Search results for "Microscopy"

showing 10 items of 3390 documents

Human norovirus binding to select bacteria representative of the human gut microbiota

2016

Recent reports describe the ability of select bacterial strains to bind human norovirus, although the specificity of such interactions is unknown. The purpose of this work was to determine if a select group of bacterial species representative of human gut microbiota bind to human norovirus, and if so, to characterize the intensity and location of that binding. The bacteria screened included naturally occurring strains isolated from human stool (Klebsiella spp., Citrobacter spp., Bacillus spp., Enterococcus faecium and Hafnia alvei) and select reference strains (Staphylococcus aureus and Enterobacter cloacae). Binding in PBS was evaluated to three human norovirus strains (GII.4 New Orleans 2…

RNA viruses0301 basic medicinePhysiologyvirusesEnterococcus faeciumFimbrialcsh:MedicineBacillusPathology and Laboratory Medicinemedicine.disease_causePilusFecesBinding AnalysisCitrobacterKlebsiellaMedicine and Health SciencesElectron Microscopylcsh:ScienceCitrobacterMicroscopyMultidisciplinarybiologyChemistryBody FluidsBloodMedical MicrobiologyViral PathogensVirusesAnaerobic bacteriaPathogensAnatomyCell Binding AssayResearch ArticleCell BindingStaphylococcus aureusCell PhysiologyAnaerobic BacteriaResearch and Analysis MethodsMicrobiologyCalicivirusesMicrobiology03 medical and health sciencesEnterobacter cloacaemedicineHumansMicrobial PathogensChemical CharacterizationBiology and life sciencesBacteriaNoroviruslcsh:ROrganismsHafnia alveiCell Biologybiology.organism_classificationCulture MediaGastrointestinal Microbiome030104 developmental biologyFimbriae BacterialNorovirusMicrobial InteractionsTransmission Electron Microscopylcsh:QEnterobacter cloacaeBacteriaEnterococcus faeciumPLOS ONE
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Image enhancement in photoemission electron microscopy by means of imaging time-of-flight analysis

2004

Abstract Photoemission electron microscopy (PEEM) is widely used in combination with synchrotron sources as a powerful tool to observe chemical and magnetic properties of metal and semiconductor surfaces. Presently, the resolution limit of these instruments using soft-X-ray excitation is limited to about 50 nm, because of the chromatic aberation of the electron optics used. Various sophisticated approaches have thus been reported for enhancing the spatial resolution in photoemission electron microscopy. This work demonstrates the use of a simple imaging energy filter based on electron time-of-flight (ToF) selection. The spatial resolution could be improved dramatically, even though the inst…

RadiationChemistrybusiness.industryInverse photoemission spectroscopyResolution (electron density)Scanning confocal electron microscopyCondensed Matter PhysicsAtomic and Molecular Physics and OpticsElectronic Optical and Magnetic MaterialsPhotoemission electron microscopyOpticsElectron tomographyScanning transmission electron microscopyEnergy filtered transmission electron microscopyPhysical and Theoretical ChemistryHigh-resolution transmission electron microscopybusinessSpectroscopyJournal of Electron Spectroscopy and Related Phenomena
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Spectral Measurement of Photon Emission from Individual Gold Nanoparticles Using Scanning Tunneling Microscopy

2016

The light emission spectra of individual Au nanoparticles induced by a scanning tunneling microscope (STM) have been investigated. Two-dimensional ensembles of tunnel-coupled Au particles were prepared by thermal evaporation onto a native oxide silicon wafer in ultrahigh vacuum (10 – 9 mbar). Our STM measurements show a single peak at photon energy 1.6 eV in the tunneling mode and two peaks at 2.2 eV (connected with the Mie plasmon) and 1.45 eV (a new peak which was not discussed in literature before) in the field emission mode.

