Search results for "Data type"
showing 10 items of 1183 documents
Study of the e<sup>+</sup> Distribution in a Layered Stack Sample Using Positron Lifetime Spectroscopy
2010
The results of the Monte Carlo (MC) simulations, using GEANT4 codes, indicate the enhancement of the fraction of the e+ in the denser regions of the sample embedded by the less dense environment. The positron lifetime measurements, performed for two stacks of layers consisting of pure aluminum and silver do not seem to reveal this effect. Some features of the e+ distribution detected in the experiments are not reproduced by the MC simulations.
Fast Axial-Scanning Widefield Microscopy With Constant Magnification and Resolution
2015
In this paper, we propose the use of electrically-addressable lens devices for performing fast non-mechanical axial scanning when imaging three-dimensional samples. This non-mechanical method can be implemented in any commercial microscope. The approach is based on the insertion of the tunable lens at the aperture stop of the microscope objective. By tuning the voltage, a stack of depth images of 3D specimens can be captured in real time and with constant magnification and resolution. The main advantage of our technique is the possibility of performing fast axial scanning free of mechanical vibrations.
Partially Coherent Optical Diffraction Tomography Toward Practical Cell Study
2021
Optical diffraction tomography (ODT) is a computational imaging technique based on refractive index (RI) contrast. Its application for microscopic imaging of weakly absorbing and scattering samples has been demonstrated by using a specially designed holographic microscope with angular scanning of the coherent sample illumination direction. Recently, an alternative low cost technique based on partially coherent sample illumination (PC-ODT), which is compatible with the conventional wide-field transmission microscope, has been established. In this case, the 3D refractive index distribution of the sample is obtained by deconvolution from a single stack of through-focus intensity images. The pe…
Studies regarding the use of a neuro-fuzzy mathematical model in order to determine the technological parameters of the polyethylene pipes butt weldi…
2017
The paper analyzes the possibility to use a neuro-fuzzy type mathematical model, with the final goal of establishing the welding parameters for new types and dimensions of pipes and fittings. Anticipating the developing dynamic of polyethylene-made elements, especially pipes and fittings, starting from the current situation when already a wide range of pipes and fittings with different wall thicknesses and nominal working pressures is produced and commercialized, and taking into account also new development, it was considered necessary to find out the welding parameters for any new pipe type and dimension. The usage of existing welding equipment for new pipe dimensions is impossible without…
Low loss microstructured chalcogenide fibers for large non linear effects at 1995 nm
2010
International audience; Microstructured optical fibers (MOFs) are traditionally prepared using the stack and draw technique. In order to avoid the interfaces problems observed in chalcogenide glasses, we have developed a new casting method to prepare the chalcogenide preform. This method allows to reach optical losses around 0.4 dB/m at 1.55 µm and less than 0.05 dB/m in the mid IR. Various As(38)Se(62) chalcogenide microstructured fibers have been prepared in order to combine large non linear index of these glasses with the mode control offered by MOF structures. Small core fibers have been drawn to enhance the non linearities. In one of these, three Stokes order have been generated by Ram…
The “accumulation effect” of positrons in the stack of foils, detected by measurements of the positron implantation profile
2013
The profiles of positrons implanted from the radioactive source 22Na into a stack of foils and plates are the subject of our experimental and theoretical studies. The measurements were performed using the depth scanning of positron implantation profile method, and the theoretical calculations using the phenomenological multi-scattering model (MSM). Several stacks consisting of silver, gold and aluminum foils, and titanium and germanium plates were investigated. We notice that the MSM describes well the experimental profiles; however when the stack consisting of silver and gold foils, the backscattering and linear absorption coefficients differ significantly from those reported in the litera…
A simple technique for estimating surface temperature by means of a thermal infrared radiometer
1992
Abstract In this Letter we present a simple technique for estimating surface temperatures from data obtained by means of a thermal infrared radiometer. The technique is based simply on the use of a table and a graph, from which cmissivity and atmospheric effects are easily evaluated. The accuracy is better than a tenth of a degree when emissivity and atmospheric radiance arc known.
Effect of high-k materials in the control dielectric stack of nanocrystal memories
2004
In this paper we studied program/erase characteristics by FN tunneling in Si nanocrystal memories. Starting from a very good agreement between experimental data and simulations in the case of a memory cell with a thin tunnel oxide, Silicon dots as medium for charge storage, and a CVD silicon dioxide used as control dielectric, we present estimated values of the charge trapping when a high-k material is present in the control dielectric. We then show preliminary results of nanocrystal memories with control dielectric containing high-k materials. ©2004 IEEE.
Optical Probing (EOFM/TRI): A large set of complementary applications for ultimate VLSI
2013
International audience; Electro Optical Techniques (EOFM: Electro Optical Frequency Mapping and EOP: Electro Optical Probing) and Dynamic Light Emission Techniques (TRE: Time Resolved Emission and TRI: Time Resolved Imaging) are dynamic optical probing techniques widely used at IC level for design debug and defect localization purpose. They can pinpoint the origin of timing issue or logic fault in up to date CMOS devices. Each technique has its advantages and its drawbacks allowing a common set of applications and more specific ones. We have been involved in the development of the most advanced techniques related to EOFM and TRI on various devices (down to 28nm technology). What we can expe…
Three-Point Flexural Behaviour of GFRP Sandwich Composites: A Failure Map
2010
In this work, the failure mechanisms of GFRP/PVC foam core sandwich structures subjected to three-point bending are analysed. By varying the skin thickness (t ) and the span length between supports (l), experimental tests were carried out in order to find the relationship between the geometrical configuration of the sandwiches and the failure mechanism. By plotting failure mechanism on a graph of l against t , a failure map was created identifying the three typical failure mode regions of these sandwiches. The graph clearly shows the failure mode corresponding to each combination of l and t . To help optimise the use of these sandwich beams as structural elements, a theoretical failure mode…