Search results for "Sapphire"

showing 10 items of 114 documents

Ab initio simulations on charged interstitial oxygen migration in corundum

2018

We have performed this work within the framework of the EUROfusion Consortium receiving funding from the European grant agreement 633053. The views and opinions expressed herein do not necessarily reflect those of the European Commission. Authors thank R. Vila, A.I. Popov, A. Luchshik and R.A. Evarestov for fruitful discussions. To carry out large-scale calculations, we have used the HPC supercomputer at Stuttgart University (Germany)

Nuclear and High Energy PhysicsMaterials scienceAb initiochemistry.chemical_elementCorundum02 engineering and technologyengineering.material01 natural sciences7. Clean energyMolecular physicsOxygenIonCondensed Matter::Materials ScienceHybrid DFT-LCAO calculationsCondensed Matter::Superconductivity0103 physical sciences:NATURAL SCIENCES:Physics [Research Subject Categories]010306 general physicsInstrumentationα-Al2O3(corundum sapphire)Charged oxygen interstitial diffusion021001 nanoscience & nanotechnologychemistryLinear combination of atomic orbitalsengineeringSapphireDensity functional theory0210 nano-technologyNuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms
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Performance of Dye and Ti:sapphire laser systems for laser ionization and spectroscopy studies at S3

2020

The novel and sensitive In-Gas Laser Ionization Spectroscopy (IGLIS) technique enables high-precision laser spectroscopy of the heaviest elements and isotopes very far from stability that are produced in fusion-evaporation reactions at in-flight separators. Powerful and dedicated laser systems are required in these facilities to realize in-gas jet laser spectroscopy with optimal spectral resolution and efficiency. The performance with respect to the requirements for IGLIS studies at the low energy front-end of the Super Separator Spectrometer (S3) at GANIL, France, of Dye and Ti:sapphire laser systems is investigated. In addition, a number of specific experimental cases on key isotopes of t…

Nuclear and High Energy PhysicsMaterials scienceIn flight separatorsPhysics::Optics[PHYS.NEXP]Physics [physics]/Nuclear Experiment [nucl-ex]Dye laser7. Clean energy01 natural sciencesResonance ionization spectroscopylaw.inventionlawIonizationIn gas laser ionization and spectroscopy0103 physical sciencessapphire laser [Ti]ddc:530Physics::Atomic PhysicsSpectral resolutionNuclear Experiment010306 general physicsSpectroscopyInstrumentationDye laserSpectrometer010308 nuclear & particles physicsbusiness.industryTi:sapphire laserLaserSapphireOptoelectronicsbusinessNuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms
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Modelling of point defects in α-AL2O3

1995

Abstract The semiempirical method of the Intermediate Neglect of Differential Overlap (INDO), in the program SYMSYM, has been used for calculations on perfect and imperfect corundum crystals. For the perfect crystal the periodical Large Unit Cell (LUC) model was used while the Molecular Cluster (MC) model was used in defect calculations. By means of the MC model, we have investigated the optical properties of electronic centers (F+, F, F−, FMg, F− Mg) in corundum. Calculated optical properties of these defects are compared with experimental values and new bands are predicted to exist in the absorption spectrum of Mg-doped corundum. The energy levels of F-type and Mg-impurity related centers…

Nuclear and High Energy PhysicsRadiationAbsorption spectroscopybusiness.industryChemistryExcitonCorundumengineering.materialCondensed Matter PhysicsAlkali metalMolecular physicsCrystallographic defectOpticsPerfect crystalPhysics::Atomic and Molecular ClustersengineeringSapphireGeneral Materials ScienceLuminescencebusinessRadiation Effects and Defects in Solids
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Radiation-induced electronic and ionic charge storage and release in sapphire

2002

Radiation-induced thermally stimulated relaxation (TSR) processes in the reduced α-Al 2 O 3 (sapphire) crystal were investigated at 290-650 K by means of the TS current (TSC), ionic depolarisation current (TSDC) and electron emission (TSEE) techniques. After thermal (ionic) polarisation of sapphire wide (∼75 K) and asymmetric ionic dipolar TSDC peak at T max 590 K (disorientation of the anion vacancy-related dipoles) was detected. This peak correlates with the wide TSEE peak at T max 615 K, the radiation-induced electrical degradation (RIED) yield rise above 550 K (T max 745 K) and the chromium emission line broadening ip ruby. Above 450-500 K the anion vacancy hopping (migration) starts. T…