RadiationMaterials scienceGold nanoparticle010405 organic chemistrybusiness.industryAnalytical chemistryElectron-photon spectroscopy010402 general chemistryCondensed Matter Physics01 natural sciencesElectrochemical scanning tunneling microscope0104 chemical scienceslaw.inventionPhoton emissionColloidal goldlawComputer Science::Systems and ControlCondensed Matter::SuperconductivityScanning ion-conductance microscopyOptoelectronicsGeneral Materials ScienceScanning tunneling microscopebusinessScanning tunneling microscope (STM)
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Photoemission time-of-flight spectromicroscopy of Ag nanoparticle films on Si(111)

2004

Abstract Time-of-flight photoemission electron microscopy was used to measure spatially resolved energy distribution curves of electrons emitted from Ag nanoparticle films with different mass thicknesses. Two-photon photoemission (2PPE) was induced by femtosecond laser pulse excitation with 3.1 eV photon energy and 200 fs pulse width. Regions of Ag nanoparticles with different average sizes and one region with a continuous 100 nm thick Ag film were deposited as a stepped wedge on a Si(1 1 1) substrate. Upon laser excitation the nanoparticle films exhibit a very high electron emission yield in the images, whereas the uncovered Si surface and the continuous Ag film are dark. The time-of-fligh…

RadiationMaterials scienceInverse photoemission spectroscopyAnalytical chemistryPhysics::OpticsNanoparticleAngle-resolved photoemission spectroscopyPhoton energyCondensed Matter PhysicsMolecular physicsAtomic and Molecular Physics and OpticsElectronic Optical and Magnetic MaterialsCondensed Matter::Materials ScienceTime of flightPhotoemission electron microscopyCondensed Matter::SuperconductivityFemtosecondPhysical and Theoretical ChemistrySpectroscopyPlasmonJournal of Electron Spectroscopy and Related Phenomena
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Multiphoton photoemission electron microscopy using femtosecond laser radiation

2002

Abstract The interaction of intense, pulsed laser radiation with surfaces results in non-linear optical effects that are responsible for emission of electrons even if the photon energies are below the work function. In the present study, photoelectrons have been excited by means of femtosecond laser pulses from a frequency doubled Ti:sapphire laser with a photon energy of 3.1 eV. The spatial distribution of the photo emitted electrons was imaged using a photoemission electron microscope. All samples exhibit centres of enhanced second or higher order photoemission yield, so called ‘hot spots’. These ‘hot spots’ were preferentially excited with s-polarised light. This behaviour may be explain…

RadiationMaterials scienceInverse photoemission spectroscopyPhysics::OpticsAngle-resolved photoemission spectroscopyPhoton energyPhotoelectric effectCondensed Matter PhysicsLaserAtomic and Molecular Physics and OpticsElectronic Optical and Magnetic Materialslaw.inventionPhotoemission electron microscopylawSecondary emissionFemtosecondPhysical and Theoretical ChemistryAtomic physicsSpectroscopyJournal of Electron Spectroscopy and Related Phenomena
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Surface magnetism studied by photoelectron spectromicroscopy with high spatial and time resolution

2004

Abstract Photoemission electron microscopy (PEEM) is widely used for the study of magnetic surfaces and thin films. Ferromagnetic and antiferromagnetic microstructures are investigated exploiting magnetic circular and linear dichroism in the soft X-ray range using tuneable synchrotron radiation. Local dichroism spectroscopy gives access to magnetic moments of the elements in compounds or multilayer materials. Beyond these achievements, the method bears a high future potential with respect to an increased lateral resolution via aberration correction of the electron optics and a high time resolution in the 100 ps range for the study of dynamic processes. In addition, photoelectron spin polari…

RadiationMaterials scienceMagnetic momentCondensed matter physicsMagnetismAnalytical chemistrySynchrotron radiationDichroismCondensed Matter PhysicsLinear dichroismAtomic and Molecular Physics and OpticsElectronic Optical and Magnetic MaterialsCondensed Matter::Materials SciencePhotoemission electron microscopyFerromagnetismElectron opticsPhysical and Theoretical ChemistrySpectroscopyJournal of Electron Spectroscopy and Related Phenomena
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Photoemission microscopy with microspot-XPS by use of undulator radiation and a high-throughput multilayer monochromator at BESSY

