Search results for "Reflection"
showing 10 items of 645 documents
Diffraction by fractal metallic supergratings.
2007
The reflectance of corrugated surfaces with a fractal distribution of grooves is investigated. Triadic and polyadic Cantor fractal distributions are considered, and the reflected intensity is compared with that of the corresponding periodic structure. The self-similarity property of the response is analyzed when varying the depth of the grooves and the lacunarity parameter. The results confirm that the response is self-similar for the whole range of depths considered, and this property is also maintained for all values of the lacunarity parameter. © 2007 Optical Society of America. Fil: Skigin, Diana Carina. Consejo Nacional de Investigaciones Científicas y Técnicas. Oficina de Coordinación…
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2008
We have performed the investigation of dot matrix holographic recording in amorphous As2S3 chalcogenide films with different thickness on Al coated glass substrates. The control over the interference minimum of reflection during the evaporation process allowed obtaining As2S3-Al system with a minimum value of initial reflection in defined spectral region. The investigation of dependence of diffraction efficiency of holographic recording on both film thickness and initial conditions of reflectivity in the system was performed. The main advantage of this type of system is the possibility to increase optical sensitivity of material in predefined spectrum region for phase hologram recording.© (…
Enhanced diffraction of light in GaAs microcavities
1995
We theoretically analyze the diffraction of light by gratings that are photogenerated in Fabry–Perot microcavities. The coupled-wave theory of volume gratings is combined with appropriate boundary conditions to yield expressions for the diffraction efficiency. Multiple round trips within the cavity are seen to increase the effective grating thickness and therefore the efficiency. Numerical calculations specific to GaAs microcavities show that the diffraction efficiency can be enhanced by more than 2 orders of magnitude at the resonant wavelengths.
Electron diffraction, X-ray powder diffraction and pair-distribution-function analyses to determine the crystal structures of Pigment Yellow 213, C23…
2009
The crystal structure of the nanocrystalline alpha phase of Pigment Yellow 213 (P.Y. 213) was solved by a combination of single-crystal electron diffraction and X-ray powder diffraction, despite the poor crystallinity of the material. The molecules form an efficient dense packing, which explains the observed insolubility and weather fastness of the pigment. The pair-distribution function (PDF) of the alpha phase is consistent with the determined crystal structure. The beta phase of P.Y. 213 shows even lower crystal quality, so extracting any structural information directly from the diffraction data is not possible. PDF analysis indicates the beta phase to have a columnar structure with a si…
Cooperative atomic motion probed by ultrafast transmission electron diffraction
2015
In numerous solids exhibiting broken symmetry ground states, changes in electronic (spin) structure are accompanied by structural changes. Femtosecond time-resolved techniques recently contributed many important insights into the origin of their ground states by tracking dynamics of the electronic subsystem with femtosecond light pulses. Moreover, several studies of structural dynamics in systems with periodic lattice modulation (PLD) were performed. Since intensities of the super-lattice diffraction peaks are in the first approximation proportional to the square of the PLD amplitude, their temporal dynamics provides access to cooperative atomic motion. This process takes place on a fractio…
Phonon-induced optical superlattice
2005
We demonstrate the formation of a dynamic optical superlattice through the modulation of a semiconductor microcavity by stimulated acoustic phonons. The high coherent phonon population produces a folded optical dispersion relation with well-defined energy gaps and renormalized energy levels, which are accessed using reflection and diffraction experiments.
Imaging spin filter for electrons based on specular reflection from iridium (001)
2013
Abstract As Stern–Gerlach type spin filters do not work with electrons, spin analysis of electron beams is accomplished by spin-dependent scattering processes based on spin–orbit or exchange interaction. Existing polarimeters are single-channel devices characterized by an inherently low figure of merit (FoM) of typically 10 −4 –10 −3 . This single-channel approach is not compatible with parallel imaging microscopes and also not with modern electron spectrometers that acquire a certain energy and angular interval simultaneously. We present a novel type of polarimeter that can transport a full image by making use of k -parallel conservation in low-energy electron diffraction. We studied specul…
Excitation of a one-dimensional evanescent wave by conical edge diffraction of surface plasmon
2011
International audience; The experimental observation of a one-dimensional evanescent wave supported by a 90◦ metal edge is reported. Through a measurement of in-plane momenta, we clearly demonstrate the dimensional character of this surface wave and show that it is non-radiative in the superstrate. Excitation conditions, lateral extension and polarization properties of this wave are discussed. Finally, we explore the effect of the surrounding dielectric medium and demonstrate that a single edge can sustain distinct excitations.
The role of electron diffraction in zeolite structure determination
2006
Because electron diffraction can sample individual microcrystals, it is clear that this single crystal method can facilitate, in at least two ways, structure determination for inorganic materials, such as zeolites, that are preferentially microcrystalline. First, in a qualitative application, three-dimensional tilts of individual small crystals, to map the reciprocal lattice, greatly facilitates unit cell and space group determination when powder diffraction indexing programs fail. If incoherent multiple scattering leads to violation of systematic absences, these absences can be restored by collection of precession diffraction patterns based on the Vincent-Midgley method [1], as demonstrate…
Automated electron diffraction tomography - a new tool for nano crystal structure analysis
2011
Automated electron Diffraction Tomography (ADT) comprises an upcoming method for “ab intio” structure analysis of nano crystals. ADT allows fine sampling of the reciprocal space by sequential collection of electron diffraction patterns while tilting a nano crystal in fixed tilt steps around an arbitrary axis. Electron diffraction is collected in nano diffraction mode (NED) with a semi-parallel beam with a diameter down to 50 nm. For crystal tracking micro-probe STEM imaging is used. Full automation of the acquisition procedure allowed optimisation of the electron dose distribution and therefore analysis of highly beam sensitive samples. Cell parameters, space group and reflection intensitie…