Search results for "Single Event Upset"

showing 3 items of 23 documents

Low Energy Protons at RADEF - Application to Advanced eSRAMs

2014

A low energy proton facility has been developed at RADEF, Jyvskyl, Finland. The proton energy selection, calibration and dosimetry are described. The first experiment with external users was performed using two memory test vehicles fabricated with 28 nm technology. Examples of single event upset measurements in the test vehicles embedded SRAMs (eSRAMs) as a function of proton energy are provided.

PhysicsProtonta114ta213business.industryNuclear engineeringElectrical engineeringProton energySEE testLow energyLow energy proton facilitySingle event upsetCalibrationDosimetryMemory testbusiness
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Dynamic Test Methods for COTS SRAMs

2014

International audience; In previous works, we have demonstrated the importance of dynamic mode testing of SRAM components under ionizing radiation. Several types of failures are difficult to expose when the device is tested under static (retention) mode. With the purpose of exploring and defining the most complete testing procedures and reveal the potential hazardous behaviors of SRAM devices, we present novel methods for the dynamic mode radiation testing of SRAMs. The proposed methods are based on different word address accessing schemes and data background: Fast Row, Fast Column, Pseudorandom, Adjacent (Gray) and Inverse Adjacent (Gray). These methods are evaluated by heavy ion and atmos…

Pseudorandom number generatorsingle event upset (SEU)Nuclear and High Energy Physicsta114ta213Computer scienceCOTSneutrons65 nmmultiple cell upset (MCU)SRAMColumn (database)[SPI.TRON]Engineering Sciences [physics]/ElectronicsRadiation testingNuclear Energy and EngineeringElectronic engineering90 nmHeavy ionStatic random-access memoryElectrical and Electronic Engineeringheavy ionsNeutron irradiationWord (computer architecture)dynamic testDynamic testingIEEE Transactions on Nuclear Science
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TileCal optical multiplexer board 9U prototype

2007

This paper presents the architecture and the status of the optical multiplexer board (OMB) for the ATLAS/LHC Tile hadronic calorimeter (TileCal). This board will analyze the front-end data CRC to prevent bit and burst errors produced by radiation. Besides, due to its position within the data acquisition chain it will be used to emulate front-end data for tests. The first two prototypes of the final OMB 9U version have been produced at CERN. Detailed design issues and manufacture features of these prototypes are described. These prototypes are being validated whereas some firmware developments are being implemented in the programmable devices of the board. Functional descriptions of the boar…

ScheduleEngineeringLarge Hadron ColliderFirmwarebusiness.industrycomputer.software_genreMultiplexerData acquisitionSingle event upsetNuclear electronicsEmbedded systemField-programmable gate arraybusinesscomputer
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