Search results for "SCOPE"

showing 10 items of 2420 documents

On the Returns to Invention within Firms: Evidence from Finland

2018

International audience; In this paper we merge individual income data, firm-level data, patenting data, and IQ data in Finland over the period 1988–2012 to analyze the returns to invention for inventors and their coworkers or stakeholders within the same firm. We find that: (i) inventors collect only 8 percent of the total private return from invention; (ii) entrepreneurs get over 44 percent of the total gains; (iii) bluecollar workers get about 26 percent of the gains and the rest goes to white-collar workers. Moreover, entrepreneurs start with significant negative returns prior to the patent application, but their returns subsequently become highly positive.

JEL: O - Economic Development Innovation Technological Change and Growth/O.O3 - Innovation • Research and Development • Technological Change • Intellectual Property Rights/O.O3.O34 - Intellectual Property and Intellectual CapitalINNOVATIONPatent applicationvoitotJEL: L - Industrial Organization/L.L2 - Firm Objectives Organization and Behavior/L.L2.L25 - Firm Performance: Size Diversification and Scope0502 economics and business050602 political science & public administrationdistribution of profits050207 economicsJEL: D - Microeconomics/D.D2 - Production and Organizationsta511keksinnötinventions05 social sciencesprofitsvoitot (talous)General MedicineIndividual incomeJEL: G - Financial Economics/G.G3 - Corporate Finance and Governance/G.G3.G32 - Financing Policy • Financial Risk and Risk Management • Capital and Ownership Structure • Value of Firms • Goodwill[SHS.ECO]Humanities and Social Sciences/Economics and Financeyritykset0506 political science8. Economic growthJEL: L - Industrial Organization/L.L2 - Firm Objectives Organization and Behavior/L.L2.L26 - EntrepreneurshipDemographic economicsBusinessJEL: O - Economic Development Innovation Technological Change and Growth/O.O3 - Innovation • Research and Development • Technological Change • Intellectual Property Rights/O.O3.O31 - Innovation and Invention: Processes and IncentivesenterprisesMerge (version control)voitonjako
researchProduct

The Myth of French Influence Over Spanish Codification: The General Part of the Criminal Codes of 1822 and 1848

2018

The chapter aims to explore the scope of the foreign influences, that of the French in particular, in the criminal codes of 1822 and 1848/50. In doing so, the author departs from the views of some 19th century criminal lawyers who, like J. F. Pacheco, stated that in the old criminal laws “nothing was worthy of respect, or conservation” and “there was only one legitimate and viable system, the system of codification, the system of absolute change,” and recognizing that drafters were fully acquainted with the case of France, a jurisdiction that managed to turn its old laws—including the criminal ones—into modern codes (1804–1811). The author briefly presents the status quaestionis of the dich…

JurisdictionScope (project management)NothingPolitical scienceLawCriminal lawAbsolute ChangeMythology
researchProduct

Deep sea tests of a prototype of the KM3NeT digital optical module

2014

SIRE(opens in a new window)|View at Publisher| Export | Download | Add to List | More... European Physical Journal C Volume 74, Issue 9, 1 September 2014, 8p Deep sea tests of a prototype of the KM3NeT digital optical module: KM3NeT Collaboration (Article) Adrián-Martínez, S.a, Ageron, M.b, Aharonian, F.c, Aiello, S.d, Albert, A.e, Ameli, F.f, Anassontzis, E.G.g, Anghinolfi, M.h, Anton, G.i, Anvar, S.j, Ardid, M.a, de Asmundis, R.k, Balasi, K.l, Band, H.m, Barbarino, G.kn, Barbarito, E.o, Barbato, F.kn, Baret, B.p, Baron, S.p, Belias, A.lq, Berbee, E.m, van den Berg, A.M.r, Berkien, A.m, Bertin, V.b, Beurthey, S.b, van Beveren, V.m, Beverini, N.st, Biagi, S.uv, Bianucci, S.t, Billault, M.b,…

