Search results for "Microscope"

showing 10 items of 1412 documents

Ultrafast beam shaping with high-numerical-aperture microscope objectives

2009

Ultrafast diffraction results in spatiotemporal un-coupling of the wave field, inducing spectral anomalies and pulse stretching. Localized compensation may be achieved via angular dispersion driven by diffractive optical elements (DOEs). We report on an DOEs-based beam shaper of ultrashort optical pulses with high spatiotemporal resolution. Inspection of the validity of our approach is performed in the single-cycle regime.

PhysicsDiffractionMicroscopebusiness.industryBeam steeringPhysics::OpticsAtomic and Molecular Physics and OpticsPulse (physics)law.inventionOpticslawOptoelectronicsLight beambusinessUltrashort pulseDiffraction gratingBeam (structure)Optics Express
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Resolution enhancement in quantitative phase microscopy

2019

Quantitative phase microscopy (QPM), a technique combining phase imaging and microscopy, enables visualization of the 3D topography in reflective samples, as well as the inner structure or refractive index distribution of transparent and translucent samples. Similar to other imaging modalities, QPM is constrained by the conflict between numerical aperture (NA) and field of view (FOV): an imaging system with a low NA has to be employed to maintain a large FOV. This fact severely limits the resolution in QPM up to 0.82λ/NA, λ being the illumination wavelength. Consequently, finer structures of samples cannot be resolved by using modest NA objectives in QPM. Aimed to that, many approaches, suc…

PhysicsDiffractionbusiness.industryResolution (electron density)02 engineering and technology021001 nanoscience & nanotechnology01 natural sciencesAtomic and Molecular Physics and OpticsNumerical aperture010309 opticsSpeckle patternOptics0103 physical sciencesMicroscopyNear-field scanning optical microscope0210 nano-technologybusinessRefractive indexImage resolutionAdvances in Optics and Photonics
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Electrodynamics in complex systems

1996

This paper discusses recent theoretical efforts to develop a general and flexible method for the calculation of the field distributions around and inside complex optical systems involving both dielectric and metallic materials. Starting from the usual light-matter coupling Hamiltonian, we derive a self-consistent equation for the optical field in arbitrary optical systems composed of N different subdomains. We show that an appropriate solving procedure based on the real-space discretization of each subdomain raises the present approach to the rank of an accurate predictive numerical scheme. In order to illustrate its applicability, we use this formalism to address challenging problems relat…

PhysicsDiscretizationScatteringComplex systemPhysics::OpticsNear and far fieldDielectricOptical fieldPhysical opticsScatteringSurfacesymbols.namesakeClassical mechanicssymbolsHamiltonian (quantum mechanics)Scanning Tunneling MicroscopePhysical Review E - Statistical Physics, Plasmas, Fluids, and Related Interdisciplinary Topics
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Direct interpretation of near-field optical images.

2001

The interpretation of the detection process in near-field optical microscopy is reviewed on the basis of a discussion about the possibility of establishing direct comparisons between experimental images and the solutions of Maxwell equations or the electromagnetic local density of states. On the basis of simple physical arguments, it is expected that the solutions of Maxwell equations should agree with images obtained by collecting mode near-field microscopes, while the electromagnetic local density of states should be considered to provide a practical interpretation of illumination mode near-field microscopes. We review collecting mode near-field microscope images where the conditions to o…

PhysicsHistologyMicroscopeLocal density of statesbusiness.industryNear and far fieldContext (language use)Pathology and Forensic Medicinelaw.inventionMagnetic fieldsymbols.namesakeOpticsMaxwell's equationslawElectric fieldMicroscopysymbolsbusinessJournal of microscopy
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Peculiarities of imaging one- and two-dimensional structures using an electron microscope in the mirror operation mode.

2001

Measurements performed in an electron microscope with the mirror operation mode are most sensitive to local electric fields and geometrical roughness of any kind of the object being studied. The object with a geometrical relief is equivalent to a smooth surface with an effective distribution of microfields. Electrons forming the image interact with the local microfields for an extended time: during approach to the object, deceleration and acceleration away from the object. As a result, the electron trajectories can be strongly distorted, and the contrast changes essentially, leading to image deformation of details of the object under investigation and to lowering of the resolution. These ef…

PhysicsHistologybusiness.industryResolution (electron density)ElectronSurface finishObject (computer science)Pathology and Forensic Medicinelaw.inventionAccelerationOpticslawElectric fieldElectron microscopebusinessHigh-resolution transmission electron microscopyJournal of microscopy
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Analysis of photon-scanning tunneling microscope images of inhomogeneous samples: determination of the local refractive index of channel waveguides

1995

Channel waveguides are imaged by a photon-scanning tunneling microscope (PSTM). The polarization of the light and its orientation with respect to the guide axis are shown to be very important parameters in the analysis of the images of such samples. We simulated image formation for the plane of incidence parallel to the axis of the guide. Our theoretical results are qualitatively in agreement with our measurements. These results show the ability of the PSTM to give information about the local refractive-index variations of a sample.

