Search results for "ELECTRONICS"

showing 10 items of 4340 documents

Radiation effects in nitride read-only memories

2010

Abstract We report on the influence of different types of radiation on the nitride read-only memories (NROM®). The memory cells were irradiated by light ions (Boron), X-rays and γ-rays. Memory transistor parameters, such as threshold voltage and subthreshold drain leakage were studied as a function of the accumulated radiation dose and compared to the as-programmed (-erased) devices parameters. Their time evolution was registered in the range from few hours up to 5 months after the irradiation. The NROM® cells showed good radiation robustness up to high accumulated doses. Sufficient program margin (difference of threshold voltage in the programmed state and the read-out voltage level) remai…

Radiation effectDEVICERadiationNitrideNONVOLATILE MEMORYmemorieX-raygamma-rayIrradiationElectrical and Electronic EngineeringSafety Risk Reliability and QualityNROMHEAVY-ION EXPOSURELeakage (electronics)business.industryChemistrySubthreshold conductionElectrical engineeringX-rayCondensed Matter PhysicsRadiation effectlight ionsAtomic and Molecular Physics and OpticsSurfaces Coatings and FilmsElectronic Optical and Magnetic MaterialsThreshold voltageCELLSOptoelectronicsbusinessMicroelectronics Reliability
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TLM Nodes: A New Look at an Old Problem

2015

In this paper, an alternative perspective on the transmission line modeling (TLM) method concepts to unify previous work is presented. The procedure begins by discretizing Maxwell’s equations and proposing TLM equivalent models. Node voltage and mesh current definitions are provided in terms of link line contributions, compatible with stub currents and voltages. They allow obtaining an expression that relates incident and reflected pulses with no other condition required. With this unified approach, modeling of other situations is straightforward. 2-D cases, source implementation, and anisotropic media are described and numerically tested.

RadiationDiscretizationTransmission lineComputer scienceElectronic engineeringNumerical modelsElectrical and Electronic EngineeringCondensed Matter PhysicsTopologyCapacitanceStub (electronics)VoltageIEEE Transactions on Microwave Theory and Techniques
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Spectral Measurement of Photon Emission from Individual Gold Nanoparticles Using Scanning Tunneling Microscopy

2016

The light emission spectra of individual Au nanoparticles induced by a scanning tunneling microscope (STM) have been investigated. Two-dimensional ensembles of tunnel-coupled Au particles were prepared by thermal evaporation onto a native oxide silicon wafer in ultrahigh vacuum (10 – 9 mbar). Our STM measurements show a single peak at photon energy 1.6 eV in the tunneling mode and two peaks at 2.2 eV (connected with the Mie plasmon) and 1.45 eV (a new peak which was not discussed in literature before) in the field emission mode.

RadiationMaterials scienceGold nanoparticle010405 organic chemistrybusiness.industryAnalytical chemistryElectron-photon spectroscopy010402 general chemistryCondensed Matter Physics01 natural sciencesElectrochemical scanning tunneling microscope0104 chemical scienceslaw.inventionPhoton emissionColloidal goldlawComputer Science::Systems and ControlCondensed Matter::SuperconductivityScanning ion-conductance microscopyOptoelectronicsGeneral Materials ScienceScanning tunneling microscopebusinessScanning tunneling microscope (STM)
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A Methodology to Deduce the Microstructural Spatial Deformation of Polycrystalline Structures: Application to the Alloy 600

2009

Studying the corrosion of the alloy 600, under water pressure, is of high importance to understand the ageing process of pressurized water reactors. Today, the impact of the oxide growth on the mechanical properties of nickel alloys is a challenge. The surface analysis and the quantification of the local deformation are key factors to deduce the surface damage of the substrate produced by corrosion. Here, we introduce a new methodology to determine the deformation distribution of the alloy 600 by using polycrystalline samples. The method is based on nanopads disposed on the surface samples, which allow a mapping, at the microscopic scale, of the spatial deformation. We applied to the sample…

RadiationMaterials scienceMetallurgyAlloyOxideSubstrate (electronics)engineering.materialDeformation (meteorology)Condensed Matter PhysicsMicroscopic scaleCorrosionchemistry.chemical_compoundchemistryUltimate tensile strengthengineeringGeneral Materials ScienceCrystalliteDefect and Diffusion Forum
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Multicolor photon emission from organic thin films on different substrates

2016

Abstract Thin films of 1-pentyl-2 / ,3 / -difluoro-3 /// -methyl-4 //// -octyl- p -quinquephenyl and 9,10-Bis (4-pentylphenylethynyl)antracene organic molecules were grown on optical glass, silicon and porous silicon substrates. First optical and luminescent properties of such hybrid composites are thoroughly studied using spectroscopic techniques. The strong decrease of aggregation in thin films of 1-pentyl-2 / ,3 / -difluoro-3 /// -methyl-4 //// -octyl- p -quinquephenyl on porous silicon was observed. The possibility of simultaneous red, green and blue tunable photon emission from organic film/porous silicon hybrid structure is demonstrated.

