Search results for "X-ray Spectroscopy"

Micromorphological approach to the systematics of Mediterranean Isoëtes species (Isoëtaceae, Lycopodiophyta): analysis of the megaspore surface

2012

Megaspore ornamentation is one of the few morphological characters used in the taxonomy of the genus Isoëtes. In the present work, we test the application of this character for distinguishing some Isoëtes species occurring in the Mediterranean: Isoëtes sicula, which according to some authors should be included as a variety in I. histrix, and the recently described I. todaroana, whose affinity with other taxa is currently unknown. Two additional species (I. duriei, I. velata) were also included in the analysis. The megaspores were studied using scanning electron microscopy combined with energy-dispersive X-ray spectroscopy and chemical treatment. In all species, the megaspore surface is cove…

Large Area Deposition by Radio Frequency Sputtering of Gd0.1Ce0.9O1.95 Buffer Layers in Solid Oxide Fuel Cells: Structural, Morphological and Electro…

2021

We investigate the influence of position, under large circular sputtering targets, on the final electrochemical performance of 35 mm diameter button solid oxide fuel cells with sputter-deposited Gadolinium doped Ceria barrier layers, positioned in order to almost cover the entirety of the area associated with a 120 × 80 mm2 industrial cell. We compare the results obtained via structural and morphological analysis to the Electrochemical Impedance Spectroscopy (EIS) measurements performed on the button cells, disentangling the role of different parameters. The Atomic Force Microscopy analysis makes it possible to observe a decrease in the roughness values from the peripheral to the central zo…

New Regularization Method for EXAFS Analysis

2007

As an alternative to the analysis of EXAFS spectra by conventional shell fitting, the Tikhonov regularization method has been proposed. An improved algorithm that utilizes a priori information about the sample has been developed and applied to the analysis of U L3‐edge spectra of soddyite, (UO2)2SiO4⋅2H2O, and of U(VI) sorbed onto kaolinite. The partial radial distribution functions g1(UU), g2(USi), and g3(UO) of soddyite agree with crystallographic values and previous EXAFS results.

Electrosynthesis of Sn-Co nanowires in alumina membranes

2010

A fabrication process of amorphous nanowires of Sn-Co alloys, based on electrodeposition into anodic alumina membranes, is described. It is shown that nanowires of tin-cobalt alloys with different compositions can be produced by varying electrodeposition time and concentration ratio of salts dissolved into the electrolytic bath. Importance of the chelating agent to produce amorphous Sn-Co alloys has also been addressed. Electrodepositions were carried out potentiostatically at -1 V versus Saturated Calomel Electrode and 60 degrees C for times ranging from 10 to 90 minutes; the atomic fraction of Co2+ in the aqueous electrolyte (Co2+/(Co2+ + Sn2+)) was varied from 0.33 to 0.67. Nanowires asp…

The IXO Wide-Field Imager

2010

The Wide Field Imager (WFI) of the International X-ray Observatory (IXO) is an X-ray imaging spectrometer based on a large monolithic DePFET (Depleted P-channel Field Effect Transistor) Active Pixel Sensor. Filling an area of 10 × 10 cm² with a format of 1024 × 1024 pixels it will cover a field of view of 18 arcmin. The pixel size of 100 × 100 μm² corresponds to a fivefold oversampling of the telescope's expected 5 arcsec point spread function. The WFI's basic DePFET structure combines the functionalities of sensor and integrated amplifier with nearly Fano-limited energy resolution and high efficiency from 100 eV to 15 keV. The development of dedicated control and amplifier ASICs allows for…

The wide-field imager for IXO: status and future activities

2010

The Wide Field Imager (WFI) of the International X-ray Observatory (IXO) is an X-ray imaging spectrometer based on a large monolithic DePFET (Depleted P-channel Field Effect Transistor) Active Pixel Sensor. Filling an area of 10 x 10 cm2 with a format of 1024 x 1024 pixels it will cover a field of view of 18 arcmin. The pixel size of 100 x 100 μm2 corresponds to a fivefold oversampling of the telescope's expected 5 arcsec point spread function. The WFI's basic DePFET structure combines the functionalities of sensor and integrated amplifier with nearly Fano-limited energy resolution and high efficiency from 100 eV to 15 keV. The development of dedicated control and amplifier ASICs allows for…

BROAD BAND SPECTRAL ANALYSIS AND X-RAY SPECTROSCOPY OF NEUTRON STAR LOW MASS X-RAY BINARIES

High-pressure x-ray absorption spectroscopy study of tin tungstates

2015

Room-temperature pressure-dependent (0-25 GPa) x-ray absorption spectroscopy at the W -edges of α-SnWO4 and β-SnWO4 was performed using a dispersive setup and a high-pressure nanodiamond anvil cell. The detailed analysis of experimental x-ray absorption near-edge structure and extended x-ray absorption fine structure data suggests that upon increasing pressure, a displacement of tungsten atoms by about 0.2 A toward the center of the WO6 octahedra occurs in α-SnWO4, whereas the coordination of tungsten atoms changes from tetrahedral to distorted octahedral in β-SnWO4.

Electroplated Indium Bumps as Thermal and Electrical Connections of NTD-Ge Sensors for the Fabrication of Microcalorimeter Arrays

2012

We are developing a method to build arrays of Ge-based microcalorimeters for soft X-rays detection using micro-photolithographic techniques. A key element of the process is the electrical and thermal connection between the germanium sensors and the interconnection electrical tracks, that lay on a substrate acting as mechanical support and thermal sink. The geometry of the sensors, that have a square base truncated pyramid shape, makes feasible a connection through indium soldering. We describe a technique, based on microlithography and electroplating, adopted to grow indium bumps of a few tens of square microns of area and several microns high on top of the contact pads patterned on the sub…

Local structure studies of SrTi16O3and SrTi18O3

2014

In this work we report on the local structure of Ti in SrTi 16 O3 (STO16) and SrTi 18 O3 (STO18) investigated in the low temperature range (6‐300K) by extended x-ray absorption fine structure and x-ray absorption near edge structure (XANES) spectroscopy at Ti K-edge and by optical second harmonic generation (SHG). By comparing XANES of STO16 and STO18 we have identified the isotopic effect which produces at T < 100K a noticeable difference in the measured mean square relative displacements (MSRD) of Ti‐O1 bonds: while STO16 follow the expected Einstein-like behavior, for STO18 we have measured an increase of MSRD values with decreasing temperature. This is an indication of an increasing off…