0000000000011521
AUTHOR
W. Swiech
showing 7 related works from this author
Element-Selective Magnetic Imaging in Exchange-Coupled Systems by Magnetic Photoemission Microscopy
1998
We have used a photoemission microscope to obtain element-resolved magnetic contrast in stacked magnetic thin film systems. Magnetic information is thereby provided by X-ray magnetic circular dichroism. Elemental sensitivity, which is crucial for studying magnetic coupling phenomena in systems with several different layers, is achieved by tuning the energy of the illuminating photons to atomic absorption edges. We present measurements of a Ni-coated Co micropattern on Cu(001), and a wedged Co/Cr/Fe(001) sample. In the former sample the Ni magnetization is seen to follow the magnetization of the Co pattern, thereby changing from an out-of-plane easy axis in areas without underlying Co to in…
Recent progress in photoemission microscopy with emphasis on chemical and magnetic sensitivity
1997
Abstract With the improved access to synchrotron radiation sources photoemission electron microscopy is developing into a versatile analytical tool in surface and materials science. The broad spectral range and the well-defined polarization characteristics of synchrotron light permit a unique combination of topographic, chemical, and even magnetic investigations down to a mesoscopic scale. The potentiality of photoemission electron microscopy is demonstrated by several experiments on surfaces and microstructured thin film systems, which have been carried out with a newly designed instrument. We discuss its different modes of operation with respect to both microscopy and spectroscopy. A comb…
Photoabsorption and MXCD in photoemission microscopy for characterisation of advanced materials
1999
Abstract We applied chemical and magnetic sensitive photoemission electron microscopy (PEEM) to investigate surfaces of advanced materials. PEEM at low photon energies provides a high spatial resolution, but suffers from the lack of information about the chemical composition of the imaged surface. Such information can be obtained by PEEM via tuning the photon energy to X-ray absorption edges. To apply spectromicroscopy we acquired and subtracted microscopic images using photon energies just below and at the edges. The resulting difference gives a micro-image of the lateral distribution of a specific element. Microspectroscopy is performed by recording the intensity of secondary electrons in…
Characterisation of structured thin films made from complex materials by photoabsorption spectromicroscopy
1998
Al3 and YBa2Cu3O7/PrBa2Cu3O7. To investigate devices built from these complex materials we applied element-sensitive photoemission electron microscopy (PEEM). Information about the chemical composition of the imaged sample can be obtained by PEEM via tuning the photon energy to X-ray absorption edges. To apply spectromicroscopy we acquired microscopic images using photon energies near and at the edges. Such images give the lateral distribution of a specific element. Microspectroscopy is performed by recording the intensity of the true secondary electrons in selected spots during a sweep of the photon energy. The main aim of our work was to observe oxygen-related defects and changes in the c…
Fast elemental mapping and magnetic imaging with high lateral resolution using a novel photoemission microscope
1998
Abstract Using tunable soft X-ray synchrotron radiation and a new-generation photoemission electron microscope with integral sample stage and microarea selector, elemental images and local XANES spectra have been measured. Given the present conditions (PM3 at BESSY), the lateral resolution was in the range of 130 nm with the potential of considerable improvement with high-brilliance sources (a base resolution of 25 nm was obtained in threshold photoemission). Measurements at the oxygen K-edge demonstrate that differences in the local chemical environment of the emitter atom are clearly revealed and can thus be used as a fingerprint technique for its chemical state and geometrical surroundin…
Magnetic Domain Imaging with a Photoemission Microscope
1997
ABSTRACTPhotoelectron emission microscopy (PEEM) has proven to be a versatile analytical technique in surface science. When operated with circularly polarized light in the soft x-ray regime, however, photoemission microscopy offers a unique combination of magnetic and chemical information. Exploiting the high brilliance and circular polarization available at a helical undulator beamline, the lateral resolution in the imaging of magnetic domain structures may be pushed well into the sub-micrometer range. Using a newly designed photoemission microscope we show that under these circumstances not only domains, but also domain walls can be selectively investigated. The high sensitivity of the te…
Chemical microimaging and microspectroscopy of surfaces with a photoemission microscope
1997
We applied element sensitive photoemission electron microscopy (PEEM) to investigate surfaces of devices built from complex materials. Conventional PEEM suffers from lack of information about the chemical composition of the imaged surface. Such information can be obtained by PEEM via tuning the photon energy to X-ray absorption edges. To apply spectromicroscopy we acquired and subtracted microscopic images using photon energies just below and at the edges. The resulting difference gives a micro-image of the lateral distribution of a specific element. Microspectroscopy is performed by recording the intensity of secondary electrons in selected spots during a sweep of the photon energy. We app…