KM3NeT; digital optical modulePhysics - Instrumentation and Detectors[PHYS.ASTR.IM]Physics [physics]/Astrophysics [astro-ph]/Instrumentation and Methods for Astrophysic [astro-ph.IM]Physics and Astronomy (miscellaneous)TELESCOPEPhysics::Instrumentation and Detectorsdigital optical moduleFOS: Physical sciencesNeutrino Telescopesneutrino astrophysics; Cherenkov detector; Neutrino TelescopesKM3NeT; Cherenkov; UnderwaterDESIGNCherenkov[PHYS.PHYS.PHYS-INS-DET]Physics [physics]/Physics [physics]/Instrumentation and Detectors [physics.ins-det]Instrumentation and Methods for Astrophysics (astro-ph.IM)KM3NeTEngineering (miscellaneous)Astrophysics::Instrumentation and Methods for Astrophysicsneutrino telescopeDATA-ACQUISITIONInstrumentation and Detectors (physics.ins-det)READOUTneutrino astrophysics[SDU.ASTR.IM]Sciences of the Universe [physics]/Astrophysics [astro-ph]/Instrumentation and Methods for Astrophysic [astro-ph.IM]NEUTRINOSUnderwaterAstrophysics - Instrumentation and Methods for AstrophysicsSYSTEMCherenkov detector
researchProduct

Measuring electrostatic double-layer forces on HOPG at high surface potentials

1999

Abstract The aim of this study was to investigate surface forces in aqueous electrolyte solutions between surfaces with high electric potentials. Therefore the force between a surface of highly oriented pyrolytic graphite (HOPG) and a silicon nitride tip of an atomic force microscope was measured. Various electric potentials by a counter electrode were applied to the HOPG, which served as working electrode. As predicted by the Poisson–Boltzmann theory the electrostatic double-layer force changed only in a narrow potential range of ≈300 mV. At high negative sample potentials, where the negatively charged tip was repelled from the sample, the force saturated. At positive potentials an attract…

Kelvin probe force microscopeAuxiliary electrodeColloid and Surface ChemistryMaterials scienceWorking electrodeHighly oriented pyrolytic graphiteChemical physicsElectrostatic force microscopeSurface forceDLVO theoryAtomic physicsDouble layer forcesColloids and Surfaces A: Physicochemical and Engineering Aspects
researchProduct

Force interactions and adhesion of gold contacts using a combined atomic force microscope and transmission electron microscope

2002

Force interactions and adhesion of gold contacts using a combined atomic force microscope and transmission electron microscope

Kelvin probe force microscopeChemistryAtomic force microscopyGeneral Physics and AstronomyNanotechnologySurfaces and InterfacesGeneral ChemistryAdhesionConductive atomic force microscopyCondensed Matter PhysicsQuantitative Biology::Cell BehaviorSurfaces Coatings and Filmssymbols.namesakeTransmission electron microscopysymbolsMagnetic force microscopevan der Waals forceApplied Surface Science
researchProduct

Self-assembly of Organic Molecules on Insulating Surfaces

2015

Molecular self-assembly is known to provide a powerful tool for creating functional structures, with the ultimate structure and functionality encoded in the molecular building blocks. Upon molecule deposition onto surfaces, functional structures have been created ranging from defect-free, highly symmetric two-dimensional layers to complex assemblies with dedicated functionality. Especially organic molecules play a key role for molecular self-assembly due to their impressive structural flexibility and the high degree of control by chemical synthesis. Furthermore, the surface itself provides another exciting dimension: adjusting the subtle balance between intermolecular and molecule-surface i…

Kelvin probe force microscopeFlexibility (engineering)Materials scienceIntermolecular forceMoleculeNanotechnologySelf-assemblySubstrate (electronics)Electronic structureSurface energy
researchProduct

Correlative atomic force and confocal fluorescence microscopy: single molecule imaging and force induced spectral shifts (Conference Presentation)

