Search results for "Speckle imaging"

showing 8 items of 28 documents

Three-dimensional mapping and range measurement by means of projected speckle patterns.

2008

We present a novel approach for three-dimensional (3D) measurements that includes the projection of coherent light through ground glass. Such a projection generates random speckle patterns on the object or on the camera, depending if the configuration is transmissive or reflective. In both cases the spatially random patterns are seen by the sensor. Different spatially random patterns are generated at different planes. The patterns are highly random and not correlated. This low correlation between different patterns is used for both 3D mapping of objects and range finding.

Physicsbusiness.industryMaterials Science (miscellaneous)Spectral densitySpeckle noiseIndustrial and Manufacturing EngineeringSpeckle patternInterferometryOpticsElectronic speckle pattern interferometrySpatial frequencySpeckle imagingBusiness and International ManagementbusinessProjection (set theory)Applied optics
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Automatic analysis of speckle photography fringes

1997

Speckle interferometry is a technique adequate to metrological problems such as the measurement of object deformation. An automatic system of analysis of such measurements is given; it consists of a motorized x-y plate positioner controlled by computer, a CCD video camera, and software for image analysis. A fringe-recognition algorithm determines the spacing and orientation of the fringes and permits the calculation of the magnitude and direction of the displacement of the analyzed object point in images with variable degrees of illumination. For a 256 x 256 pixel image resolution, the procedure allows one to analyze from three fringes to a number of fringes that corresponds to 3 pixels/fri…

PixelImage qualitybusiness.industryComputer scienceOrientation (computer vision)Materials Science (miscellaneous)Astrophysics::Instrumentation and Methods for AstrophysicsVideo cameraSpeckle noiseImage processingHolographic interferometryIndustrial and Manufacturing Engineeringlaw.inventionOpticslawComputer Science::Computer Vision and Pattern RecognitionSpeckle imagingBusiness and International ManagementbusinessImage resolutionApplied Optics
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Superresolved imaging based on wavelength multiplexing of projected unknown speckle patterns

2015

We propose a method for resolution enhancement of a diffraction limited optical system based on the capture of a set of low resolution images. These images are obtained after projection of an ensemble of unknown speckle patterns on top of the high resolution object that is to be imaged. Each speckle pattern is generated by the same thin (and unknown) diffuser, but illuminated with a slightly different wavelength. From the ensemble of low resolution images, we obtain a system of equations that can be solved in an iterative manner that enables reconstruction of the high resolution object. As a result, we also achieve the projected high resolution speckle patterns used for the encoding.

Point spread functionPhysicsDiffractionbusiness.industryMaterials Science (miscellaneous)Resolution (electron density)Physics::OpticsSpeckle noiseIndustrial and Manufacturing EngineeringSpeckle patternOpticsSpatial frequencySpeckle imagingBusiness and International ManagementbusinessProjection (set theory)Applied Optics
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Rounding noise effects’ reduction for estimated movement of speckle patterns

2018

The problem of resolution enhancement for speckle patterns analysis-based movement estimation is considered. In our previous publications we showed that this movement represents the corresponding tilt vibrations of the illuminated object and can be measured as a relative spatial shift between time adjacent images of the speckle pattern. In this paper we show how to overcome the resolution limitation obtained when using an optical sensor available in an optical mouse and which measures the Cartesian coordinates of the shift as an integer number of pixels. To overcome such a resolution limitation, it is proposed here to use simultaneous measurements from the same illuminated spot by a few cam…

Signal processingPixelComputer sciencebusiness.industryImage processing02 engineering and technology021001 nanoscience & nanotechnology01 natural sciencesAtomic and Molecular Physics and Optics010309 opticsSpeckle patternOpticsMotion estimation0103 physical sciencesSpeckle imagingImage sensor0210 nano-technologybusinessOptics Express
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Synthetic aperture superresolution by speckle pattern projection.

2009

We propose a method for increasing the resolution of an aperture limited optical system by illuminating the input with a speckle pattern. The high resolution of the projected speckle pattern demodulates the high frequencies of the sample and permits its passage through the system aperture. A decoding provides the superresolved image. The speckle pattern can be generated in a simple manner in contrast with other structured light superresolution methods. The method is demonstrated in microscopy test images.

Synthetic aperture radarPhysicsSpeckle patternOpticsbusiness.industryApertureAperture synthesisSpeckle noiseSpeckle imagingbusinessImage resolutionAtomic and Molecular Physics and OpticsStructured lightOptics express
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Optical phase retrieval using four rotated versions of a single binary mask – simulation results

2018

In signal processing one often faces the phase problem, i.e., when an image is formed information about the phase is lost so that only information about intensity is available. This is often an issue in astronomy, biology, crystallography, speckle imaging, diffractive imaging where the phase of the object must be known. While there have been many approaches how to find a solution to the phase problem, numerical algorithms recovering the phase from intensity measurements become more and more popular. One of such algorithms called PhaseLift has been recently proposed. In this study, we show that even 4 masks may be sufficient for reasonable recovery of the phase. The original wavefront and th…

WavefrontSignal processingComputer scienceFourier opticsPhase (waves)010103 numerical & computational mathematicsPhase problem01 natural sciences010309 optics0103 physical sciencesSpeckle imaging0101 mathematicsPhase retrievalAdaptive opticsAlgorithmComputational Optics II
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Depth sensing using coherence mapping

2010

A method for depth sensing based on sensing the visibility associated with the coherence function of a laser source is presented. The setup is based on an electronic speckle pattern interferometric (ESPI) setup, where the object depth is encoded into the amplitude of the interference pattern without the need for depth scanning. After performing phase-shifting method, the object three-dimensional (3-D) shape is reconstructed by means as a range image from the visibility of the image set of interferograms and where each gray level represents a given object depth. Experimental results validate the proposed approach for reflective diffuse objects at different measurement distances.

business.industryComputer scienceLaser sourceAtomic and Molecular Physics and OpticsElectronic Optical and Magnetic MaterialsGray levelSpeckle patternInterferometryOpticsAmplitudeElectronic speckle pattern interferometryCoherence (signal processing)Speckle imagingElectrical and Electronic EngineeringPhysical and Theoretical ChemistrybusinessOptics Communications
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Hybrid optical-digital method for local-displacement analysis by use of a phase-space representation.

2010

A method for evaluating the local deformation or displacement of an object in speckle metrology is described. The local displacements of the object in one direction are digitally coded in a one-dimensional specklegram. By optically performing the local spectrum of this pattern, one simultaneously achieves information about the local displacement and its spatial position. The good performance of this technique is demonstrated with computer-generated test signals.

business.industryComputer scienceMaterials Science (miscellaneous)Industrial and Manufacturing EngineeringDisplacement (vector)MetrologySpeckle patternOpticsInterference (communication)Position (vector)Phase spaceSpatial frequencySpeckle imagingBusiness and International ManagementbusinessApplied optics
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