Search results for "Microscopy"

Nanoscale X-ray detectors based on individual CdS, SnO2 and ZnO nanowires

2021

Abstract The development of nanoscale X-ray sensors is of crucial importance to achieve higher spatial resolution in many X-ray-based techniques playing a key role in materials science, healthcare, and security. Here, we demonstrate X-ray detection using individual CdS, SnO 2 , and ZnO nanowires (NWs). The NWs were produced via vapor–liquid–solid technique and characterized using X-ray diffraction, scanning, and transmission electron microscopy . Electrical measurements were performed under ambient conditions while exposing two-terminal NW-based devices to X-rays generated by a conventional tungsten anode X-ray tube. Fast and stable nanoampere-range X-ray beam induced current (XBIC) in resp…

Physics of Near-Field Optical Images

2005

Magnetization changes visualized using photoemission electron microscopy

2004

Abstract Photoemission electron microscopy was used to visualize the motion of magnetic domains on a sub-nanosecond timescale. The technique exploits the imaging of magnetic domains using soft X-ray circular dichroism, with the special feature that the instrument utilizes a fast image acquisition system with intrinsic 125 ps time resolution. The overall time resolution used is about 500 ps. Different domains and domain movements have been observed in lithographically-produced Permalloy structures on a copper microstrip-line. A current pulse of I=0.5 A with rise times of about 300 ps switched the Permalloy islands from a Landau-Lifshitz type domain configuration into metastable s-state domai…

Robustness of plasmonic angular momentum confinement in cross resonant optical antennas

2015

Using a combination of photoemission electron microscopy and numerical simulations, we investigated the angular moment transfer in strongly enhanced optical near-fields of artificially fabricated optical antennas. The polarization dependence of the optical near-field enhancement has been measured in a maximum symmetric geometry, i.e., excitation by a normal incident planar wave. Finite-difference time-domain simulations for the realistic antenna geometries as determined by high-resolution electron microscopy reveal a very good agreement with experimental data. The agreement confirms that the geometrical asymmetries and inhomogeneities due to the nanoscale fabrication process preserve the ci…

Stroboscopic XMCD-PEEM Imaging

2007

Abstract This article summarizes recent results on magnetization dynamics obtained with time-resolved photoemission electron microscopy (PEEM) using X-ray magnetic circular dichroism as contrast mechanism. Time resolution is performed by a stroboscopic technique that is exclusively sensitive to reversible processes, but offers a very high time resolution only limited by the X-ray pulse width. A time resolution of 20 ps in combination with a lateral resolution of 100 nm has been achieved.

Quasi-isotropic 3-D resolution in two-photon scanning microscopy.

2009

One of the main challenges in three-dimensional microscopy is to overcome the lack of isotropy of the spatial resolution, which results from the axially-elongated shape of the point spread function. Such anisotropy gives rise to images in which significant axially-oriented structures of the sample are not resolved. In this paper we achieve an important improvement in z resolution in two-photon excitation microscopy through spatial modulation of the incident beam. Specifically, we demonstrate that the design and implementation of a simple shaded ring performs quasi-isotropic three-dimensional imaging and that the corresponding loss in luminosity can be easily compensated by most available fe…

Reduction of focus size in tightly focused linearly polarized beams

2004

The electromagnetic theory predicts that when a linearly polarized collimated field is focused by a high-angle focusing system, components perpendicular to the initial polarization are generated. The use of annular masks to reduce the area of the focal spot usually increases the magnitude of this phenomenon, known as depolarization. We present a class of masks, the three-ring masks, which are important because they narrow the central lobe of the focal intensity distribution without increasing the depolarization. This can be very useful in modern optical applications, such as confocal microscopy or multiphoton scanning microscopy.

Maximizing the information gain of a single ion microscope using bayes experimental design

2016

We show nanoscopic transmission microscopy, using a deterministic single particle source and compare the resulting images in terms of signal-to-noise ratio, with those of conventional Poissonian sources. Our source is realized by deterministic extraction of laser-cooled calcium ions from a Paul trap. Gating by the extraction event allows for the suppression of detector dark counts by six orders of magnitude. Using the Bayes experimental design method, the deterministic characteristics of this source are harnessed to maximize information gain, when imaging structures with a parametrizable transmission function. We demonstrate such optimized imaging by determining parameter values of one and …

Single-shot generation and detection of a two-photon generalized binomial state in a cavity

2006

A "quasi-deterministic" scheme to generate a two-photon generalized binomial state in a single-mode high-Q cavity is proposed. We also suggest a single-shot scheme to measure the generated state based on a probe two-level atom that "reads" the cavity field. The possibility of implementing the schemes is discussed.

Spatially resolved observation of dynamics in electrical and magnetic field distributions by means of a delayline detector and PEEM

2005

Abstract Photoemission electron microscopy (PEEM) was exploited to observe the dynamics in local field distributions on microstrip-line devices with a best time resolution of 133 ps. A delayline detector system served as imaging unit capable of a time resolving data acquisition and processing. The setup can be operated at the resolution limit of the PEEM of about 20 nm while a continuously illuminating UV-lamp excites the photoelectrons in threshold photoemission. A pulsed photon source is not needed to obtain time resolved images, the time reference of the data acquisition was taken by a periodic signal (clock, here typ. 100 MHz) in phase with the pulse pattern applied to the microstrip-li…