Search results for "Scanning"

showing 10 items of 1808 documents

Gas sensing properties of Zn-doped p-type nickel ferrite

2012

Abstract The influence of zinc ion to the NiFe2O4 p-type semiconductor gas response characteristics is demonstrated. For characterization of gas sensor material, synthesized by sol–gel auto combustion method, X-ray diffraction (XRD), scanning electron microscopy (SEM), DC resistance and impedance spectroscopy (IS) measurements were employed. The response change of Zn doped nickel ferrite is related to the interruption of hole hopping between nickel ions. This was improved by change of conductivity type with temperature and gas exposure.

DiffractionMaterials scienceScanning electron microscopebusiness.industryMetals and AlloysAnalytical chemistryConductivityCondensed Matter PhysicsCombustionSurfaces Coatings and FilmsElectronic Optical and Magnetic MaterialsCharacterization (materials science)NanomaterialsDielectric spectroscopySemiconductorMaterials ChemistryElectrical and Electronic EngineeringbusinessInstrumentationSensors and Actuators B: Chemical
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Preparation and Electric Properties of Barium Zirconium Titanate Ceramic

2015

The relaxor behavior of barium zirconium titanate ceramics BaZr0.35Ti0.65O3 prepared by a conventional sintering process was investigated. The synthesized material was determined by an X-ray diffraction and scanning electron microscopy. Based on performed studies, the BaZr0.35Ti0.65O3 ceramic material has been identified as canonical relaxor, related to the Ti-rich polar regions. The freezing temperature Tf and activation energy Ea are calculated from the Vogel-Fulcher relationship.

DiffractionMaterials scienceScanning electron microscopechemistry.chemical_elementSinteringBariumActivation energyCondensed Matter PhysicsElectronic Optical and Magnetic MaterialsDielectric spectroscopychemistry.chemical_compoundchemistryChemical engineeringvisual_artBarium titanatevisual_art.visual_art_mediumCeramicFerroelectrics
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CuInS2 Films for Photovoltaic Applications Deposited by a Low-Cost Method.

2006

We report an atmospheric-pressure deposition method for preparing well-adhered and compact CuInS 2 films. The precursor film is obtained by a solution-coating technique and is subjected to a low-cost and safe one-step reduction-sulfurization treatment. A maximum thickness of 300 nm is achieved per layer, and up to three layers were sulfurized at a time. The obtained films were characterized by X-ray diffraction (XRD), X-ray photoelectron spectroscopy (XPS), scanning electron microscopy (SEM) and visible-near-infrared (vis-NIR) spectrophotometry.

DiffractionMaterials sciencemedicine.diagnostic_testChemistryScanning electron microscopeGeneral Chemical EngineeringPhotovoltaic systemAnalytical chemistryNanotechnologyGeneral ChemistryGeneral MedicineX-ray photoelectron spectroscopyChemical engineeringSpectrophotometryMaterials ChemistrymedicineDeposition (phase transition)Layer (electronics)Deposition (chemistry)ChemInform
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Template-based synthesis of nickel oxide

2015

Nanocrystalline NiO has been produced using a facile template-based synthesis from nickel nitrate solutions using cellulose as a template. Thus obtained oxides were studied by scanning electron microscopy, x-ray diffraction, Raman scattering spectroscopy, photoluminescence spectroscopy and confocal spectromicroscopy. The filamentary/coral morphology of the samples has been evidenced and is built up of agglomerated nanocrystallites with a size in the range of about 26-36 nm. The presence of two-magnon contribution in Raman scattering spectra suggests the existence of antiferromagnetic ordering at room temperature. Finally, the observed near-infrared photoluminescence band at 850 nm has been …

DiffractionNickelCrystallographyPhotoluminescenceMaterials sciencechemistryScanning electron microscopeNickel oxideNon-blocking I/OAnalytical chemistrychemistry.chemical_elementSpectroscopyNanocrystalline materialIOP Conference Series: Materials Science and Engineering
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Effect of gamma radiation on thermostimulated exoelectron emission from Gd2O3 films

2020

Abstract The effect of gamma irradiation on Gd2O3 films was studied using the thermostimulated exoelectron emission (TSEE) technique. The films were deposited on a glass and Si/SiO2 substrates using an extraction-pyrolytic method. Crystalline structure, chemical composition, film thickness and surface morphology were characterized by means of X-ray diffraction (XRD), X-ray photoelectron spectroscopy (XPS), scanning electron microscopy (SEM) and atomic force microscopy (AFM). The films were irradiated by 10 MeV gamma photons and TSEE was measured from the irradiated films. It was found that gamma irradiation decreases TSEE intensity and the area below TSEE spectral curves. A linear correlati…

