Search results for "Electron backscatter diffraction"

Stylolite interfaces and surrounding matrix material: Nature and role of heterogeneities in roughness and microstructural development

2010

Rough pressure solution interfaces, like stylolites, are one of the most evident features of localized slow deformation in rocks of the upper crust. There is a general consensus that the development of these rough structures is a result of localized, stress enhanced, dissolution of material along a fluid filled interface, but little is known on the initiation of this roughness. The aim of this article is to reveal the role of heterogeneities initially present in the host-rock on roughness initiation. This should give insights on whether stylolite roughness is generated by a stress-induced instability or by the presence of disorder in the material (i.e. quenched noise). We use a microstructu…

Microscopic defects and impurity analyses of multicrystalline silicon solar cells from different manufacturing routes

2013

It is important to fully understand the physical behavior of solar cells made by materials from alternative process routes. Solar cells from Elkem Solar Grade Silicon and standard polysilicon have been investigated with light beam induced current and electroluminescence imaging. The low efficiency regions have been further analyzed by Scanning Electron Microscopy under different imaging modes. It was found that cell regions of low performance had undergone plastic deformations resulting in the creation of crystalline defects appearing as subgrain patterns. Similar patterns were observed in both ESS™ and standard polysilicon. Energy-dispersive X-ray spectroscopy (EDS) and electron backscatte…

Microstructure of a Discotic Polymer as Revealed by Electron Diffraction and High-Resolution Imaging

1989

Comparative study of initial stages of copper immersion deposition on bulk and porous silicon

2013

Initial stages of Cu immersion deposition in the presence of hydrofluoric acid on bulk and porous silicon were studied. Cu was found to deposit both on bulk and porous silicon as a layer of nanoparticles which grew according to the Volmer-Weber mechanism. It was revealed that at the initial stages of immersion deposition, Cu nanoparticles consisted of crystals with a maximum size of 10 nm and inherited the orientation of the original silicon substrate. Deposited Cu nanoparticles were found to be partially oxidized to Cu2O while CuO was not detected for all samples. In contrast to porous silicon, the crystal orientation of the original silicon substrate significantly affected the sizes, dens…