Search results for "Diffraction"

showing 10 items of 1584 documents

Linker depletion for missing cluster defects in non-UiO Metal-Organic Frameworks

2021

Defect engineering is a valuable tool to tune the properties of metal–organic frameworks. However, defect chemistry remains still predominantly limited to UiO-type MOFs. We describe the preferential formation of missing cluster defects in heterometallic titanium–organic frameworks of the MUV-10 family when synthesised in sub-stoichiometric linker conditions. Our results show the value of integrating experimental work, computational modelling and thorough characterization in rationalizing the impact of defects over the porosity and structure of this family of materials. Correlation of experiment with computational models reveals the dominance of missing cluster vacancies in the pore size dis…

DiffractionScatteringchemistry.chemical_element02 engineering and technologyGeneral ChemistryMetal-Organic Frameworks Defects Titanium Coordination modulation010402 general chemistry021001 nanoscience & nanotechnology01 natural sciences0104 chemical sciencesCharacterization (materials science)ChemistrychemistryChemical physicsCluster (physics)Metal-organic framework0210 nano-technologyPorosityNanoscopic scaleTitaniumChemical Science
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Scolecite, Part I: Refinement of high-order data, separation of internal and external vibrational amplitudes from displacement parameters

1997

A single crystal of scolecite, CaAl2Si3O10· 3H2O, was studied by X-ray diffraction methods at room temperature. The intensities were measured with MoKα radiation (λ=0.71069 A) in a complete sphere of reflection up to sinθ/λ=0.9 A−1. The structure was refined in the pseudo-orthorhombic setting of space group F1d1 instead of the conventional setting Cc for better comparison with natrolite (Fdd2). The cell parameters are: a=18.502(1) A, b=18.974(2) A, c=6.525(1) A, β=90.615(7)°, V=2290.6(3) A3, Z=8. A refinement of high-order diffraction data yielded residuals of R(F)=0.9%, R w (F)=0.9%, GoF=1.73 for 1831 high-angle reflections (0.7≤sinθ/λ≤0.9 A−1) and R(F)=1.2%, R w (F)=1.4%, GoF=3.22 for all…

DiffractionScoleciteChemistryengineering.materialNatroliteIonCrystallographyReflection (mathematics)Geochemistry and PetrologyengineeringMoleculeGeneral Materials ScienceZeoliteSingle crystal
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Use of positron annihilation measurements to detect the defect beneath worn surface of stainless steel 1.4301 (EN) under dry sliding condition

2012

Abstract Positron measurements were performed for detection of the subsurface zone in the stainless steel 1.4301 (EN) exposed to dry sliding. They revealed the defect profile induced by dry sliding which is extended inward the worn surface from 85 μm to 400 μm depending on the applied load during the tribo-test. This result was obtained using the positron techniques, while the microhardness profile exhibited shorter range of the microhardness depth profile, i.e., from 70 μm to 150 μm. However, at the depth of about 5 μm from the worn surface the sudden increase in the microhardness was observed. The complementary measurements of X-ray diffraction and SEM micrographs of the worn surface were…

DiffractionSem micrographsMaterials sciencePositronMechanics of MaterialsMetallurgyMaterials ChemistrySurfaces and InterfacesCondensed Matter PhysicsIndentation hardnessSurfaces Coatings and FilmsSliding wearPositron annihilationWear
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Effective hydrostatic limits of pressure media for high‐pressure crystallographic studies

2007

The behavior of a number of commonly used pressure media, including nitrogen, argon, 2-propanol, a 4:1 methanol–ethanol mixture, glycerol and various grades of silicone oil, has been examined by measuring the X-ray diffraction maxima from quartz single crystals loaded in a diamond-anvil cell with each of these pressure media in turn. In all cases, the onset of non-hydrostatic stresses within the medium is detectable as the broadening of the rocking curves of X-ray diffraction peaks from the single crystals. The onset of broadening of the rocking curves of quartz is detected at ∼9.8 GPa in a 4:1 mixture of methanol and ethanol and at ∼4.2 GPa in 2-propanol, essentially at the same pressures …

DiffractionShear wavesArgonhydrostatic limitschemistry.chemical_elementmacromolecular substanceshigh-pressure crystallographic studiesNitrogenGeneral Biochemistry Genetics and Molecular BiologySilicone oillaw.inventionchemistry.chemical_compoundCrystallographystomatognathic systemchemistrylawHydrostatic equilibriumGlass transitionQuartzJournal of Applied Crystallography
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Operational modes of a ferroelectric LCoS modulator for displaying binary polarization, amplitude, and phase diffraction gratings

2009

We analyze the performance of a ferroelectric liquid crystal on silicon display (FLCoS) as a binary polarization diffraction grating. We analyze the correspondence between the two polarization states emerging from the displayed grating and the polarization and intensity of the diffracted orders generated at the Fourier diffraction plane. This polarization-diffraction analysis leads, in a simple manner, to configurations yielding binary amplitude or binary phase modulation by incorporating an analyzer on the reflected beam. Based on this analysis, we present two useful variations of the polarization configuration. The first is a simplification using a single polarizer, which provides equival…

DiffractionSiliconMaterials scienceOptical Phenomenabusiness.industryMaterials Science (miscellaneous)Optical DevicesPhysics::OpticsAcousto-opticsGratingPolarizerDiffraction efficiencyIndustrial and Manufacturing EngineeringLiquid Crystalslaw.inventionUltrasonic gratingOpticslawBlazed gratingBusiness and International ManagementbusinessDiffraction gratingIron CompoundsApplied Optics
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An X-ray scattering study of lipid monolayers at the air-water interface and on solid supports

