Search results for "ESOL"

showing 10 items of 2444 documents

Investigating the performance of reconstruction methods used in structured illumination microscopy as a function of the illumination pattern's modula…

2016

Surpassing the resolution of optical microscopy defined by the Abbe diffraction limit, while simultaneously achieving optical sectioning, is a challenging problem particularly for live cell imaging of thick samples. Among a few developing techniques, structured illumination microscopy (SIM) addresses this challenge by imposing higher frequency information into the observable frequency band confined by the optical transfer function (OTF) of a conventional microscope either doubling the spatial resolution or filling the missing cone based on the spatial frequency of the pattern when the patterned illumination is two-dimensional. Standard reconstruction methods for SIM decompose the low and hi…

DiffractionMicroscopeOptical sectioningFrequency bandComputer scienceStructured illumination microscopy01 natural scienceslaw.invention010309 opticsOpticsOptical microscopelawLive cell imagingOptical transfer function0103 physical sciencesMicroscopyFluorescence microscopeComputer vision010306 general physicsImage resolutionbusiness.industrySuperresolutionSpatial frequencyArtificial intelligencebusinessLuminescenceFrequency modulationSPIE Proceedings
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Mössbauer gamma-ray diffraction from the molecular crystal KCN

1980

Abstract Mossbauer gamma-ray diffraction was applied to separate the elastic and inelastic scattering intensities from the (200), (400) and (600) Bragg reflections of KCN. The energy resolution of our experiment was 60 neV. The Debye-Waller factor extracted from the elastic data and the thermal diffuse inelastic data both increase towards phase transition, theoretically a logarithmic singularity was predicted.

DiffractionPhase transitionChemistryResolution (electron density)Gamma rayGeneral ChemistryInelastic scatteringCondensed Matter PhysicsMolecular physicsCrystalCrystallographySingularityMössbauer spectroscopyMaterials Chemistry
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Elemental distribution and structural characterization of GaN/InGaN core-shell single nanowires by Hard X-ray synchrotron nanoprobes

2019

Improvements in the spatial resolution of synchrotron-based X-ray probes have reached the nano-scale and they, nowadays, constitute a powerful platform for the study of semiconductor nanostructures and nanodevices that provides high sensitivity without destroying the material. Three complementary hard X-ray synchrotron techniques at the nanoscale have been applied to the study of individual nanowires (NWs) containing non-polar GaN/InGaN multi-quantum-wells. The trace elemental sensitivity of X-ray fluorescence allows one to determine the In concentration of the quantum wells and their inhomogeneities along the NW. It is also possible to rule out any contamination from the gold nanoparticle …

DiffractionPhotoluminescenceMaterials scienceGeneral Chemical EngineeringNanowireNanoparticleSemiconductor nanowires02 engineering and technology01 natural sciencesArticlelaw.inventionlcsh:ChemistrySynchrotron probesnano-scale resolutionlaw0103 physical sciencesNano-scale resolutionGeneral Materials ScienceNanoscopic scaleQuantum wellsemiconductor nanowires010302 applied physicsbusiness.industryNanotecnologia021001 nanoscience & nanotechnologySynchrotron3. Good healthlcsh:QD1-999synchrotron probesOptoelectronicsQuantum efficiencyMaterials nanoestructurats0210 nano-technologybusiness
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Study of spatial lateral resolution in off-axis digital holographic microscopy

2015

The lateral resolution in digital holographic microscopy (DHM) has been widely studied in terms of both recording and reconstruction parameters. Although it is understood that once the digital hologram is recorded the physical resolution is fixed according to the diffraction theory and the pixel density, still some researches link the resolution of the reconstructed wavefield with the recording distance as well as with the zero-padding technique. Aiming to help avoiding these misconceptions, in this paper we analyze the lateral resolution of DHM through the variation of those two parameters. To support our outcomes, we have designed numerical simulations and experimental verifications. Both…

DiffractionPhysicsImage formationbusiness.industryResolution (electron density)HolographyAtomic and Molecular Physics and OpticsElectronic Optical and Magnetic Materialslaw.inventionAngular spectrum methodOpticslawDigital holographic microscopyElectrical and Electronic EngineeringPhysical and Theoretical ChemistryInvariant (mathematics)businessPixel densityOptics Communications
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Non-Homogeneity of Lateral Resolution in Integral Imaging

2013

We evaluate the lateral resolution in reconstructed integral images. Our analysis takes into account both the diffraction effects in the image capture stage and the lack of homogeneity and isotropy in the reconstruction stage. We have used Monte Carlo simulation in order to assign a value for the resolution limit to any reconstruction plane. We have modelled the resolution behavior. Although in general the resolution limit increases proportionally to the distance to the lens array, there are some periodically distributed singularity planes. The phenomenon is supported by experiments.