1999

We present a new experiment for photoelectron microspectroscopy by use of undulator radiation, which has been set up at the beamline U2 at the Berlin electron storage ring BESSY 1. This approach employs a non-imaging simulated hemispherical electron energy analyser attached to an imaging photoemission electron microscope (FOCUS IS-PEEM) with integrated microarea selector. The photoemission microscope exhibits a lateral resolution of 25 nm (with 4.9 eV UV-excitation), while the resolution with incident synchrotron radiation in the soft X-ray range is about 100-120 nm (mainly due to chromatic aberrations). Photoemission microscopy as well as photoelectron microspectroscopy of selected areas o…

RadiationMaterials scienceMicroscopeEUV multilayer opticsbusiness.industryExtreme ultraviolet lithographySynchrotron radiationUndulatorGratingCondensed Matter Physicsmicroarea XPSAtomic and Molecular Physics and Opticsphotoemission microscopyElectronic Optical and Magnetic Materialslaw.inventionOpticsX-ray photoelectron spectroscopylawBlazed gratingPhysical and Theoretical ChemistrybusinessSpectroscopyMonochromator
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Recent progress in photoemission microscopy with emphasis on chemical and magnetic sensitivity

1997

Abstract With the improved access to synchrotron radiation sources photoemission electron microscopy is developing into a versatile analytical tool in surface and materials science. The broad spectral range and the well-defined polarization characteristics of synchrotron light permit a unique combination of topographic, chemical, and even magnetic investigations down to a mesoscopic scale. The potentiality of photoemission electron microscopy is demonstrated by several experiments on surfaces and microstructured thin film systems, which have been carried out with a newly designed instrument. We discuss its different modes of operation with respect to both microscopy and spectroscopy. A comb…

RadiationMaterials sciencebusiness.industryMagnetic circular dichroismSynchrotron radiationAngle-resolved photoemission spectroscopyCondensed Matter PhysicsPolarization (waves)Atomic and Molecular Physics and OpticsSynchrotronElectronic Optical and Magnetic Materialslaw.inventionCondensed Matter::Materials SciencePhotoemission electron microscopyOpticslawMicroscopyPhysical and Theoretical ChemistryThin filmbusinessSpectroscopyJournal of Electron Spectroscopy and Related Phenomena
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Closed form for two-photon free–free transition matrix elements

2000

Abstract Two-photon free–free transitions happen in the multiphoton ionization with more than one excess photon and in bremsstralung. Up to now, the configuration space free–free transition amplitudes have not been written in closed form. We propose a modified Coulomb Green’s function (CGF) Sturmian expansion which allows one to obtain expressions for two-photon radial transition matrix elements in the closed form which are easy to continue analytically to calculate free–free transitions in H.

RadiationPhotonAmplitudeTwo-photon excitation microscopyChemistryQuantum mechanicsIonizationCoulombStochastic matrixConfiguration spaceFunction (mathematics)Radiation Physics and Chemistry
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Photoabsorption and MXCD in photoemission microscopy for characterisation of advanced materials

1999

Abstract We applied chemical and magnetic sensitive photoemission electron microscopy (PEEM) to investigate surfaces of advanced materials. PEEM at low photon energies provides a high spatial resolution, but suffers from the lack of information about the chemical composition of the imaged surface. Such information can be obtained by PEEM via tuning the photon energy to X-ray absorption edges. To apply spectromicroscopy we acquired and subtracted microscopic images using photon energies just below and at the edges. The resulting difference gives a micro-image of the lateral distribution of a specific element. Microspectroscopy is performed by recording the intensity of secondary electrons in…

RadiationPhotonMagnetic structurebusiness.industryChemistryAnalytical chemistryPhoton energyDichroismRadiationCondensed Matter PhysicsAtomic and Molecular Physics and OpticsSecondary electronsElectronic Optical and Magnetic MaterialsPhotoemission electron microscopyOpticsPhysical and Theoretical ChemistryAbsorption (electromagnetic radiation)businessSpectroscopyJournal of Electron Spectroscopy and Related Phenomena
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