Nuclear and High Energy PhysicsRadiationChemistryAnalytical chemistryIonic bondingCondensed Matter PhysicsIonDipoleImpurityElectric fieldVacancy defectSapphireGeneral Materials ScienceGrain boundaryRadiation Effects and Defects in Solids
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Spontaneous oxygen loading into SiO2 glass by thermal anneal

2004

The interstitial oxygen molecules (O 2 ) in SiO 2 glass were detected down to ∼10 15 cm -3 by photoluminescence of O 2 at 1272nm excited at 765nm by a continuous-wave titanium sapphire laser. It was evidenced that SiO 2 glass thermally annealed in air between 800 and 1100°C spontaneously absorbs ∼10 16 cm -3 of O 2 from the ambient atmosphere. The time-dependent concentration change of the interstitial O 2 allows the determination of both the diffusion coefficient and the solubility of the interstitial O 2 .

PhotoluminescenceAnnealing (metallurgy)Analytical chemistryTi:sapphire laserchemistry.chemical_elementMineralogyCondensed Matter PhysicsOxygenElectronic Optical and Magnetic MaterialschemistryTransition metalExcited stateMaterials ChemistryCeramics and CompositesSolubilityTitaniumJournal of Non-Crystalline Solids
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Optical properties of thin films of ZnO prepared by pulsed laser deposition

2004

In this paper we report on the structural features and optical properties of wurtzite ZnO films epitaxially grown on sapphire, fluorite and mica substrates by means of pulsed laser deposition (PLD). Post-deposition annealing results in a clear improvement of the film quality, reflected by the small width of the exciton-related lines in both the absorption and the photoluminescence spectra. Photoluminescence spectra revealed a multi-line structure which is identified in term of free excitons and excitons complexes with neutral donors and deep centers. The relative intensity of the PL lines mainly depends on the nature of the substrate used. Concerning optoelectronic applications it is especi…

PhotoluminescenceMaterials scienceAbsorption spectroscopyCondensed Matter::Otherbusiness.industryExcitonMetals and AlloysSurfaces and InterfacesCondensed Matter::Mesoscopic Systems and Quantum Hall EffectEpitaxySurfaces Coatings and FilmsElectronic Optical and Magnetic MaterialsPulsed laser depositionCondensed Matter::Materials ScienceOpticsMaterials ChemistrySapphireOptoelectronicsThin filmbusinessWurtzite crystal structureThin Solid Films
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Correlation between Zn vacancies and photoluminescence emission in ZnO films.

2006

Photoluminescence and positron annihilation spectroscopy have been used to characterize and identify vacancy-type defects produced in ZnO films grown on sapphire by metal-organic chemical-vapor deposition. The photoluminescence of the samples in the near band edge region has been studied, paying particular attention to the emission at 370.5 nm (3.346 eV). This emission has been correlated to the concentration of Zn vacancies in the films, which has been determined by positron annihilation spectroscopy. Jesus.Zuniga@uv.es Vicente.Munoz@uv.es

PhotoluminescenceMaterials scienceAstrophysics::High Energy Astrophysical PhenomenaEdge regionAnalytical chemistrySemiconductor thin filmsGeneral Physics and AstronomyPositron annihilation spectroscopyCondensed Matter::Materials Science:FÍSICA [UNESCO]Zinc compoundsMetalorganic vapour phase epitaxyDeposition (law)Positron annihilationCondensed matter physicsCondensed Matter::OtherPhysicsWide-bandgap semiconductorpositron annihilationUNESCO::FÍSICACacancies (crystal)II-VI semiconductorsWide band gap semiconductorsZn vacanciesMOCVDSapphireZnOphotoluminescenceZinc compounds ; II-VI semiconductors ; Wide band gap semiconductors ; Semiconductor thin films ; Positron annihilation ; Cacancies (crystal) ; MOCVD
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Optical characterization of Mg-doped GaN films grown by metalorganic chemical vapor phase deposition

