Search results for "ellipsométrie"
showing 3 items of 3 documents
Experimental characterization of micromechanical and microphological properties of nickel base alloys strained by the growth of an ovide payer made i…
2011
The loss of the corrosion resistance of the alloy 600, a nickel base alloy, during the oxidation in pressurized water reactor (PWR) has been demonstrated by many studies. It induces the intergranular stress corrosion cracking (IGSCC). If the chemical composition and the structure of the growing oxide are well-known, the mechanical influence of the oxide on the alloy has not been fully studied, yet. This study aims at bringing new knowledge of the oxidation impact on the mechanical response of the alloy. A new methodology is introduced for determining the local nanodeformation of the alloy 600 induced either by an oxidation or by a tensile loading. This method is based on nanodots disposed a…
Interfaces électrochimiques et couches minces sondées par ellipsométrie
2020
Spectroscopic ellipsometry (SE) is a non-invasive, non-destructive, and contactless optical technique which is based on the change in the polarization state of light as it is typically reflected from a thin film sample. Often seen primarily as ex situ or of particularly helpful interest to control in situ vacuum growth processes, SE can also be promoted as an analytical tool to diagnose electrolyte-electrode interface during wet processes. I will mainly highlight in this document my researches contributions in this field: (i) the very early growth stages of bismuth telluride electrodeposition, (ii) the physico-chemical properties of oxides grown in the early regime of plasma electrolytic ox…
Analyse locale des sensibilités des lectures angulaires, spectroscopiques et ellipsométriques de la Résonance des Plasmons de Surface en vue de la mi…
2006
The fluorescence labelling, used by the fluorescence biochips, is known to change the charge distribution of the labelled molecules and then modify their biological activity. Among label free biosensors, we choose an optical detection, such as spectroscopic ellipsometry and/or surface plasmon resonance (SPR) of the biolayers.These optical techniques are based on the measurement of both thickness and optical index of the adsorbed biolayer. An AFM statistical measurement of the thickness of functionalized lithographed microstructures has been performed in order to determine the thickness of the biolayers.We have shown that the spectroscopic reading of the SPR phase shift is 100 times more sen…