RadiationMaterials scienceOptical glassSiliconbusiness.industrychemistry.chemical_element02 engineering and technology010402 general chemistry021001 nanoscience & nanotechnologyPorous silicon01 natural sciences0104 chemical sciencesOrganic moleculesOrganic filmPhoton emissionchemistryOptoelectronicsThin film0210 nano-technologybusinessLuminescenceInstrumentationRadiation Measurements
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Stimulated luminescence of AlN ceramics induced by ultraviolet radiation

2001

Abstract Properties of thermally stimulated luminescence (TL) and optically stimulated luminescence (OSL) of the ceramic material AlN-Y 2 O 3 have been studied after exposure to ultraviolet radiation (UVR). The dosemeter material Al 2 O 3 : C has been used for comparative measurements. The spectral sensitivity of the samples has been studied and compared with spectral effectiveness of the UVR-induced biological processes. It has been shown that a very high yield and linear dose response characterise the UVR-induced TL from AlN-Y 2 O 3 . Although lower than the TL, the OSL signal from UV-exposed AlN-Y 2 O 3 is still higher than that of Al 2 O 3  : C in a broad spectral region. The possibilit…

RadiationMaterials scienceOptically stimulated luminescencebusiness.industryAnalytical chemistryThermoluminescenceSpectral sensitivityvisual_artYield (chemistry)visual_art.visual_art_mediumOptoelectronicsDosimetryCeramicIrradiationbusinessLuminescenceInstrumentationRadiation Measurements
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Radiation induced luminescence processes in c-BN

2004

Abstract Spectral properties of cubic boron nitride have been studied using methods of photoluminescence (PL), X-ray excited luminescence (XL), thermoluminescence (TL) and optically stimulated luminescence. It is found that emission of cubic boron nitride is presented by 4 subbands, their relative yield is determined by the excitation type: blue, green (dominant) and red bands are observed in PL, ultraviolet, blue (dominant), green and red bands—in XL. Three thermal peaks are found in TL curves in the 0–700°C temperature range, their presence and intensity depend on radiation type used. A tentative correspondence between thermal peaks and emission bands is found.

RadiationMaterials sciencePhotoluminescenceOptically stimulated luminescencebusiness.industryAnalytical chemistrychemistry.chemical_elementNitrideThermoluminescencechemistry.chemical_compoundchemistryBoron nitrideExcited stateOptoelectronicsbusinessLuminescenceBoronInstrumentationRadiation Measurements
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Time-resolved optical absorption in YAlO3 crystals

2004

Abstract The present work is devoted to the investigation of transient absorption (TA) induced by a pulsed electron beam (E=250 keV ) in pure and doped YAlO3 (YAP) single crystals. The nature of centers responsible for TA is discussed.

RadiationMaterials sciencebusiness.industryDopingElectronElectron beam irradiationUltrafast laser spectroscopyCathode rayComputer Science::Programming LanguagesOptoelectronicsIrradiationAtomic physicsbusinessAbsorption (electromagnetic radiation)InstrumentationRadiation Measurements
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Neutron-induced defects in optical fibers

2014

We present a study on 0.8 MeV neutron-induced defects up to fluences of 1017 n/cm2 in fluorine doped optical fibers by using electron paramagnetic resonance, optical absorption and confocal micro-luminescence techniques. Our results allow to address the microscopic mechanisms leading to the generation of Silica-related point-defects such as E', H(I), POR and NBOH Centers.

RadiationOptical fiberMaterials scienceAbsorption spectroscopybusiness.industryConfocalDopingOptique / photoniquePhysics::OpticsSilicaNeutronlaw.inventionlawOptoelectronicsDefectsNeutronAtomic physicsbusinessLuminescenceElectron paramagnetic resonanceAbsorption (electromagnetic radiation)AIP Conference Proceedings
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Origin of the visible absorption in radiation-resistant optical fibers

2013

In this work we investigated the point defects at the origin of the degradation of radiation-tolerant optical fibers used in the visible part of the spectrum for plasma diagnostics in radiation environments. For this aim, the effects of γ -ray irradiation up to the dose of 10 MGy(SiO2) and post-irradiation thermal annealing at 550◦C were studied for a Fluorinedoped fiber. An absorption peaking around 2 eV is mainly responsible for the measured radiation-induced losses, its origin being currently debated in the literature. On the basis of the unchanging shape of this band with the radiation dose, its correlation with the 1.9 eV photoluminescent band and the thermal treatment results we assig…

RadiationOptical fiberMaterials sciencePhotoluminescencebusiness.industryAttenuationFiber optics; Radiation; Photoluminescence; AbsorptionFiber opticRadiationAbsorptionElectronic Optical and Magnetic Materialslaw.inventionlawOptoelectronicsFiberIrradiationbusinessAbsorption (electromagnetic radiation)PhotoluminescenceVisible spectrum
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