PhysicsImage formationTotal internal reflectionPlane of incidencebusiness.industryPhysics::OpticsPolarization (waves)Atomic and Molecular Physics and OpticsElectronic Optical and Magnetic Materialslaw.inventionLight intensityOpticslawLight beamComputer Vision and Pattern RecognitionScanning tunneling microscopebusinessRefractive indexJournal of the Optical Society of America A
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Disorder and localization effects on the local spectroscopic and infrared optical properties ofGa1−xMnxAs

2015

We study numerically the influence of disorder and localization effects on the local spectroscopic characteristics and infrared optical properties of ${\text{Ga}}_{1\ensuremath{-}x}{\text{Mn}}_{x}\text{As}$. We treat the band structure and disorder effects at an equal level by using an exact diagonalization supercell simulation method. This method accurately describes the low-doping limit and gives a clear picture of the transition to higher dopings, which captures the localization effects inaccessible to other theoretical methods commonly used. Our simulations capture the rich in-gap localized states observed in scanning tunneling microscopy studies and reproduce the observed features of t…

PhysicsInfraredFermi energy02 engineering and technologyMagnetic semiconductor021001 nanoscience & nanotechnologyCondensed Matter Physics01 natural sciencesMolecular physicsElectronic Optical and Magnetic Materialslaw.inventionDelocalized electronlaw0103 physical sciencesQuasiparticleAbsorption (logic)Scanning tunneling microscope010306 general physics0210 nano-technologyElectronic band structurePhysical Review B
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Imaging Static Charge Distributions: A Comprehensive KPFM Theory

2018

We analyze Kelvin probe force microscopy (KPFM) for tip-sample systems that contain static charges by presenting a rigorous derivation for the respective KPFM signal in all common KPFM modes, namely amplitude modulation, frequency modulation, or heterodyne detection in the static, open-loop or closed-loop variant. The electrostatic model employed in the derivation is based on a general electrostatic analysis of an arbitrary tip-sample geometry formed by two metals, and which can include a static charge distribution and dielectric material in-between. The effect of the electrostatic force on the oscillating tip is calculated from this model within the harmonic approximation, and the observab…

PhysicsKelvin probe force microscopeWeight functionOscillationCharge densityCharge (physics)02 engineering and technology021001 nanoscience & nanotechnology01 natural sciencesSignalAmplitude modulation0103 physical sciencesPhysics::Atomic and Molecular ClustersHeterodyne detectionAtomic physics010306 general physics0210 nano-technology
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Analysis of the imaging method for assessment of the smile of laser diode bars.

2009

We study imaging systems designed to assess the smile of laser diode bars (LDBs). The magnification matrix is derived from the required sampling period and the geometries of the LDBs and the charge-coupled device (CCD) array. These image-forming systems present in-plane pure translation invariance, but in the case of anamorphic ones, lack in-plane rotation invariance. It is shown that the smile parameters of the image of the LDB are linked with the smile parameters of the LDB by simple mathematical expressions. The spatial resolution of such optical systems is estimated at approximately 1 microm for a mean wavelength of lambda approximately 800 nm. Our results suggest that, with the current…

PhysicsLaser diodebusiness.industryMaterials Science (miscellaneous)Optical instrumentMagnificationIndustrial and Manufacturing Engineeringlaw.inventionWavelengthOpticslawDigital image processingNear-field scanning optical microscopeBusiness and International ManagementbusinessRotation (mathematics)Image resolutionApplied optics
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Optical module for single-shot quantitative phase imaging based on the transport of intensity equation with field of view multiplexing

2021

We present a cost-effective, simple, and robust method that enables single-shot quantitative phase imaging (QPI) based on the transport of intensity equation (TIE) using an add-on optical module that can be assembled into the exit port of any regular microscope. The module integrates a beamsplitter (BS) cube (placed in a non-conventional way) for duplicating the output image onto the digital sensor (field of view – FOV – multiplexing), a Stokes lens (SL) for astigmatism compensation (introduced by the BS cube), and an optical quality glass plate over one of the FOV halves for defocusing generation (needed for single-shot TIE algorithm). Altogether, the system provides two laterally separate…

PhysicsMicroscopeImage qualitybusiness.industryComputingMethodologies_IMAGEPROCESSINGANDCOMPUTERVISIONPhase (waves)Field of viewÒpticaOptometriaMultiplexingAtomic and Molecular Physics and Opticslaw.inventionLens (optics)OpticslawbusinessPhase retrievalBeam splitter
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