Search results for "SELC"

showing 3 items of 3 documents

Diastereoselective synthesis of substituted 2-phenyltetrahydropyrans as useful precursors of aryl C-glycosides via selenoetherification

2004

The cyclization of several substituted 5-phenyl-pent-4-en-1-ols with selenium electrophiles along some mechanistic considerations is discussed. In particular, an efficient diastereoselective synthesis of a 2,3,5,6-tetrasubstitued tetrahydropyran is reported. These findings open an interesting approach: the use of chiral selenium electrophiles for cyclization of chiral substrates. The cyclized products are useful starting material for the synthesis of D- or L-aryl C-glycosides.

PharmacologyC glycosidesdiastereoselctive synthesis selenoetherificationArylOrganic Chemistrychemistry.chemical_elementTetrahydropyranSettore CHIM/06 - Chimica OrganicaAnalytical Chemistrychemistry.chemical_compoundchemistryaryl C-glycosidesElectrophileOrganic chemistrySelenium
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Heavy-Ion Microbeam Studies of Single-Event Leakage Current Mechanism in SiC VD-MOSFETs

2020

Heavy-ion microbeams are employed for probing the radiation-sensitive regions in commercial silicon carbide (SiC) vertical double-diffused power (VD)-MOSFETs with micrometer accuracy. By scanning the beam spot over the die, a spatial periodicity was observed in the leakage current degradation, reflecting the striped structure of the power MOSFET investigated. Two different mechanisms were observed for degradation. At low drain bias (gate and source grounded), only the gate-oxide (at the JFET or neck region) is contributing in the ion-induced leakage current. For exposures at drain–source bias voltages higher than a specific threshold, additional higher drain leakage current is observed in t…

Nuclear and High Energy PhysicsMaterials sciencemicrobeamsilicon carbide (SiC) vertical double-diffused power(VD)-MOSFETleakage current degradation01 natural sciencesDie (integrated circuit)chemistry.chemical_compoundpuolijohteet0103 physical sciencesMOSFETSilicon carbideNuclear Physics - ExperimentPower semiconductor deviceElectrical and Electronic EngineeringPower MOSFETsingle-event effect (SEE)010308 nuclear & particles physicsbusiness.industryionisoiva säteilyHeavy ion; leakage current degradation; microbeam; silicon carbide (SiC) vertical double-diffused power(VD)-MOSFET; single-event effect (SEE); single-event leakage current (SELC)JFETSELCMicrobeamSiC VD-MOSFET620single event effectsäteilyfysiikkaNuclear Energy and Engineeringchemistryheavy-ionOptoelectronicsddc:620Heavy ionbusinesssingle-event leakage current (SELC)Voltage
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Lavtemperatur brenselceller

2005

Dokumentet er en del av en eksamensoppgave i MEF4200 Energimaterialer ved UiO høsten 2004. Som del av eksamen i emnet MEF4200 Energimaterialer ved Universitetet i Oslo (UiO) høsten 2004 var oppgaven å skrive en populærvitenskapelig artikkel for avgangselever i videregående skole. Artikkelen presenteres her og omhandler lavtemperatur brenselceller. De brenselcelletypene som beskrives er alkaliske brenselceller, PEM-brenselceller og metanolbrenselceller, alle med en driftstemperatur på normalt under 100 °C, og deres bruksområder.

AFCAlkaliske brenselcellerPEM-brenselcellerPEMFCMetanolbrenselcellerDMFCVDP::Matematikk og naturvitenskap: 400
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