Search results for "Point defects"

showing 10 items of 46 documents

Physical Fundamentals of Biomaterials Surface Electrical Functionalization

2020

This article is focusing on electrical functionalization of biomaterial&rsquo

Materials scienceBiocompatibilitySurface finishElectric chargelcsh:TechnologyArticleoxygen vacanciesSurface roughnesssurfacepoint defectsGeneral Materials ScienceWork functionSurface chargelcsh:Microscopylcsh:QC120-168.85roughnesslcsh:QH201-278.5business.industrylcsh:Thydroxyapatiteelectrical chargeSemiconductorChemical engineeringlcsh:TA1-2040Surface modificationfunctionalizationlcsh:Descriptive and experimental mechanicslcsh:Electrical engineering. Electronics. Nuclear engineeringbusinesslcsh:Engineering (General). Civil engineering (General)lcsh:TK1-9971biomaterialsMaterials
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Structure of amorphous SiO 2 nanoparticles probed through the E′ γ centers

2011

We report an experimental investigation by electron paramagnetic resonance (EPR) spectroscopy on the properties of the E′ γ centers induced by β-ray irradiation in nanoparticles of amorphous SiO 2 (fumed silica) with mean diameters from 7 up to 40 nm. We found that the E′ γ centers are induced in all the fumed silica types in the dose range 4-400 kGy. They are characterized by an EPR line shape similar to that observed in common bulk silica materials independently on the particle diameter. Moreover, the E′ γ center concentration decreases on decreasing of the particle size for each given dose. Our findings are interpreted in terms of a shell-like model of nanoparticles in which it is assume…

Materials scienceElectronic Optical and Magnetic MaterialSettore FIS/01 - Fisica SperimentaleAnalytical chemistryNanoparticleSurfaces Coatings and FilmNanotechnologySurfaces Coatings and FilmsElectronic Optical and Magnetic Materialslaw.inventionAmorphous solidGeneral EnergyEnergy (all)lawParticle sizeIrradiationPhysical and Theoretical ChemistryElectron paramagnetic resonanceSpectroscopypoint defects silica nanoparticles electron paramagnetic resonanceRadiation resistanceFumed silica
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Ge-doped silica nanoparticles: production and characterisation

2016

Silica nanoparticles were produced from germanosilicate glasses by KrF laser irradiation. The samples were investigated by cathodoluminescence and scanning electron microscopy, providing the presence of nanoparticles with size from tens up to hundreds of nanometers. The emission of the Germanium lone pair center is preserved in the nanoparticles and atomic force microscopy revealed the presence of no spherical particles with a size smaller than ~4 nm. The absorption coefficient enhancement induced by Ge doping is reputed fundamental to facilitate the nanoparticles production. This procedure can be applied to other co-doped silica materials to tune the nanoparticles features.

Materials scienceLaser ablationScanning electron microscopePhysics::Medical PhysicsDopingSettore FIS/01 - Fisica SperimentalePhysics::Opticschemistry.chemical_elementNanoparticleGermaniumCathodoluminescenceNanotechnology02 engineering and technologyChemical vapor deposition010402 general chemistry021001 nanoscience & nanotechnology01 natural sciences0104 chemical sciencesElectronic Optical and Magnetic MaterialsNanomaterialschemistryChemical engineeringnanoparticles point defects doped silica0210 nano-technology
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The role of impurities in the irradiation induced densification of amorphous SiO(2).

2011

In a recent work (Buscarino et al 2009 Phys. Rev. B 80 094202), by studying the properties of the (29)Si hyperfine structure of the E'(γ) point defect, we have proposed a model able to describe quantitatively the densification process taking place upon electron irradiation in amorphous SiO(2) (a-SiO(2)). In particular, we have shown that it proceeds heterogeneously, through the nucleation of confined densified regions statistically dispersed into the whole volume of the material. In the present experimental investigation, by using a similar approach on a wider set of materials, we explore how this process is influenced by impurities, such as OH and Cl, typically involved in relevant concent…

