Search results for "Static random-access memory"

showing 3 items of 13 documents

Real-Time SRAM Based Particle Detector

2015

International audience; Monitoring radiative environments is of great importance, especially for facilities hosting large particle accelerators and nuclear power plants. Such facilities make use of monitoring systems that are usually composed of different sensors to evaluate the intensity of the ambient radiation field in different locations. In this paper, we propose an SRAM-based monitor that works in dynamic mode (memory continuously accessed), according to data gathered by irradiating our sensor in several particle accelerator facilities. The dynamic mode of operation allows for real-time sensing, especially when the particle fluence is high. In order to ensure the efficiency of the det…

Physicsta114ta213DetectorParticle acceleratorSRAM7. Clean energyParticle detectorParticle acceleratorslaw.invention[SPI.TRON]Engineering Sciences [physics]/ElectronicslawElectronic engineeringRadiative transferRadiation monitoringParticleStatic random-access memoryParticle detectorIntensity (heat transfer)
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Dynamic Test Methods for COTS SRAMs

2014

International audience; In previous works, we have demonstrated the importance of dynamic mode testing of SRAM components under ionizing radiation. Several types of failures are difficult to expose when the device is tested under static (retention) mode. With the purpose of exploring and defining the most complete testing procedures and reveal the potential hazardous behaviors of SRAM devices, we present novel methods for the dynamic mode radiation testing of SRAMs. The proposed methods are based on different word address accessing schemes and data background: Fast Row, Fast Column, Pseudorandom, Adjacent (Gray) and Inverse Adjacent (Gray). These methods are evaluated by heavy ion and atmos…

Pseudorandom number generatorsingle event upset (SEU)Nuclear and High Energy Physicsta114ta213Computer scienceCOTSneutrons65 nmmultiple cell upset (MCU)SRAMColumn (database)[SPI.TRON]Engineering Sciences [physics]/ElectronicsRadiation testingNuclear Energy and EngineeringElectronic engineering90 nmHeavy ionStatic random-access memoryElectrical and Electronic Engineeringheavy ionsNeutron irradiationWord (computer architecture)dynamic testDynamic testingIEEE Transactions on Nuclear Science
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SEU characterization of commercial and custom-designed SRAMs based on 90 nm technology and below

2020

International audience; The R2E project at CERN has tested a few commercial SRAMs and a custom-designed SRAM, whose data are complementary to various scientific publications. The experimental data include low- and high-energy protons, heavy ions, thermal, intermediate- and high-energy neutrons, high-energy electrons and high-energy pions.

high-energy protonsCOTS[PHYS.PHYS.PHYS-ACC-PH]Physics [physics]/Physics [physics]/Accelerator Physics [physics.acc-ph]käyttömuistitNuclear TheoryElectronHardware_PERFORMANCEANDRELIABILITY01 natural sciences7. Clean energyIonelektroniikkakomponentitNuclear physicsCross section (physics)Pion0103 physical sciencesNeutronionisoimaton säteilyStatic random-access memory010306 general physicsheavy ionsNuclear Experimentlow-energy protonsPhysicsLarge Hadron Collidercross section010308 nuclear & particles physicsionisoiva säteilyelectronsneutronsmuistit (tietotekniikka)SRAMCharacterization (materials science)säteilyfysiikkapionsSEU
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