Search results for "conductive atomic force microscopy"

showing 3 items of 33 documents

Mechanical and electroconductive properties of spatially distributed double stranded DNA arrays on Au (111)

2008

Abstract Conductive AFM was used to investigate electroconductivity through 10 nm long double stranded DNA molecules in mixed monolayers of thioalkylated-DNA and mercaptohexanol (MCH) on Au (111) surface. The distribution of DNA molecules on the surface was analyzed by tapping mode AFM. Measurements performed in lift mode confirmed that the DNA molecules protrude from the surface rather than lie horizontally adsorbed on the interface. The optimal conductivity measurement time, which is shorter than the mechanical relaxation time of oligonucleotide duplexes, was determined. It was concluded that oligonucleotide duplexes have a resistance of the order of ~ 2 Ω ⁎ m at 1 V.

OligonucleotideMetals and AlloysAnalytical chemistrySelf-assembled monolayerSurfaces and InterfacesConductive atomic force microscopyConductivitySurfaces Coatings and FilmsElectronic Optical and Magnetic MaterialsCrystallographychemistry.chemical_compoundAdsorptionchemistryMonolayerMaterials ChemistryMoleculeDNAThin Solid Films
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Electronic and mechanical characterization of self-assembled alkanethiol monolayers by scanning tunneling microscopy combined with interaction-force-…

1993

We have used scanning tunneling microscopy to study self-assembled monolayers of mercaptohexadecanol in ultrigh vacuum. In addition to tunneling, the interaction force gradient acting between tip and sample was measured. Analysis of the force-gradient data shows that the tip is in mechanical contact with the surface of the monolayer which, in turn, is elastically compressed. The lateral dimensions of the mechanical contact are substantially (approximately five times) larger than the width of the tunneling-current filament. The results suggest that the compression of the monolayer constitutes an integral part of tunneling through the molecules

Protein filamentMaterials sciencelawMonolayerMoleculeNanotechnologyConductive atomic force microscopyScanning tunneling microscopeMolecular physicsQuantum tunnellingElectrochemical scanning tunneling microscopelaw.inventionCharacterization (materials science)Physical review. B, Condensed matter
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<title>Scanning probe microscopy of nanocrystalline iridium oxide thin films</title>

2003

Structural investigations of nanocrystalline iridium oxide thin films, prepared by dc magnetron sputtering technique were performed by scanning probe microscopy (SPM). SPM studies, using both atomic force microscopy (AFM) and scanning tunnelling microscopy (STM), indicate that the thin films are composed of grains with a size of about 20-50 nm. Fine crystallinity and small RMS microroughness of the films, being well below 2 nm, make iridium oxide thin films promising candidates for nanolithographic applications. The possibility to perform nanolithograhpic processes at a scale of less than 150 nm was successfully examined in AFM and STM modes.© (2003) COPYRIGHT SPIE--The International Societ…

Scanning probe microscopyMaterials scienceScanning confocal electron microscopyScanning ion-conductance microscopyNanotechnologyConductive atomic force microscopyScanning capacitance microscopyPhotoconductive atomic force microscopyVibrational analysis with scanning probe microscopyNanocrystalline materialSPIE Proceedings
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