including samples with double dopants Y, Mg and Gd, Mg are reported. Formation of defects at irradiation and thermal treatment of the samples is explored by electron absorption spectra. Considerable increase of absorption with the dose of γ-radiation is observed at 500 nm. The changes of absorption examined under different conditions are explained by creation and destruction of Nb 4 + defects.

chemistry.chemical_compoundMaterials sciencechemistryAbsorption spectroscopyDopantLithium niobateAnalytical chemistryMineralogyIrradiationThermal treatmentAtmospheric temperature rangeAbsorption (electromagnetic radiation)Crystallographic defectphysica status solidi (c)
researchProduct

The Effects of Admixtures on Resistance to Radiation of Lithium Niobate Crystals

2015

The studies of optical absorption and transmission of crystalline lithium niobate compounds modified by rare-earth and alkali-earth elements: LiNbO3: Y (0.46 wt %), LiNbO3: Y (0.32 wt %), Mg (0.24 wt %), LiNbO3: Mg (0.27 wt %), LiNbO3: Gd (0.004, 0.04, 0.26, and 0.43 wt %), and ostensibly pure LiNbO3 is reported. The features of absorption and transmission are examined with respect to the dosage of γ-irradiation, the annealing temperature, and the type and concentration of modifying admixtures. The features revealed in different ways of bleaching γ-irradiated and annealed in vacuum ostensibly pure lithium niobate crystals are used to refine the mechanisms of developing electron and point de…

chemistry.chemical_compoundMaterials sciencechemistryAnnealing (metallurgy)Lithium niobateAnalytical chemistryElectronRadiationCondensed Matter Physicsγ irradiationOn resistanceCrystallographic defectElectronic Optical and Magnetic MaterialsFerroelectrics
researchProduct

PtTe2: Potential new material for the growth of defect-free TeO2 single crystals

2008

Abstract The dissociation of Te–O bonds is the main drawback, which hampers the yield of large-sized paratellurite single crystals of high optical quality when using platinum crucibles. In this work, it is assumed that a catalytic dissociation process involves the intermediate formation of platinum tellurides, these ones being then responsible for entrapment of gas bubbles and black precipitates when growth proceeds. To alleviate this difficulty, we suggest that platinum ditelluride could be a chemically more appropriate compound instead of pure platinum. First experiments on direct transformation of platinum sheets into PtTe 2 under tellurium gas atmosphere are described, as well as the pr…

chemistry.chemical_elementDefect freeCondensed Matter PhysicsCrystallographic defectDissociation (chemistry)CatalysisInorganic ChemistryCrystallographychemistryMaterials ChemistryTellurium oxideTelluriumPlatinumSingle crystalJournal of Crystal Growth
researchProduct

Steering of a Sub-GeV electron beam through planar channeling enhanced by rechanneling

2014

We report the observation of efficient steering of a 855 MeV electron beam at MAMI (MAinzer MIkrotron) facilities by means of planar channeling and volume reflection in a bent silicon crystal. A $30.5\text{ }\text{ }\ensuremath{\mu}\mathrm{m}$ thick plate of (211) oriented Si was bent to cause quasimosaic deformation of the (111) crystallographic planes, which were used for coherent interaction with the electron beam. The experimental results are analogous to those recorded some years ago at energy higher than 100 GeV, which is the only comparable study to date. Monte Carlo simulations demonstrated that rechanneling plays a considerable role in a particle's dynamics and hinders the spoiling…

electron beamEnergy rangesPlanar channelingBent molecular geometryGeneral Physics and AstronomyExtractionCrystallographic planeElectronX-ray sourcesCoherent interactionchanneling; electron beam; beam steerigbeam steerigMonocrystalline siliconPlanarNegative particlesA-particlesVolume reflectionCollimationPhysicsRange (particle radiation)Silicon crystalchannelingNegative particles; Bent crystals; Volume reflection; Deflection; Extraction; Collimation; A-particles; Coherent interaction; Crystallographic plane; Energy ranges; Planar channeling; Silicon crystal; X-ray sourcesReflection (mathematics)Cathode rayPhysics::Accelerator PhysicsAtomic physicsDeflectionBent crystalsEnergy (signal processing)
researchProduct

Oxidation-Induced Changes in the ALD-Al2O3/InAs(100) Interface and Control of the Changes for Device Processing

