Search results for "FFR"

showing 10 items of 1798 documents

Characterization of Dielectric Anomaly in Solid Solution Based on BaTiO3

2011

The influence of Zr doping on a structure and dielectric properties of Ba0.8Sr0.2TiO3 were studied. For this purpose Ba0.8Sr0.2Ti0.75Zr0.25O3 ceramics were obtained by a conventional method and were determined by an X-ray diffraction (XRD) and scanning electron microscopy (SEM) for crystallographic, surface morphological and compositional studies. The temperature and frequency dependence of dielectric permittivity were studied in the temperature range from 150 to 500 K and the frequency between 20 Hz and 1000000 Hz. The thermal behavior of the Ba0.8Sr0.2Ti0.75Zr0.25O3 ceramics were also studied using Differential Scanning Calorimetry. A diffusivity coefficient γ was calculated.

DiffractionMaterials scienceScanning electron microscopeDopingAnalytical chemistryDielectricAtmospheric temperature rangeCondensed Matter PhysicsElectronic Optical and Magnetic MaterialsDifferential scanning calorimetryvisual_artvisual_art.visual_art_mediumCeramicSolid solutionFerroelectrics
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X-ray diffraction line-broadening study on two vibrating, dry-milling procedures in kaolinites

2009

Due to the great technological importance of the microstructure of kaolinite, characterizing its evolution during dry milling of kaolin and analyzing the microstructural information obtained from different methods were the main aims of this work. The microstructural alteration of kaolinite is evaluated by X-ray diffraction and electron microscopy methods, comparing the results obtained and analyzing the correlations between them. The Warren-Averbach and Voigt-function methods of X-ray diffraction microstructural analysis have been applied successfully to the study of the effects of two different, vibrating-cup dry-milling configurations in the microstructure of kaolinite from the reflection…

DiffractionMaterials scienceScanning electron microscopeX-ray DiffractionSoil ScienceMineralogyLine BroadeningMicrostructureStrainMechanical TreatmentGeochemistry and PetrologyKaoliniteX-ray crystallographyEarth and Planetary Sciences (miscellaneous)ParticleKaoliniteElectron MicroscopyCrystalliteComminutionComposite materialCrystallite SizeWater Science and Technology
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Gas sensing properties of Zn-doped p-type nickel ferrite

2012

Abstract The influence of zinc ion to the NiFe2O4 p-type semiconductor gas response characteristics is demonstrated. For characterization of gas sensor material, synthesized by sol–gel auto combustion method, X-ray diffraction (XRD), scanning electron microscopy (SEM), DC resistance and impedance spectroscopy (IS) measurements were employed. The response change of Zn doped nickel ferrite is related to the interruption of hole hopping between nickel ions. This was improved by change of conductivity type with temperature and gas exposure.

DiffractionMaterials scienceScanning electron microscopebusiness.industryMetals and AlloysAnalytical chemistryConductivityCondensed Matter PhysicsCombustionSurfaces Coatings and FilmsElectronic Optical and Magnetic MaterialsCharacterization (materials science)NanomaterialsDielectric spectroscopySemiconductorMaterials ChemistryElectrical and Electronic EngineeringbusinessInstrumentationSensors and Actuators B: Chemical
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Preparation and Electric Properties of Barium Zirconium Titanate Ceramic

2015

The relaxor behavior of barium zirconium titanate ceramics BaZr0.35Ti0.65O3 prepared by a conventional sintering process was investigated. The synthesized material was determined by an X-ray diffraction and scanning electron microscopy. Based on performed studies, the BaZr0.35Ti0.65O3 ceramic material has been identified as canonical relaxor, related to the Ti-rich polar regions. The freezing temperature Tf and activation energy Ea are calculated from the Vogel-Fulcher relationship.

DiffractionMaterials scienceScanning electron microscopechemistry.chemical_elementSinteringBariumActivation energyCondensed Matter PhysicsElectronic Optical and Magnetic MaterialsDielectric spectroscopychemistry.chemical_compoundchemistryChemical engineeringvisual_artBarium titanatevisual_art.visual_art_mediumCeramicFerroelectrics
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Defects at the TiO2(100) surface probed by resonant photoelectron diffraction.

2006

We report photoelectron diffraction (PED) experiments of weakly sub-stoichiometric TiO 2 (100) rutile surfaces. Apart from standard core-level PED from the Ti-2p3/2 line, we have studied valence band PED from the defect induced Ti-3d states in the insulating band gap. For maximum yield, the latter were resonantly excited at the Ti-2p absorption edge. The PED patterns have been analyzed within the forward scattering approximation as well as by comparison with simulated PED patterns obtained in multiple scattering calculations. The analysis shows that the defect induced Ti-3d charge is mainly located on the second layer Ti atoms. © 2007 Elsevier B.V. All rights reserved.

