Search results for "electron microscopy"

showing 10 items of 706 documents

Photoemission Electron Microscopy as a tool for the investigation of optical near fields

2005

Photoemission electron microscopy was used to image the electrons photoemitted from specially tailored Ag nanoparticles deposited on a Si substrate (with its native oxide SiO$_{x}$). Photoemission was induced by illumination with a Hg UV-lamp (photon energy cutoff $\hbar\omega_{UV}=5.0$ eV, wavelength $\lambda_{UV}=250$ nm) and with a Ti:Sapphire femtosecond laser ($\hbar\omega_{l}=3.1$ eV, $\lambda_{l}=400$ nm, pulse width below 200 fs), respectively. While homogeneous photoelectron emission from the metal is observed upon illumination at energies above the silver plasmon frequency, at lower photon energies the emission is localized at tips of the structure. This is interpreted as a signat…

Materials sciencebusiness.industryResolution (electron density)General Physics and AstronomyFOS: Physical sciencesPhysics::OpticsElectronPhoton energyLaserlaw.inventionPhotoemission electron microscopyCondensed Matter::Materials ScienceOpticslawFemtosecondSapphireOptoelectronicsbusinessPlasmonOptics (physics.optics)Physics - Optics
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Femtosecond time-resolved photoemission electron microscopy operated at sample illumination from the rear side

2019

We present an advanced experimental setup for time-resolved photoemission electron microscopy (PEEM) with sub-20 fs resolution, which allows for normal incidence and highly local sample excitation with ultrashort laser pulses. The scheme makes use of a sample rear side illumination geometry that enables us to confine the sample illumination spot to a diameter as small as 6 μm. We demonstrate an operation mode in which the spatiotemporal dynamics following a highly local excitation of the sample is globally probed with a laser pulse illuminating the sample from the front side. Furthermore, we show that the scheme can also be operated in a time-resolved normal incidence two-photon PEEM mode w…

Materials sciencebusiness.industryResolution (electron density)Physics::OpticsLaserSample (graphics)Surface plasmon polaritonlaw.inventionInterferometryPhotoemission electron microscopyOpticslawFemtosecondbusinessInstrumentationExcitationReview of Scientific Instruments
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Imaging of photonic nanopatterns by scanning near-field optical microscopy

2002

We define photonic nanopatterns of a sample as images recorded by scanning near-field optical microscopy with a locally excited electric dipole as a probe. This photonic nanopattern can be calculated by use of the Green’s dyadic technique. Here, we show that scanning near-field optical microscopy images of well-defined gold triangles taken with the tetrahedral tip as a probe show a close similarity to the photonic nanopattern of this nanostructure with an electric dipole at a distance of 15 nm to the sample and tilted 45° with respect to the scanning plane.

Materials sciencebusiness.industryScanning confocal electron microscopyPhysics::OpticsStatistical and Nonlinear PhysicsScanning gate microscopyScanning capacitance microscopyAtomic and Molecular Physics and Opticslaw.inventionScanning probe microscopyOpticslawScanning ion-conductance microscopyNear-field scanning optical microscopeScanning tunneling microscopebusinessVibrational analysis with scanning probe microscopyJournal of the Optical Society of America B
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Phase defect inspection of multilayer masks for 13.5 nm optical lithography using PEEM in a standing wave mode

2007

We report on recent developments of an "at wavelength" full-field imaging technique for defect inspection of multilayer mask blanks for extreme ultraviolet lithography (EUVL). Our approach uses photoemission electron microscopy (PEEM) in a near normal incidence mode at 13.5 nut wavelength to image the photoemission induced by the EUV wave field on the multilayer blank surface. We analyze buried defects on Mo/Si multilayer samples down to a lateral size of 50 nm and report on first, results obtained from a six inches mask blank prototype as prerequisite for industrial usage. (c) 2007 Elsevier B.V. All rights reserved.

Materials sciencebusiness.industryphotoemission electronExtreme ultraviolet lithographydefect analysisPhase (waves)Surfaces and InterfacesCondensed Matter PhysicsBlankSurfaces Coatings and Filmslaw.inventionStanding waveextreme ultraviolet lithography (EUVL)WavelengthPhotoemission electron microscopyOpticslawmultilayer mask blanksMaterials ChemistryOptoelectronicsEUV-PEEMPhotolithographybusinessLithographymicroscopy (PEEM)
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Insights into the formation of metal carbon nanocomposites for energy storage using hybrid NiFe layered double hydroxides as precursors

2020

[EN] NiFe-carbon magnetic nanocomposites prepared using hybrid sebacate intercalated layered double hydroxides (LDHs) as precursors are shown to be of interest as supercapacitors. Here, the low-temperature formation mechanism of these materials has been deciphered by means of a combined study using complementaryin situ(temperature-dependent) techniques. Specifically, studies involving X-ray powder diffraction, thermogravimetry coupled to mass spectrometry (TG-MS), statistical Raman spectroscopy (SRS), aberration-corrected scanning transmission electron microscopy (STEM) and electron energy-loss spectroscopy (EELS) have been carried out. The experimental results confirm the early formation o…

Materials sciencechemistry.chemical_elementNanoparticle02 engineering and technologyengineering.material010402 general chemistry01 natural sciencessymbols.namesakeScanning transmission electron microscopyNanocompositeLayered double hydroxidesGeneral ChemistryQuímicaEnergia Desenvolupament021001 nanoscience & nanotechnology0104 chemical sciencesThermogravimetryChemistrychemistryChemical engineeringengineeringsymbols0210 nano-technologyRaman spectroscopyCarbonPowder diffraction
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(Ag)Pd-Fe3O4 Nanocomposites as Novel Catalysts for Methane Partial Oxidation at Low Temperature