2018

InAs crystals are emerging materials for various devices like radio frequency transistors and infrared sensors. Control of oxidation-induced changes is essential for decreasing amounts of the harmful InAs surface (or interface) defects because it is hard to avoid the energetically favored oxidation of InAs surface parts in device processing. We have characterized atomic-layer-deposition (ALD) grown Al2O3/InAs interfaces, preoxidized differently, with synchrotron hard X-ray photoelectron spectroscopy (HAXPES), low-energy electron diffraction, scanning tunneling microscopy, and time-of-flight elastic recoil detection analysis. The chemical environment and core-level shifts are clarified for w…

hapetusMaterials science02 engineering and technologyHigh-electron-mobility transistor01 natural sciences114 Physical scienceslaw.inventionAtomic layer depositionX-ray photoelectron spectroscopyInAslawsynchrotron0103 physical sciencesGeneral Materials Science010302 applied physicsta114business.industryDangling bondatomikerroskasvatus021001 nanoscience & nanotechnologyIII-V semiconductorCrystallographic defectElastic recoil detectionoxidation (active)Electron diffractionatomic layer depositionOptoelectronicsScanning tunneling microscope0210 nano-technologybusinessphotoelectron
researchProduct

Creation of glass-characteristic point defects in crystalline SiO2 by 2.5 MeV electrons and by fast neutrons

2019

The support from M -ERANET project “MyND” is acknowledged. K.K. was partially supported by the Collaborative Research Project of Laboratory for Materials and Structures, Tokyo Institute of Technology . Visiting researcher support from Ecole Polytechnique, Palaiseau is appreciated. Mr. Olivier Cavani is thanked for the expert help with irradiations.

inorganic chemicalsLuminescenceMaterials science02 engineering and technologyCrystal structure01 natural sciencesMolecular physicsCrystal0103 physical sciences:NATURAL SCIENCES:Physics [Research Subject Categories]Materials ChemistryElectron beam processingIrradiationDangling bonds[PHYS]Physics [physics]010302 applied physicstechnology industry and agricultureDangling bondElectron irradiationQuartz021001 nanoscience & nanotechnologyCondensed Matter PhysicsCrystallographic defectAmorphizationNeutron temperatureElectronic Optical and Magnetic MaterialsAmorphous solidCeramics and CompositesSilica glass0210 nano-technologyJournal of Non-Crystalline Solids
researchProduct

Influence of Ge doping level on the EPR signal of Ge(1), Ge(2) and E'Ge defects in Ge-doped silica

2011

Abstract We present an experimental investigation on the Ge doping level dependence of the Electron Paramagnetic Resonance (EPR) signal spectral features of the Ge(1), Ge(2) and E'Ge defects induced in Ge doped silica. We have studied samples produced by sol–gel or PCVD techniques and doped with different amounts of Ge up to 20% by weight. The samples were gamma or beta ray irradiated and successively they were thermally treated to isolate the EPR signals of the different point defects. The data show that the EPR line shapes of the Ge(1) and the Ge(2) centers are progressively modified for doping level higher than 1%, whereas the line shape of the E'Ge defect appears independent from the do…

inorganic chemicalsMaterials scienceAnalytical chemistrychemistry.chemical_elementGermaniumSilica paramagnetic point defects Ge-doped silicasilice drogata difetti di punto risonanza magneticalaw.inventionsymbols.namesakeraman spectroscopylawCondensed Matter::SuperconductivityBeta particleMaterials ChemistryIrradiationElectron paramagnetic resonanceSol-gelSettore FIS/01 - Fisica SperimentaleDopingtechnology industry and agricultureCondensed Matter PhysicsCrystallographic defectElectronic Optical and Magnetic MaterialschemistryCeramics and Compositessymbolslipids (amino acids peptides and proteins)Condensed Matter::Strongly Correlated ElectronsRaman spectroscopyhuman activitiesJournal of Non-Crystalline Solids
researchProduct

Dependence of the emission properties of the germanium lone pair center on Ge doping of silica

2011

We present an experimental investigation regarding the changes induced by the Ge doping level on the emission profile of the germanium lone pair center (GLPC) in Ge doped silica. The investigated samples have been produced by the sol-gel method and by plasma-activated chemical vapor deposition and have doping levels up to 20% by weight. The recorded photoluminescence spectra show that the GLPC emission profile is the same when the Ge content is lower than ∼ 1% by weight, whereas it changes for higher doping levels. We have also performed Raman scattering measurements that show the decrease of the D1 Raman band at 490 cm( - 1) when the Ge content is higher than 1% by weight. The data suggest…

inorganic chemicalsPhotoluminescenceMaterials scienceSettore FIS/01 - Fisica SperimentaleDopingtechnology industry and agricultureAnalytical chemistrychemistry.chemical_elementGermaniumChemical vapor depositionCondensed Matter PhysicsCrystallographic defectSpectral linesymbols.namesakechemistrysymbolsGe-doped silica point defects structural propertiesddc:530General Materials ScienceLone pairRaman scatteringJournal of Physics: Condensed Matter
researchProduct