2000

Scanning electron microscopy, micro-Raman, and photoluminescence (PL) measurements are reported for Mg-doped GaN films grown on (0001) sapphire substrates by low-pressure metalorganic chemical vapor phase deposition. The surface morphology, structural, and optical properties of GaN samples with Mg concentrations ranging from 1019 to 1021 cm−3 have been studied. In the scanning micrographs large triangular pyramids are observed, probably due to stacking fault formation and three-dimensional growth. The density and size of these structures increase with the amount of magnesium incorporated in the samples. In the photoluminescence spectra, intense lines were found at 3.36 and 3.31 eV on the tr…

PhotoluminescenceMaterials scienceIII-V semiconductorsScanning electron microscopeAnalytical chemistryGeneral Physics and AstronomySemiconductor thin filmsChemical vapor depositionStacking faultsSurface topographysymbols.namesake:FÍSICA [UNESCO]MagnesiumGallium compounds ; III-V semiconductors ; Wide band gap semiconductors ; Magnesium ; Semiconductor thin films ; MOCVD coatings ; Scanning electron microscopy ; Raman spectra ; Photoluminescence ; Surface composition ; Surface topography ; Stacking faults ; Inclusions ; ExcitonsPhotoluminescenceWurtzite crystal structureDopingUNESCO::FÍSICAGallium compoundsWide band gap semiconductorsMOCVD coatingsSurface compositionInclusionssymbolsSapphireExcitonsRaman spectraRaman spectroscopyScanning electron microscopyStacking fault
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Modulation of the electronic properties of GaN films by surface acoustic waves

2003

We report on the interaction between photogenerated electron-hole pairs and surface acoustic waves (SAW) in GaN films grown on sapphire substrates. The spatial separation of photogenerated carriers by the piezoelectric field of the SAW is evidenced by the quenching of the photoluminescence (PL) intensity. The quenching levels in GaN are significantly smaller than those measured in GaAs under similar conditions. The latter is attributed to the lower exciton ionization efficiency and carrier separation probabilities mediated by the piezoelectric effect. The PL spectra also evidence energy shifts and broadenings of the electronic transitions, which are attributed to the band gap modulation by …

PhotoluminescenceMaterials scienceIII-V semiconductorsSurface acoustic wavesBand gapExcitonRadiation quenchingGeneral Physics and AstronomySemiconductor thin filmsCondensed Matter::Materials Science:FÍSICA [UNESCO]IonizationPiezoelectric semiconductorsPhotoluminescenceQuenchingbusiness.industryUNESCO::FÍSICAWide-bandgap semiconductorGallium compoundsAcoustic waveCondensed Matter::Mesoscopic Systems and Quantum Hall EffectWide band gap semiconductorsGallium compounds ; III-V semiconductors ; Wide band gap semiconductors ; Surface acoustic waves ; Semiconductor thin films ; Photoluminescence ; Radiation quenching ; Piezoelectric semiconductors ; Excitons ; Energy gapEnergy gapSapphireOptoelectronicsExcitonsbusiness
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Photoluminescence spectral dispersion as a probe of structural inhomogeneity in silica

2011

We perform time-resolved photoluminescence measurements on point defects in amorphous silicon dioxide (silica). In particular, we report data on the decay kinetics of the emission signals of extrinsic oxygen deficient centres of the second type from singlet and directly excited triplet states, and we use them as a probe of structural inhomogeneity. Luminescence activity in sapphire (alpha-Al(2)O(3)) is studied as well and used as a model system to compare the optical properties of defects in silica with those of defects embedded in a crystalline matrix. Only for defects in silica did we observe a variation of the decay lifetimes with emission energy and a time dependence of the first moment…

PhotoluminescenceMaterials sciencePhysics::OpticsCondensed Matter PhysicsMolecular physicsCrystallographic defectSpectral lineLaser linewidthDispersion (optics)SapphireGeneral Materials ScienceSinglet Triplet Luminescence Inhomogeneous broadening Point defects SilicaSinglet stateLuminescenceJournal of Physics: Condensed Matter
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