1988

Abstract Monolayers of the lipid arachidic acid (C20) and of the phospholid dimyristolyphosphatidic acid (PMDA) have been studied by X-ray reflection and diffraction technique, using a purpose-built Langmuir trough installed at the sample stage of our high-resolution X-ray diffractometer at the DORIS synchroton X-ray source in Hamburg. For comparison we also report data for monolayers of C20 on a solid support using a 10 kW rotating anode X-ray source. By the X-ray reflection method, the density profile across the interface is probe, while in-plane diffraction measurements gauge the two-dimensional crystalline properties of the monolayers. Flourescence microscopy experiments of DMPA monolay…

DiffractionSiliconScatteringMetals and AlloysAnalytical chemistrychemistry.chemical_elementSurfaces and InterfacesSurface pressureSurfaces Coatings and FilmsElectronic Optical and Magnetic Materialschemistry.chemical_compoundLattice constantchemistryMonolayerMaterials ChemistryArachidic acidDiffractometerThin Solid Films
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Non-Conventional Tunable Spatial Filtering

1987

A virtual display of the Fraunhofer diffraction pattern of any object is formed in the transverse source plane by theyirtual diffracted rays extqn0ing in the region to the left of the screen containing the transparencyl),2). Except for a few cases '')"°), the concept of virtual Fourier transform appears not to have been made use of. The main idea of this paper is, bearing in mind the property referred to in the above paragraph, to describe a novel spatial filtering technique. In this way, one can obtain different filtered images, by simply moving the point source along the optical axis. The basic theory is described below.

DiffractionSpatial filterPoint sourcebusiness.industryFraunhofer diffractionOptical axissymbols.namesakeTransverse planeFourier transformOpticssymbolsSpatial frequencybusinessMathematicsSPIE Proceedings
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Dispersion Compensation in Holograms Reconstructed by Femtosecond Light Pulses

2014

This chapter describes how the spatiotemporal dispersion associated with the diffraction of broadband femtosecond light pulses through computer generated holograms (CGHs) can be compensated to a first order with a properly designed dispersion compensation module (DCM). The angular dispersion of the beam associated to CGHs leads to both spatial and temporal distortion of the pulse. Some experiments in one-shot second harmonic generation, wide-field two-photon microscopy, and parallel micromachining are shown to study the quality of the compensation performed with the DCM.

DiffractionSpatial light modulatorMaterials sciencebusiness.industryHolographyPhysics::OpticsSecond-harmonic generationlaw.inventionCompensation (engineering)OpticslawDistortionDispersion (optics)FemtosecondOptoelectronicsbusiness
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Analysis of Dissolved-Gas Atomization: Supercritical CO2 Dissolved in Water

2010

Supercritical dissolved-gas atomization is an atomization process in which carbon dioxide at temperature and pressure above its critical point is used as the atomizing gas. The spray characteristics in terms of droplets size and distribution have been experimentally studied using a laser diffraction method based on a Malvern apparatus. The main parameter that influences the droplets size is the gas-to-liquid mass ratio (GLR); the injection pressure in the range of 7.4-13 MPa has a minor effect. Upon variation of the GLR from 0.5 to 3, the droplet mean diameter changes from about 8.0 to 2.0 μm; very narrow droplet size distributions are also produced. From the point of view of the atomizatio…

DiffractionSpray characteristicsChemistryGeneral Chemical EngineeringAnalytical chemistrycarbon dioxideGeneral Chemistrysupercritical fluidsLaserIndustrial and Manufacturing EngineeringSupercritical fluidAtomizationlaw.inventionPhysics::Fluid Dynamicschemistry.chemical_compoundsprayCritical point (thermodynamics)lawCarbon dioxidePhysics::Atomic and Molecular ClustersInjection pressureDroplet sizeIndustrial & Engineering Chemistry Research
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Fast and robust phase-shift estimation in two-dimensional structured illumination microscopy.

2019

A method of determining unknown phase-shifts between elementary images in two-dimensional Structured Illumination Microscopy (2D-SIM) is presented. The proposed method is based on the comparison of the peak intensity of spectral components. These components correspond to the inherent structured illumination spectral content and the residual compo- nent that appears from wrongly estimated phase-shifts. The estimation of the phase-shifts is carried out by finding the absolute maximum of a function defined as the normalized peak intensity difference in the Fourier domain. This task is performed by an optimization method providing a fast estimation of the phase-shift. The algorithm stability an…

DiffractionStatistical NoisePhotonStructured illumination microscopy02 engineering and technologySignal-To-Noise RatioResidual01 natural sciencesPhase DeterminationMathematical and Statistical TechniquesFluorescence MicroscopyImage Processing Computer-AssistedFourier Anàlisi deMathematicsMicroscopyMultidisciplinaryFourier AnalysisPhysicsApplied MathematicsSimulation and ModelingStatisticsQRLight Microscopy021001 nanoscience & nanotechnologyGaussian NoiseMicroscòpiaFourier analysisPhysical SciencessymbolsCrystallographic TechniquesMedicine0210 nano-technologyAlgorithmDiffractionElementary ParticlesAlgorithmsResearch ArticleImaging TechniquesComputationScienceResearch and Analysis Methods010309 opticssymbols.namesakeRobustness (computer science)0103 physical sciencesParticle PhysicsPhotonsMicroscopy FluorescenceGaussian noiseWavesMathematicsImatges Processament Tècniques digitalsPLoS ONE
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