2016

A grand challenge in nanoscience is to correlate structure or morphology of individual nano-sized objects with their photo-physical properties. An early example have been measurements of the emission spectra and polarization of single semiconductor quantum dots as well as their crystallographic structure by a combination of confocal fluorescence microscopy and transmission electron microscopy.[1] Recently, the simultaneous use of confocal fluorescence and atomic force microscopy (AFM) has allowed for correlating the morphology/conformation of individual nanoparticle oligomers or molecules with their photo-physics.[2, 3] In particular, we have employed the tip of an AFM cantilever to apply c…

Kelvin probe force microscopeFluorescence-lifetime imaging microscopyMaterials sciencetechnology industry and agricultureNanotechnologySingle Molecule ImagingMolecular physicsFluorescence spectroscopylaw.inventionQuantum dotConfocal microscopylawMicroscopyPhotoconductive atomic force microscopyNanoimaging and Nanospectroscopy IV
researchProduct

Sensor response time evaluations of trace hydrogen gaseous species with platinum using Kelvin Probe

2012

Kelvin Probe (KP), a non-contact, non-destructive vibrating capacitor device, was used to measure the work function (WF) difference of thin Pt films, deposited on oxidized silicon substrates, with highly diluted H 2 gas, in ppm levels, in the presence of with and without relative humidity (RH). Response times were extracted from the behavior of WF shift as a function of H 2 concentration values. Measurements were compared for zero and non-zero RH conditions at a fixed temperature of 30°C. Changes in WF were evaluated by using HP VEE program, suitably modified for the present measurements. The events were executed step by step for every second time interval through an input formatted file. T…

Kelvin probe force microscopeHydrogenChemistryAnalytical chemistrychemistry.chemical_elementHumidityResponse timeWork functionRelative humiditySaturation (chemistry)Platinum2012 IEEE Sensors
researchProduct

Micro-Raman characterization of graphene grown on SiC(000-1)

2014

Graphene (Gr) was grown on the C face of 4H-SiC under optimized conditions (high annealing temperatures ranging from 1850 to 1950°C in Ar ambient at 900 mbar) in order to achieve few layers of Gr coverage. Several microscopy techniques, including optical microscopy (OM), ?Raman spectroscopy, atomic force microscopy (AFM) and atomic resolution scanning transmission electron microscopy (STEM) have been used to extensively characterize the lateral uniformity of the as-grown layers at different temperatures. ?Raman analysis provided information on the variation of the number of layers, of the stacking-type, doping and strain.

Kelvin probe force microscopeMaterials science4H-SiCGrapheneSettore FIS/01 - Fisica SperimentaleAnalytical chemistryConductive atomic force microscopySTEMlaw.inventionAtomic layer depositionOptical microscopelawMicroscopyScanning transmission electron microscopyμRamanMechanics of MaterialMaterials Science (all)AFMGraphene?RamanInstrumentationPhotoconductive atomic force microscopy
researchProduct

Unraveling the LiNbO3 X-cut surface by atomic force microscopy and density functional theory

2014

The ${\text{LiNbO}}_{3}$(2$\overline{1}\overline{1}0$) surface, commonly referred to as X-cut, is investigated by means of atomic force microscopy and first-principles calculations. Atomically resolved atomic force microscopy images show geometrical patterns not compatible with truncated bulk terminations. Fast Fourier transformation of the real-space images shows an oblique surface unit cell with lattice parameters of $a=0.75\ifmmode\pm\else\textpm\fi{}0.02$ nm, $b=0.54\ifmmode\pm\else\textpm\fi{}0.02$ nm, and $\ensuremath{\alpha}=94.{8}^{\ensuremath{\circ}}$. Comparing these experimental results with the theoretical models of stable surface terminations provides clear evidence for the for…

Kelvin probe force microscopeMaterials scienceAtomic force microscopyLattice (order)Fast Fourier transformOxygen ionsTheoretical modelsDensity functional theoryAtomic physicsCondensed Matter PhysicsElementary charge530Electronic Optical and Magnetic Materials
researchProduct