2020

Nanostructured composite materials based on noble mono-(Pd) or bi-metallic (Ag/Pd) particles supported on mixed iron oxides (II/III) with bulk magnetite structure (Fe3O4) have been developed in order to assess their potential for heterogeneous catalysis applications in methane partial oxidation. Advancing the direct transformation of methane into value-added chemicals is consensually accepted as the key to ensuring sustainable development in the forthcoming future. On the one hand, nanosized Fe3O4 particles with spherical morphology were synthesized by an aqueous-based reflux method employing different Fe (II)/Fe (III) molar ratios (2 or 4) and reflux temperatures (80, 95 or 110 &deg

Materials scienceoxidation catalysisXRDGeneral Chemical EngineeringNanoparticleAgHeterogeneous catalysisArticleCatalysisFe<sub>3</sub>O<sub>4</sub>EDSReaction ratelcsh:Chemistrymagnetite iron oxidePdGeneral Materials SciencesilverPartial oxidationBimetallic stripRamanTG in airlow-temperature activityNanocompositenanocompositeelectron microscopymethaneFe3O4palladiumTG in hydrogenThermogravimetryheterogeneous catalysislcsh:QD1-999formaldehydeNuclear chemistryNanomaterials
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A new approach for actinic defect inspection of EUVL multilayer mask blanks: Standing wave photoemission electron microscopy

2006

Extreme ultraviolet lithography (EUVL) at 13.5 nm is the next generation lithography technique capable of printing sub-50 nm structures. With decreasing feature sizes to be printed, the requirements for the lithography mask also become more stringent in terms of defect sizes and densities that are still acceptable and the development of lithography optics has to go along with the development of new mask defect inspection techniques that are fast and offer high resolution (preferable in the range of the minimum feature size) at the same time. We report on the development and experimental results of a new 'at wavelength' full-field imaging technique for defect inspection of multilayer mask bl…

Materials sciencephotoemission electronbusiness.industryExtreme ultraviolet lithographyCondensed Matter Physicsmultilayer mask blankAtomic and Molecular Physics and OpticsSurfaces Coatings and FilmsElectronic Optical and Magnetic Materialslaw.inventionPhotoemission electron microscopyWavelengthOpticslawEUV lithographymicroscopyOptoelectronicsX-ray lithographyElectrical and Electronic EngineeringPhotolithographyactinic defect inspectionbusinessLithographyImage resolutionNext-generation lithographyMicroelectronic Engineering
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Individual arc-discharge synthesized multiwalled carbon nanotubes probed with multiple measurement techniques

2020

Arc-discharge synthesized multiwalled carbon nanotubes (AD-MWNT), or related MWNTs, exhibit a good quality compared to the more common type of MWNT synthesized by catalytic chemical vapor deposition methods. Yet experimental measurements on these are rather few and typically have not correlated data from different measurement techniques. Here, the authors report Raman spectroscopy, scanning probe microscopy, conductivity measurements, and force microscopy on single AD-MWNTs. The results demonstrate the high quality of AD-MWNTs and are compatible with the view of them as the best approximation of MWNTs as an assembly of defect-free concentric individual single-walled carbon nanotubes. The au…

Materials sciencescanning probe microscopyCarbon nanotubeConductivitylaw.inventionnanotubesElectric arcsymbols.namesakeScanning probe microscopyraman spectroscopyatomifysiikkalawelectric dischargesMicroscopyMaterials ChemistryElectrical and Electronic EngineeringatomivoimamikroskopiaInstrumentationatomic force microscopyPhysicsProcess Chemistry and TechnologyConductanceSurfaces Coatings and FilmsElectronic Optical and Magnetic MaterialsChemical engineeringelectronic devicessymbolsscanning tunneling microscopynanoputketRaman spectroscopyEngineering sciences. TechnologyLayer (electronics)scanning electron microscopy
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Variation of lattice constant and cluster formation in GaAsBi

2013

We investigate the structural properties of GaAsBi layers grown by molecular beam epitaxy on GaAs at substrate temperatures between 220–315 C. Irrespective of the growth temperature, the structures exhibited similar Bi compositions, and good overall crystal quality as deduced from X-Ray diffraction measurements. After thermal annealing at temperatures as low as 500 C, the GaAsBi layers grown at the lowest temperatures exhibited a significant reduction of the lattice constant. The lattice variation was significantly larger for Bi-containing samples than for Bi-free low-temperature GaAs samples grown as a reference. Rutherford backscattering spectrometry gave no evidence of Bi diffusing out o…

Materials scienceta114Annealing (metallurgy)Analytical chemistryGeneral Physics and Astronomyion beam analysisoptoelektroniikkaRutherford backscattering spectrometryCrystallographic defectCrystalLattice constantTransmission electron microscopyX-ray crystallographyMolecular beam epitaxyJournal of Applied Physics
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A comparison of the Raman LAM and electron microscopy in determining crystallite thickness distributions: Polyethylenes with narrow size distributions

1989

Bon accord entre les resultats obtenus pour des polyethylenes cristallises a 118 o C pendant 2 et 20 minutes lorsqu'on prend en compte l'inclinaison de la chaine et pour des polymeres a distribution etroite

Measurement methodPolymers and PlasticsChemistryLinear polymerAnalytical chemistryCondensed Matter Physicslaw.inventionsymbols.namesakeTransmission electron microscopylawMaterials ChemistrysymbolsCrystallitePhysical and Theoretical ChemistryElectron microscopeRaman spectroscopyJournal of Polymer Science Part B: Polymer Physics
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