Search results for "Probe"
showing 10 items of 534 documents
Scanning Probe Microscopy Study of the Metal-Rich Layered Chalcogenides TaM2Te2 (M = Co, Ni)
1998
The compounds TaNi2Te2 and TaCo2Te2 have been examined by scanning tunneling and atomic force microscopy. The title phases crystallize in layered structures with metal slabs sandwiched by tellurium atoms. Scanning probe microscope images of the surfaces of these materials arise from the surface tellurium atoms anddepending on the experimental conditionscan show very different features. The images have been simulated through surface charge densities calculated within the Extended Huckel and LMTO frameworks.
Dopant radial inhomogeneity in Mg-doped GaN nanowires
2018
International audience; Using atom probe tomography, it is demonstrated that Mg doping of GaN nanowires grown by Molecular Beam Epitaxy results in a marked radial inhomogeneity, namely a higher Mg content in the periphery of the nanowires. This spatial inhomogeneity is attributed to a preferential incorporation of Mg through the m-plane sidewalls of nanowires and is related to the formation of a Mg-rich surface which is stabilized by hydrogen. This is further supported by Raman spectroscopy experiments which give evidence of Mg-H complexes in the doped nanowires. A Mg doping mechanism such as this, specific to nanowires, may lead to higher levels of Mg doping than in layers, boosting the po…
How the formation of interfacial charge causes hysteresis in perovskite solar cells
2018
In this study, we discuss the underlying mechanism of the current-voltage hysteresis in a hybrid lead-halide perovskite solar cell. We have developed a method based on Kelvin probe force microscopy that enables mapping charge redistribution in an operating device upon a voltage- or light pulse with sub-millisecond resolution. We observed the formation of a localized interfacial charge at the anode interface, which screened most of the electric field in the cell. The formation of this charge happened within 10 ms after applying a forward voltage to the device. After switching off the forward voltage, however, these interfacial charges were stable for over 500 ms and created a reverse electri…
Scanning probe microscopy of pine and birch kraft pulp fibres
2000
Abstract Fibres of the conventional pine and birch kraft pulps were characterized by scanning probe microscopy (SPM). The surface characteristics of these pulps taken at the early stages of pulping were compared with those from later stages of pulping (with or without subsequent oxygen/alkali delignification). It was observed that during delignification a granular surface structure was replaced by a fibrillar surface containing various disruptions. The granular and fibrillar regions were particularly well resolved by using phase imaging in tapping mode of SPM. It was concluded that the granular structure corresponded to surface lignin since the decrease in the relative amount of the granula…
Fluoride-induced precipitates on enamel surface and subsurface areas visualised by electron microscopy and confocal laser scanning microscopy
1997
The present study examined the enamel surface after in vitro topical treatments with a neutral 2% NaF solution. For minimising the risk of artefacts, samples were inspected without pre-treatment as fresh, naturally wet specimens by complementary techniques: variable pressure electron microscopy (VP-SEM) and confocal laser scanning microscopy (CLSM). VP-SEM provided information on the surface morphology, whereas CLSM allowed non-destructive visualisation of subsurface areas. Neutral NaF solutions induced globular precipitates on the enamel surfaces. If the globules formed may be described as "calcium fluoride like material", the additional information of this experiment is that, after intera…
<title>Metallic and semiconducting nanowires: properties and architectures</title>
2003
Nanowires are expected to play an important role in future electronic, optical devices and nanoelectromechanical devices. Measuring the electrical and mechanical properties of nanowires is however a difficult task due to their small dimensions. Here we report the use of an in-situ microscopy technique, which combines transmission electron microscopy (TEM) with scanning probe microscopy (SPM), to investigate the electrical and mechanical properties of metallic and semiconductor nanowires. Additionally, in this paper we describe a novel approach for synthesizing mesoporous silicas with tunable pore diameters, wall thickness and pore spacings that can be used as tempates for the assembly of se…
Quantitative analysis of localized surface plasmons based on molecular probing
2010
International audience; We report on the quantitative characterization of the plasmonic optical near-field of a single silver nanoparticle. Our approach relies on nanoscale molecular molding of the confined electromagnetic field by photoactivated molecules. We were able to directly image the dipolar profile of the near-field distribution with a resolution better than 10 nm and to quantify the near-field depth and its enhancement factor. A single nanoparticle spectral signature was also assessed. This quantitative characterization constitutes a prerequisite for developing nanophotonic applications.
Smart High-κ Nanodielectrics Using Solid Supported Polyoxometalate-Rich Nanostructures
2011
Utilizing Langmuir-Blodgett deposition and scanning probe microscopy, we have investigated the extent to which cations alter the self-assembly processes of hybrid polyoxometalates (POMs) on surfaces. The well-defined 2D hexagonal nanostructures obtained were extensively characterized and their properties were studied, and this has revealed fascinating dielectric behavior and reversible capacitive properties. The nanostructures are extremely stable under ambient conditions, and yet exhibit fascinating self-patterning upon heating. These findings present POMs as effective smart nanodielectrics and open up a new field for future POM applications. (c) 2011 American Chemical Society.
Near-field study with a photon scanning tunneling microscope: Comparison between dielectric nanostructure and metallic nanostructure
2007
Abstract Scanning near-field optical microscopy (SNOM) integrates standard optical methods with scanning probe microscopy (SPM) techniques allowing to collect optical information with resolution well beyond the diffraction limit. We study the influence on image formation of several parameters in scanning near-field microscopy. The numerical calculations have been carried out using the differential method. We investigate a 2D-PSTM configuration with a dielectric rectangular object. We will focus on the collection type SNOM in a constant height scanning mode. Various oscillation patterns are observed from both sides of the nanostructure, which we interpret as interference between the diffract…
Conical Fiber Probe for Mechanical Stabilization of Microbubbles in Liquids
2020
We demonstrate that a cone pierced in a fiber tip can stabilize microbubles photothermally generated in liquids. Bubbles can stand and monitor pressure shocks over 3.3 bar with a sensitivity below 7 mbar.