DiffractionPhysicsIntegral imagingbusiness.industryIsotropyMonte Carlo methodIterative reconstructionCondensed Matter PhysicsElectronic Optical and Magnetic MaterialsSingularityOpticsHomogeneity (physics)Electrical and Electronic EngineeringbusinessImage resolutionJournal of Display Technology
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Speckle random coding for 2D super resolving fluorescent microscopic imaging.

2006

In this manuscript we present a novel super resolving approach based upon projection of a random speckle pattern onto samples observed through a microscope. The projection of the speckle pattern is created by coherent illumination of the inspected pattern through a diffuser. Due to local interference of the coherent wave front with itself, a random speckle pattern is superimposed on the sample. This speckle pattern can be scanned over the object. A super-resolved image can be extracted from a temporal sequence of images by appropriate digital processing of the image stream. The resulting resolution is significantly higher than the diffraction limitation of the microscope objective. The new …

DiffractionPhysicsMicroscopebusiness.industryResolution (electron density)General Physics and AstronomySpeckle noiseCell BiologyNumerical aperturelaw.inventionSpeckle patternOpticsStructural BiologylawElectronic speckle pattern interferometryGeneral Materials ScienceProjection (set theory)businessMicron (Oxford, England : 1993)
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High-resolution hard-x-ray photoelectron diffraction in a momentum microscope—the model case of graphite

2019

New journal of physics 21(11), 113031 - (2019). doi:10.1088/1367-2630/ab51fe

DiffractionPhysicsMomentum (technical analysis)MicroscopeX-rayGeneral Physics and AstronomyHigh resolution530law.inventionlawHard X-raysddc:530GraphiteAtomic physics
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Geometrical super resolved lensless imaging

2011

In the field of super resolution researchers are trying to overcome both the diffraction as well as the geometrical bounds of an imaging system. In this paper we present a recently developed approach that aims to overcome the geometrical bounds while using a unified spatial light modulator (SLM) based lensless configuration.

DiffractionPhysicsOpticsSpatial light modulatorOptical diffractionField (physics)Geometrical opticsbusiness.industryIterative reconstructionbusinessSuperresolutionImage resolutionComputingMethodologies_COMPUTERGRAPHICS2011 10th Euro-American Workshop on Information Optics
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Probing bulk electronic structure with hard X-ray angle-resolved photoemission.

2010

Traditional ultraviolet/soft X-ray angle-resolved photoemission spectroscopy (ARPES) may in some cases be too strongly influenced by surface effects to be a useful probe of bulk electronic structure. Going to hard X-ray photon energies and thus larger electron inelastic mean-free paths should provide a more accurate picture of bulk electronic structure. We present experimental data for hard X-ray ARPES (HARPES) at energies of 3.2 and 6.0 keV. The systems discussed are W, as a model transition-metal system to illustrate basic principles, and GaAs, as a technologically-relevant material to illustrate the potential broad applicability of this new technique. We have investigated the effects of …

DiffractionPhysicsPhotonPhotoemission spectroscopyMechanical EngineeringInverse photoemission spectroscopyAngle-resolved photoemission spectroscopyGeneral ChemistryElectronic structureElectronCondensed Matter PhysicsMechanics of MaterialsGeneral Materials ScienceWave vectorAtomic physicsNature materials
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Super resolved optical system for objects with finite sizes using circular gratings

2015

We present a real time all optical super resolution method for exceeding the diffraction limit of an imaging system which has a circular aperture. The resolution improvement is obtained using two fixed circular gratings which are placed in predetermined positions. The circular gratings generate synthetic circular duplications of the aperture, thus they are the proper choice for a circular aperture optical system. The method is applicable for both spatially coherent and incoherent illuminations, as well as for white light illumination. The resolution improvement is achieved by limiting the object field of view. The proposed method is presented analytically, demonstrated via numerical simulat…

DiffractionPhysicsPoint spread functionOpticsAperturebusiness.industryAperture synthesisLimit (music)White lightResolution improvementbusinessSuperresolutionAtomic and Molecular Physics and OpticsOptics Express
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