Search results for "NC-AFM"

showing 4 items of 4 documents

Determining cantilever stiffness from thermal noise

2013

We critically discuss the extraction of intrinsic cantilever properties, namely eigenfrequency fn, quality factor Qn and specifically the stiffness kn of the nth cantilever oscillation mode from thermal noise by an analysis of the power spectral density of displacement fluctuations of the cantilever in contact with a thermal bath. The practical applicability of this approach is demonstrated for several cantilevers with eigenfrequencies ranging from 50 kHz to 2 MHz. As such an analysis requires a sophisticated spectral analysis, we introduce a new method to determine kn from a spectral analysis of the demodulated oscillation signal of the excited cantilever that can be performed in the frequ…

CantileverMaterials scienceAcousticsInstrumentationGeneral Physics and AstronomyNanotechnologythermal excitationlcsh:Chemical technologylcsh:TechnologySignal530Full Research PaperstiffnessQuality (physics)medicineNanotechnologylcsh:TP1-1185General Materials ScienceElectrical and Electronic Engineeringlcsh:Sciencecantileverlcsh:TOscillationSpectral densityStiffnessQ-factornoncontact atomic force microscopy (NC-AFM)lcsh:QC1-999spectral analysisNanoscienceresonanceQ factorlcsh:Qmedicine.symptomAFMlcsh:Physics
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Controlling Molecular Self-Assembly on an Insulating Surface by Rationally Designing an Efficient Anchor Functionality That Maintains Structural Flex…

2013

Molecular self-assembly on surfaces is dictated by the delicate balance between intermolecular and molecule-surface interactions. For many insulating surfaces, however, the molecule-surface interactions are weak and rather unspecific. Enhancing these interactions, on the other hand, often puts a severe limit on the achievable structural variety. To grasp the full potential of molecular self-assembly on these application-relevant substrates, therefore, requires strategies for anchoring the molecular building blocks toward the surface in a way that maintains flexibility in terms of intermolecular interaction and relative molecule orientation. Here, we report the design of a site-specific anch…

Flexibility (engineering)Surface (mathematics)Materials scienceelectrostatic anchoringIntermolecular forceGeneral EngineeringGeneral Physics and AstronomyAnchoringNanotechnologyself-assembly02 engineering and technology010402 general chemistry021001 nanoscience & nanotechnology53001 natural sciencesbulk insulatorsubstrate templatingNC-AFM0104 chemical sciencesIntermolecular interactionMolecular self-assemblyMoleculeGeneral Materials ScienceSelf-assembly0210 nano-technologyACS Nano
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Achieving high effectiveQ-factors in ultra-high vacuum dynamic force microscopy

2010

The effective Q-factor of the cantilever is one of the most important figures-of-merit for a non-contact atomic force microscope (NC-AFM) operated in ultra-high vacuum (UHV). We provide a comprehensive discussion of all effects influencing the Q-factor and compare measured Q-factors to results from simulations based on the dimensions of the cantilevers. We introduce a methodology to investigate in detail how the effective Q-factor depends on the fixation technique of the cantilever. Fixation loss is identified as a most important contribution in addition to the hitherto discussed effects and we describe a strategy for avoiding fixation loss and obtaining high effective Q-factors in the forc…

Materials scienceCantileverMicroscopebusiness.industryApplied MathematicsUltra-high vacuumQ-factorNanotechnology530NC-AFMlaw.inventionforce microscopyFixation (surgical)lawQ factormounting lossMicroscopyForce dynamicsOptoelectronicscantileverbusinessInstrumentationEngineering (miscellaneous)Non-contact atomic force microscopyMeasurement Science and Technology
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Thermal noise limit for ultra-high vacuum noncontact atomic force microscopy

2013

The noise of the frequency-shift signal Δf in noncontact atomic force microscopy (NC-AFM) consists of cantilever thermal noise, tip–surface-interaction noise and instrumental noise from the detection and signal processing systems. We investigate how the displacement-noise spectral density dz at the input of the frequency demodulator propagates to the frequency-shift-noise spectral density dΔf at the demodulator output in dependence of cantilever properties and settings of the signal processing electronics in the limit of a negligible tip–surface interaction and a measurement under ultrahigh-vacuum conditions. For a quantification of the noise figures, we calibrate the cantilever displacemen…

noiseCantilevernoncontact atomic force microscopyGeneral Physics and AstronomyNanotechnologyCantileverlcsh:Chemical technologyNoise (electronics)lcsh:Technology530Full Research PaperOpticsPhase noiseNanotechnologyGeneral Materials ScienceDetection theorylcsh:TP1-1185Electrical and Electronic Engineeringlcsh:SciencePhysicsNoise temperaturefilterbusiness.industrylcsh:TNoise spectral densityBandwidth (signal processing)Spectral density(NC-AFM)noncontact atomic force microscopy (NC-AFM)lcsh:QC1-999Nanosciencelcsh:Qfeedback loopbusinesslcsh:Physics
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