DiffractionNuclear and High Energy PhysicsRange (particle radiation)Materials scienceX-ray photoelectron spectroscopyScanning electron microscopeAnalytical chemistryIrradiationElectronRadiationInstrumentationExoelectron emissionNuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms
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Phase transitions in i-butylammonium halogenoantimonate(III) and bismuthate(III) crystals

1997

Abstract Differential scanning calorimetry, dielectric, thermal expansion, infrared and preliminary X-ray diffraction studies on i-butylammonium halogenoantimonate(III) and bismuthate(III) crystals are reported. All crystals: (i-C4H9NH3)2BiCl5, (i-C4H9NH3)2SbBr5, (i-C4H9NH3)3BiCl6, (i-C4H9NH3)3Bi2Br9, (i-C4H9NH3)3Sb2Br9, show one or more structural phase transitions of first order type. The values of the transition entropies suggest that the most of the phase transitions are of the order-disorder type. The infrared studies confirmed the contribution of the i-butylammonium cations in the phase transition mechanism.

DiffractionPhase transitionInfraredChemistryOrganic ChemistryBismuthateDielectricThermal expansionAnalytical ChemistryInorganic ChemistryCrystallographychemistry.chemical_compoundDifferential scanning calorimetryFourier transform infrared spectroscopySpectroscopyJournal of Molecular Structure
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Structural characterization, thermal, dielectric and spectroscopic properties of di(n-pentylammonium) pentabromoantimonate(III): [n-C5H11NH3]2[SbBr5]

2008

Abstract The di( n -pentylammonium) pentabromoantimonate(III) compound has been synthesized and studied by means of a single-crystal X-ray diffraction, differential scanning calorimetry, thermal expansion, dielectric and IR techniques. Two solid–solid phase transitions of first order: at 416/388 K and 225/224 K (heating/cooling) have been revealed. The crystal structure of [ n -C 5 H 11 NH 3 ] 2 [SbBr 5 ] has been solved at 298 K, Pna 2 1 (phase II) and at 86 K P 2 1 2 1 2 1 (phase III). The crystal structure is composed of the SbBr 5 2 - anions which form an infinite chain and four independent n -pentylammonium cations. The dielectric studies have been made in the frequency range 500 Hz–1 …

DiffractionPhase transitionInfraredChemistryOrganic ChemistryCrystal structureDielectricThermal expansionAnalytical ChemistryInorganic ChemistryCrystallographyDifferential scanning calorimetryPhase (matter)SpectroscopyJournal of Molecular Structure
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1989

Some structurally disordered models for poly(tetrafluoroethylene) were elaborated and the corresponding calculated X-ray diffraction patterns compared with experimental patterns. This and differential scanning calorimetry results suggest some differences between the virgin powder and a sintered polycrystalline plate of poly(tetrafluoroethylene). These differences may be related to the crystal phase transitions that occur in a range of temperatures close to room temperature.

DiffractionPhase transitionchemistry.chemical_compoundCrystallographyDifferential scanning calorimetrychemistryPolymorphism (materials science)TetrafluoroethyleneCrystalliteCrystal structureDie Makromolekulare Chemie
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Computation of near field diffraction by a dielectric grating: a comparison with experiments

1995

We use an eigenmode method to compute the near field diffracted by one-dimensional dielectric gratings. We present a set of easily programmable recurrence relations that give the diffracted field from the incident one. The numerical results are compared with the experimental images obtained with the Photon Scanning Tunneling Microscope (PSTM).

DiffractionPhysicsField (physics)business.industryPhysics::OpticsNear and far fieldDielectricGratingAtomic and Molecular Physics and OpticsElectronic Optical and Magnetic MaterialsScanning probe microscopyOpticsElectrical and Electronic EngineeringPhysical and Theoretical ChemistrybusinessDiffraction gratingFresnel diffractionOptics Communications
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Electromagnetic Singularities and Resonances in Near-Field Optical Probes

2007

Over the last two decades scanning near-field optical microscopy (SNOM) has demonstrated its ability to provide optical resolution significantly better than the diffraction limit (<20 nm). The general principle of SNOM relies on the approach of a nanometer-sized object in the optical near-field of a sample to be studied. This nano-object (NO) is usually the extremity of a probe. Regardless of the nature of the observed SNOM signal (inelastic scattering, fluorescence, etc.), the detection of the light is achieved in the far-field regime where the NO acts as a mediator between the optical near-field and the detector. Figure 1 is a schematic illustration of the SNOM principle.

DiffractionPhysicsbusiness.industryResolution (electron density)DetectorPhysics::OpticsNear and far fieldInelastic scatteringlaw.inventionOpticsOptical microscopelawNear-field scanning optical microscopeScanning tunneling microscopebusiness
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