Materials scienceNucleationCondensed Matter PhysicsCrystallographic defectAmorphous solidlaw.inventionChemical engineeringImpuritylawamorphous silicon dioxide sio2 irradiation effects electron irradiation point defects electron paramagnetic resonance densityElectron beam processingGeneral Materials ScienceIrradiationElectron paramagnetic resonanceHyperfine structureJournal of physics. Condensed matter : an Institute of Physics journal
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Photoluminescence of Point Defects in Silicon Dioxide by Femtosecond Laser Exposure

2021

The nature of the radiation-induced point defects in amorphous silica is investigated through online photoluminescence (PL) under high intensity ultrashort laser pulses. Using 1030 nm femtosecond laser pulses with a repetition rate of 1 kHz, it is possible to study the induced color centers through their PL signatures monitored during the laser exposure. Their generation is driven by the nonlinear absorption of the light related to the high pulse peak powers provided by femtosecond laser, allowing to probe the optical properties of the laser exposed region. The experiment is conducted as a function of the laser pulse power in samples with different OH contents. The results highlight the dif…

Materials sciencePhotoluminescenceamorphous silicastructural modificationsSilicon dioxide02 engineering and technology01 natural scienceschemistry.chemical_compoundonline photoluminescence0103 physical sciencesMaterials Chemistrypoint defectsElectrical and Electronic Engineering010306 general physicsfemtosecond lasersComputingMilieux_MISCELLANEOUS[PHYS]Physics [physics]business.industrySettore FIS/01 - Fisica SperimentaleSurfaces and Interfaces021001 nanoscience & nanotechnologyCondensed Matter PhysicsCrystallographic defectSurfaces Coatings and FilmsElectronic Optical and Magnetic MaterialschemistryFemtosecondOptoelectronicsLaser exposureAmorphous silica0210 nano-technologybusiness
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Evaluation of the Performance of Published Point Defect Parameter Sets in Cone and Body Phase of a 300 mm Czochralski Silicon Crystal

2021

Prediction and adjustment of point defect (vacancies and self-interstitials) distribution in silicon crystals is of utmost importance for microelectronic applications. The simulation of growth processes is widely applied for process development and quite a few different sets of point defect parameters have been proposed. In this paper the transient temperature, thermal stress and point defect distributions are simulated for 300 mm Czochralski growth of the whole crystal including cone and cylindrical growth phases. Simulations with 12 different published point defect parameter sets are compared to the experimentally measured interstitial–vacancy boundary. The results are evaluated for stand…

Materials scienceSiliconGeneral Chemical EngineeringPhase (waves)chemistry.chemical_element02 engineering and technology01 natural sciencesInorganic ChemistryCrystalMonocrystalline silicon0103 physical sciencesheat transfercomputer simulationpoint defectsGeneral Materials SciencePoint (geometry)010302 applied physicsEquilibrium pointCrystallographyCzochralskisilicon021001 nanoscience & nanotechnologyCondensed Matter PhysicsCrystallographic defectthermal stressComputational physicschemistryQD901-999Heat transfer0210 nano-technologyCrystals
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Luminescence of silicon Dioxide — silica glass, α-quartz and stishovite

2011

Abstract This paper compares the luminescence of different modifications of silicon dioxide — silica glass, α-quartz crystal and dense octahedron structured stishovite crystal. Under x-ray irradiation of pure silica glass and pure α-quartz crystal, only the luminescence of self-trapped exciton (STE) is detected, excitable only in the range of intrinsic absorption. No STE luminescence was detected in stishovite since, even though its luminescence is excitable below the optical gap, it could not be ascribed to a self-trapped exciton. Under ArF laser excitation of pure α-quartz crystal, luminescence of a self-trapped exciton was detected under two-photon excitation. In silica glass and stishov…

Materials scienceSiliconSilicon dioxideExcitonPhysicsQC1-999Analytical chemistryGeneral Physics and Astronomychemistry.chemical_elementCrystal growthCrystallographic defectquartzstishovitechemistry.chemical_compoundsilica glasschemistryluminescencepoint defectsLuminescenceQuartzStishoviteOpen Physics
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Steady-State X-Ray Radiation-Induced Attenuation in Canonical Optical Fibers

