6533b7d6fe1ef96bd1265991
RESEARCH PRODUCT
Recent progress in photoemission microscopy with emphasis on chemical and magnetic sensitivity
Gerd SchönhenseR. FrömterCh. ZiethenClaus M. SchneiderK. GrzelakowskiGerhard H. FecherOliver G. SchmidtJ. KirschnerW. SwiechHans Peter Oepensubject
RadiationMaterials sciencebusiness.industryMagnetic circular dichroismSynchrotron radiationAngle-resolved photoemission spectroscopyCondensed Matter PhysicsPolarization (waves)Atomic and Molecular Physics and OpticsSynchrotronElectronic Optical and Magnetic Materialslaw.inventionCondensed Matter::Materials SciencePhotoemission electron microscopyOpticslawMicroscopyPhysical and Theoretical ChemistryThin filmbusinessSpectroscopydescription
Abstract With the improved access to synchrotron radiation sources photoemission electron microscopy is developing into a versatile analytical tool in surface and materials science. The broad spectral range and the well-defined polarization characteristics of synchrotron light permit a unique combination of topographic, chemical, and even magnetic investigations down to a mesoscopic scale. The potentiality of photoemission electron microscopy is demonstrated by several experiments on surfaces and microstructured thin film systems, which have been carried out with a newly designed instrument. We discuss its different modes of operation with respect to both microscopy and spectroscopy. A combination of elemental selectivity and magnetic sensitivity is achieved by using circularly polarized soft X-rays and exploiting the effect of magnetic circular dichroism. This way one obtains information about the magnetic state of individual chemical components within the sample.
| year | journal | country | edition | language |
|---|---|---|---|---|
| 1997-03-01 | Journal of Electron Spectroscopy and Related Phenomena |