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Magnetic and structural properties of the nanostructured Fe 1–x Si x system with x = 0.1, 0.2 and 0.3, mechanical alloyed and sintered
2007
The magnetic and structural properties of the nanostructured system Fe1–xSix with x = 0.1, 0.2 and 0.3 were studied by X-Ray diffraction (XRD), SEM, and Mossbauer Spectrometry (MS). The samples were prepared by compacting and sintering at two temperatures, 900 and 1000 uC, from powders obtained by means of two procedures: by elemental mixing of Fe and Si powders and by mechanical alloying (MA). For samples obtained from mixed powders and sintered at 900 and 1000 uC, XRD and MS show the presence of pure iron and silicon, indicating that these conditions do not favor alloying, except for the sample with 30 at.% and 1000 uC, for which, besides of iron and silicon patterns, the DO3 and FeSi pha…
128-Channel Silicon Strip Detector Installed at a Powder Diffractometer
2004
Silicon strip detectors represent a new class of one-dimensional position-sensitive single photon counting devices. They allow a reduction of measurement time at the powder diffractometers by a factor up to 100 compared to instruments with a single counter, while maintaining comparable count statistics. Present work describes a 128-channel detector working with a standard diffractometer. The detector is 12.8 mm long and covers the angular range of 3.2 deg. We discuss the diffraction geometry in real and reciprocal space, the FWHM of diffraction peaks, and the background level. Measurements were made on standard samples and on complex samples of industrial importance (e. g., portland clinker…
<title>Holographic recording in amorphous chalcogenide semiconductor photoresists</title>
1998
The properties and mechanism of relaxation processes of holographic gratings in amorphous chalcogenide semiconductor films have been studied. The possibilities of the practical applications of these materials as the photoresists for the production of the relief holograms and holographic optical elements are discussed. It is shown that the self- enhancement phenomenon of holographic recording in amorphous chalcogenide semiconductor films by light or thermal treatment can be used to increase the diffraction efficiency of the holograms.© (1998) COPYRIGHT SPIE--The International Society for Optical Engineering. Downloading of the abstract is permitted for personal use only.
Elemental distribution and structural characterization of GaN/InGaN core-shell single nanowires by Hard X-ray synchrotron nanoprobes
2019
Improvements in the spatial resolution of synchrotron-based X-ray probes have reached the nano-scale and they, nowadays, constitute a powerful platform for the study of semiconductor nanostructures and nanodevices that provides high sensitivity without destroying the material. Three complementary hard X-ray synchrotron techniques at the nanoscale have been applied to the study of individual nanowires (NWs) containing non-polar GaN/InGaN multi-quantum-wells. The trace elemental sensitivity of X-ray fluorescence allows one to determine the In concentration of the quantum wells and their inhomogeneities along the NW. It is also possible to rule out any contamination from the gold nanoparticle …
Phonon-induced optical superlattice
2005
We demonstrate the formation of a dynamic optical superlattice through the modulation of a semiconductor microcavity by stimulated acoustic phonons. The high coherent phonon population produces a folded optical dispersion relation with well-defined energy gaps and renormalized energy levels, which are accessed using reflection and diffraction experiments.
Investigation of Silicon Carbide Polytypes by Raman Spectroscopy
2014
Abstract Polytypes of colourless and coloured single crystals of silicon carbide (SiC) grown on SiC substrates by chemical vapour deposition are studied using Raman spectroscopy supplemented by scanning electron microscopy (SEM) and X-ray diffraction (XRD) analyses. The SEM analysis of the defect stacking faults, inclusions of defects and their distribution has shown that they correlate with the peak positions of the obtained Raman spectra and with the XRD data on the crystal structure
Effective hydrostatic limits of pressure media for high‐pressure crystallographic studies
2007
The behavior of a number of commonly used pressure media, including nitrogen, argon, 2-propanol, a 4:1 methanol–ethanol mixture, glycerol and various grades of silicone oil, has been examined by measuring the X-ray diffraction maxima from quartz single crystals loaded in a diamond-anvil cell with each of these pressure media in turn. In all cases, the onset of non-hydrostatic stresses within the medium is detectable as the broadening of the rocking curves of X-ray diffraction peaks from the single crystals. The onset of broadening of the rocking curves of quartz is detected at ∼9.8 GPa in a 4:1 mixture of methanol and ethanol and at ∼4.2 GPa in 2-propanol, essentially at the same pressures …
Operational modes of a ferroelectric LCoS modulator for displaying binary polarization, amplitude, and phase diffraction gratings
2009
We analyze the performance of a ferroelectric liquid crystal on silicon display (FLCoS) as a binary polarization diffraction grating. We analyze the correspondence between the two polarization states emerging from the displayed grating and the polarization and intensity of the diffracted orders generated at the Fourier diffraction plane. This polarization-diffraction analysis leads, in a simple manner, to configurations yielding binary amplitude or binary phase modulation by incorporating an analyzer on the reflected beam. Based on this analysis, we present two useful variations of the polarization configuration. The first is a simplification using a single polarizer, which provides equival…
An X-ray scattering study of lipid monolayers at the air-water interface and on solid supports
1988
Abstract Monolayers of the lipid arachidic acid (C20) and of the phospholid dimyristolyphosphatidic acid (PMDA) have been studied by X-ray reflection and diffraction technique, using a purpose-built Langmuir trough installed at the sample stage of our high-resolution X-ray diffractometer at the DORIS synchroton X-ray source in Hamburg. For comparison we also report data for monolayers of C20 on a solid support using a 10 kW rotating anode X-ray source. By the X-ray reflection method, the density profile across the interface is probe, while in-plane diffraction measurements gauge the two-dimensional crystalline properties of the monolayers. Flourescence microscopy experiments of DMPA monolay…
<title>Relaxation processes in amorphous As-S and As-Se films</title>
1997
The relaxation of optical, mechanical and chemical properties of as-evaporated amorphous As-S and As-Se films while storing them at room temperature is investigated. The AsxS1-x films with arsenic content 0.3 less than x less than 0.4 are found to undergo maximal changes. It is shown that the phenomenon of dark self-enhancement of holograms (an increase of diffraction efficiency over time without any special treatment) can be used as an efficient method for investigation of relaxation processes in the amorphous chalcogenide films. The changes of diffraction efficiency in amorphous As2S3 films have been measured as a function of aging time and recording light intensity. The relaxation proces…