2020

The so-called canonical optical fibers (OFs) are samples especially designed to highlight the impact of some manufacturing process parameters on the radiation responses. Thanks to the results obtained on these samples, it is thus possible to define new procedures to better control the behaviors of OFs in radiation environments. In this article, we characterized the responses, under steady-state X-rays, of canonical samples representative of the most common fiber types differing by their core-dopants: pure silica, Ge, Al, and P. Their radiation-induced attenuation (RIA) spectra were measured online at both room temperature (RT) and liquid nitrogen temperature (LNT), in the energy range [~0.6…

Nuclear and High Energy PhysicsOptical fiberMaterials scienceDoped optical fibers)Analytical chemistryRadiation01 natural sciencesSpectral linelaw.inventionlaw0103 physical sciencespoint defectsFiberIrradiationElectrical and Electronic EngineeringAbsorption (electromagnetic radiation)ComputingMilieux_MISCELLANEOUSpure silica core[PHYS.PHYS.PHYS-OPTICS]Physics [physics]/Physics [physics]/Optics [physics.optics]010308 nuclear & particles physicsAttenuationSettore FIS/01 - Fisica SperimentaleX-rayAttenuationNuclear Energy and Engineeringradiation effects
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Radiation effects on silica-based preforms and optical fibers-I: Experimental study with canonical samples

2008

International audience; Prototype samples of preforms and associated fibers have been designed and fabricated through MCVD process to investigate the role of fluorine (F) and germanium (Ge) doping elements on the radiation sensitivity of silica-based glasses. We characterized the behaviors of these canonical samples before, during and after 10 keV X-ray irradiation through several spectroscopic techniques, to obtain global information (in situ absorption measurements, electron paramagnetic resonance) or spatially-resolved information (confocal microscopy, absorption and luminescence on preform). These tests showed that, for the Ge-doped fiber and in the 300–900 nm range, the radiation-induc…

Nuclear and High Energy PhysicsOptical fiberMaterials scienceoptical fibersAnalytical chemistrychemistry.chemical_elementGermanium02 engineering and technologyconfocal microscopy01 natural sciencesSpectral linelaw.inventionAbsorptionX-rays.law0103 physical sciencesX-raysluminescencepoint defectsIrradiationFiberElectrical and Electronic EngineeringAbsorption (electromagnetic radiation)010302 applied physics[PHYS.PHYS.PHYS-OPTICS]Physics [physics]/Physics [physics]/Optics [physics.optics]021001 nanoscience & nanotechnologyCrystallographic defectOptical fiber photosensitivity absorption luminescenceNuclear Energy and EngineeringchemistryEPR0210 nano-technologyLuminescence
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Transient and Steady-State Radiation Response of Phosphosilicate Optical Fibers: Influence of H2 Loading

2019

The radiation response of a phosphorus-doped multimode optical fiber is investigated under both transient (pulsed X-rays) and steady-state ( $\gamma $ - and X-rays) irradiations. The influence of a H2 preloading on the fiber radiation-induced attenuation (RIA) in the 300–2000-nm wavelength range has been characterized. To better understand the impact of this treatment, online behaviors of fiber samples containing different amounts of gas are compared from glass saturation (100%) to less than 1%. In addition to these in situ experiments, additional postirradiation spectroscopic techniques have been performed such as electron paramagnetic resonance or luminescence measurements to identify the…

Nuclear and High Energy PhysicsOptical fiberMaterials scienceoptical fibersHydrogenAnalytical chemistrychemistry.chemical_element01 natural scienceslaw.invention[SPI]Engineering Sciences [physics]law0103 physical sciencesX-rayspoint defectsElectrical and Electronic Engineeringphosphoruspulsed X-raysSaturation (magnetic)ComputingMilieux_MISCELLANEOUS[PHYS.PHYS.PHYS-OPTICS]Physics [physics]/Physics [physics]/Optics [physics.optics]Multi-mode optical fiber010308 nuclear & particles physicsAttenuationtemperatureLiquid nitrogenCrystallographic defectNuclear Energy and Engineeringchemistryradiation effectsH2 loadingLuminescence
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