Search results for "Défaillance"
showing 5 items of 5 documents
La renonciation unilatérale à la défaillance de la condition suspensive dans les promesses de vente : à la recherche d'un équilibre contractuel
2012
International audience
multimodal and multi-criteria analysis for the expertise and locating faults in modern electrical components
2017
The purpose of this manuscript is to exhibit the research work solving the issue of data processing stem from defect localization techniques. This step being decisive in the failure analysis process, scientists have to harness data coming from light emission and laser techniques. Nevertheless, this analysis process is sequential and only depends on the expert’s decision. This factor leads to a not quantified probability of localization. Consequently to solve these issues, a multimodaland multicriteria analysis has been developped, taking advantage of the heterogeneous and complementary nature of light emission and laser probing techniques. This kind of process is based on advanced level too…
Multimodal and multicriteria analysis for VLSI expertises and defects localization
2017
The purpose of this manuscript is to exhibit the research work solving the issue of data processing stem from defect localization techniques. This step being decisive in the failure analysis process, scientists have to harness data coming from light emission and laser techniques. Nevertheless, this analysis process is sequential and only depends on the expert’s decision. This factor leads to a not quantified probability of localization. Consequently to solve these issues, a multimodal and multicriteria analysis has been developped, taking advantage of the heterogeneous andcomplementary nature of light emission and laser probing techniques. This kind of process is based on advanced level too…
Contribution to the analysis of signals obtained by dynamic photon emission for the purpose of studying very large scale integration circuits
2014
Scaling progresses has the benefit of making chips always more powerful. On the other hand, when there is a failure, the analysis of such advanced devices has became more sensitive. The defect localization step of this process is the critical one. Indeed, the aim is to find transistors which dimensions range in several nanometers on a device which surface is several square centimeters.Optical techniques like dynamical photon emission, also named Time Resolved Imaging (TRI), have proved to fit in such context. The later is based on the acquisition and exploitation of photons emitted by a switching CMOS structure. Due to its physical bacground, this tool has a limited invasive effect and can …
Déterminants de la viabilité financière des PME
2020
To be interested in the survival of SME (small and medium-sized enterprises) is to question their ability to create rent and therefore their financial viability. Our panel study on French SMEs, between 2000 and 2018, shows that several factors play a different role in the annuity creation process. If the effectiveness of state governance seems to play a negative role, through the policies put in place, it turns out that debt plays a positive role in the wealth creation process of SME. Given the nature of the goods or service activities, the impact of suppliers and customers is different. In any case, SME in France suffer from a problem of generation renewal and transmission of knowledge whi…