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RESEARCH PRODUCT

Interfaces électrochimiques et couches minces sondées par ellipsométrie

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Spectroscopic ellipsometry (SE) is a non-invasive, non-destructive, and contactless optical technique which is based on the change in the polarization state of light as it is typically reflected from a thin film sample. Often seen primarily as ex situ or of particularly helpful interest to control in situ vacuum growth processes, SE can also be promoted as an analytical tool to diagnose electrolyte-electrode interface during wet processes. I will mainly highlight in this document my researches contributions in this field: (i) the very early growth stages of bismuth telluride electrodeposition, (ii) the physico-chemical properties of oxides grown in the early regime of plasma electrolytic oxidation of magnesium alloy and (iii) the coloration mechanism and redox-switching ability monitoring of aqueous electrochemical-based sodium ion intercalation in amorphous sputter-deposited tungsten trioxide thin films.