DiffractionMaterials scienceScatteringForward scatterBand gapAnalytical chemistry02 engineering and technologySurfaces and Interfaces021001 nanoscience & nanotechnologyCondensed Matter Physics01 natural sciencesMolecular physicsPhotoelectron diffractionResonant photoemissionSurfaces Coatings and FilmsAbsorption edgeRutileExcited state0103 physical sciencesMaterials ChemistryTitanium dioxide010306 general physics0210 nano-technologySurface defectsLine (formation)
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Defect States at theTiO2(110)Surface Probed by Resonant Photoelectron Diffraction

2008

The charge distribution of the defect states at the reduced ${\mathrm{TiO}}_{2}(110)$ surface is studied via a new method, the resonant photoelectron diffraction. The diffraction pattern from the defect state, excited at the $\mathrm{Ti}\mathrm{\text{\ensuremath{-}}}2p\mathrm{\text{\ensuremath{-}}}3d$ resonance, is analyzed in the forward scattering approach and on the basis of multiple scattering calculations. The defect charge is found to be shared by several surface and subsurface Ti sites with the dominant contribution on a specific subsurface site in agreement with density functional theory calculations.

DiffractionMaterials scienceScatteringForward scatterGeneral Physics and AstronomyCharge densityCharge (physics)02 engineering and technology010402 general chemistry021001 nanoscience & nanotechnology01 natural sciencesResonance (particle physics)0104 chemical sciencesExcited stateDensity functional theoryAtomic physics0210 nano-technologyPhysical Review Letters
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Diffraction by fractal metallic supergratings.

2007

The reflectance of corrugated surfaces with a fractal distribution of grooves is investigated. Triadic and polyadic Cantor fractal distributions are considered, and the reflected intensity is compared with that of the corresponding periodic structure. The self-similarity property of the response is analyzed when varying the depth of the grooves and the lacunarity parameter. The results confirm that the response is self-similar for the whole range of depths considered, and this property is also maintained for all values of the lacunarity parameter. © 2007 Optical Society of America. Fil: Skigin, Diana Carina. Consejo Nacional de Investigaciones Científicas y Técnicas. Oficina de Coordinación…

DiffractionMaterials scienceScatteringbusiness.industryCiencias Físicas//purl.org/becyt/ford/1.3 [https]Polarization (waves)ReflectivityAtomic and Molecular Physics and OpticsAstronomía//purl.org/becyt/ford/1 [https]MetalOpticsFractalLacunarityvisual_artvisual_art.visual_art_mediumReflection coefficientbusinessCIENCIAS NATURALES Y EXACTASOptics express
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Characterization By Electroreflectance Of Thin Films And Thin Film Interfaces In Layered Structures.

1987

This paper reports investigations of ZnS quasi-amorphous films by electroreflectance (ER). The films were produced by thermal evaporation and their structure determined by electron diffraction. A voltage Vo cos cut was applied through the film with two evaporated Al electrodes. A lock-in amplifier gave 2 signals, Sf at f=ω/2π frequency and S2f at 2f frequency. The S2f spectrum, characteristic of the centrosymmetric bulk component of the film, reveals tails of localized states typical of amorphous semi-conductors. The Sf spectrum, characteristic of the interface layers with broken centro-symmetry, reveals tails of impurity levels which we attributed to diffusion of the electrode metal into t…

DiffractionMaterials scienceSemiconductorCondensed matter physicsElectron diffractionImpuritybusiness.industryElectrodeAnalytical chemistryElectronThin filmbusinessAmorphous solidSPIE Proceedings
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Optimization of thermal coefficient of electrical resistivity of Co-Ti-Si thin films due to laser-induced chemical reactions

2001

The CO2 laser induced optimization of the thermal coefficient of electrical resistivity in Co-Ti-Si thin films is realized. The X-ray diffraction studies of the annealed Co- Ti-Si films confirm that the changes of electrical properties are related to forming a small structure of crystalline compounds Ti5Si3 and CoSi2 in an amorphous matrix.

DiffractionMaterials scienceSiliconAnnealing (metallurgy)Analytical chemistrychemistry.chemical_elementLaserlaw.inventionCondensed Matter::Materials ScienceCarbon filmchemistryElectrical resistivity and conductivitylawX-ray crystallographyThin filmFourth International Workshop on Nondestructive Testing and Computer Simulations in Science and Engineering
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Magnetic and structural properties of the nanostructured Fe 1–x Si x system with x = 0.1, 0.2 and 0.3, mechanical alloyed and sintered

2007

The magnetic and structural properties of the nanostructured system Fe1–xSix with x = 0.1, 0.2 and 0.3 were studied by X-Ray diffraction (XRD), SEM, and Mossbauer Spectrometry (MS). The samples were prepared by compacting and sintering at two temperatures, 900 and 1000 uC, from powders obtained by means of two procedures: by elemental mixing of Fe and Si powders and by mechanical alloying (MA). For samples obtained from mixed powders and sintered at 900 and 1000 uC, XRD and MS show the presence of pure iron and silicon, indicating that these conditions do not favor alloying, except for the sample with 30 at.% and 1000 uC, for which, besides of iron and silicon patterns, the DO3 and FeSi pha…

DiffractionMaterials scienceSiliconMetallurgyAlloyMixing (process engineering)Sinteringchemistry.chemical_elementengineering.materialCondensed Matter PhysicsGrain sizechemistryengineeringMossbauer spectrometryphysica status solidi c
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