Search results for "hiukkassäteily"

showing 8 items of 8 documents

Low-Power, Subthreshold Reference Circuits for the Space Environment : Evaluated with -rays, X-rays, Protons and Heavy Ions

2019

The radiation tolerance of subthreshold reference circuits for space microelectronics is presented. The assessment is supported by measured results of total ionization dose and single event transient radiation-induced effects under &gamma

02 engineering and technologyHardware_PERFORMANCEANDRELIABILITYgammasäteily7. Clean energy01 natural sciencesanalog single-event transient (ASET)Ionizationsingle-event effects (SEE)0202 electrical engineering electronic engineering information engineeringAnnan elektroteknik och elektronikElectronic circuitPhysicsprotonsSubthreshold conductionionisoiva säteilyröntgensäteilyGamma raygamma-raysHardware and ArchitectureAtomic physicsVoltage referencemikroelektroniikkaprotonitComputer Networks and Communicationslcsh:TK7800-8360voltage referenceIonheavy-ions0103 physical sciencesionizationradiation hardening by design (RHBD)X-raysHardware_INTEGRATEDCIRCUITSMicroelectronicsElectrical and Electronic Engineeringhiukkassäteilybandgap voltage reference (BGR)Other Electrical Engineering Electronic Engineering Information Engineering010308 nuclear & particles physicsbusiness.industry020208 electrical & electronic engineeringlcsh:Electronicsspace electronicstotal ionization dose (TID)Analog single-event transient (ASET); Bandgap voltage reference (BGR); CMOS analog integrated circuits; Gamma-rays; Heavy-ions; Ionization; Protons; Radiation hardening by design (RHBD); Reference circuits; Single-event effects (SEE); Space electronics; Total ionization dose (TID); Voltage reference; X-raysmikropiiritsäteilyfysiikkaControl and Systems Engineeringreference circuitsSignal ProcessingbusinessSpace environmentHardware_LOGICDESIGNCMOS analog integrated circuits
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Nanorod orientation control by swift heavy ion irradiation

2022

Highly energetic ions have been previously used to modify the shape of metal nanoparticles embedded in an insulating matrix. In this work, we demonstrate that under suitable conditions, energetic ions can be used not only for shape modification but also for manipulation of nanorod orientation. This observation is made by imaging the same nanorod before and after swift heavy ion irradiation using a transmission electron microscope. Atomistic simulations reveal a complex mechanism of nanorod re-orientation by an incremental change in its shape from a rod to a spheroid and further back into a rod aligned with the beam. Highly energetic ions have been previously used to modify the shape of meta…

DYNAMICSTRACKSPhysics and Astronomy (miscellaneous)ELONGATIONSURFACEionisoiva säteilyPhysics::Medical PhysicsPhysics::Optics114 Physical sciencesNANOPARTICLESAUnanohiukkasetGOLDSILICAmuotohiukkassäteily
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Neutron-Induced Effects on a Self-Refresh DRAM

2022

International audience; The field of radiation effects in electronics research includes unknowns for every new device, node size, and technical development. In this study, static and dynamic test methods were used to define the response of a self-refresh DRAM under neutron irradiation. The neutron-induced effects were investigated and characterised by event cross sections, soft-error rate, and bitmaps evaluations, leading to an identification of permanent and temporary stuck cells, single-bit upsets, and block errors. Block errors were identified in different patterns with dependency in the addressing order, leading to up to two thousand faulty words per event, representing a real threat fr…

HyperRAMComputer science020209 energykäyttömuistitSelf-Refresh02 engineering and technologyNeutronFault (power engineering)elektroniikkakomponentit0202 electrical engineering electronic engineering information engineering0601 history and archaeologyElectrical and Electronic Engineering[SPI.NANO]Engineering Sciences [physics]/Micro and nanotechnologies/MicroelectronicsSafety Risk Reliability and QualitySimulationhiukkassäteilyBlock (data storage)060102 archaeologyEvent (computing)stuck bitsneutronit06 humanities and the artscomputer.file_formatCondensed Matter PhysicsSelf-refreshAtomic and Molecular Physics and OpticsSEESurfaces Coatings and FilmsElectronic Optical and Magnetic Materials[SPI.TRON]Engineering Sciences [physics]/ElectronicsradiationIdentification (information)DRAMsäteilyfysiikkaStuck bitsBitmapNode (circuits)[INFO.INFO-ES]Computer Science [cs]/Embedded SystemscomputerDramDynamic testing
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Radioactive Beams for Image-Guided Particle Therapy : The BARB Experiment at GSI

2021

Several techniques are under development for image-guidance in particle therapy. Positron (β+) emission tomography (PET) is in use since many years, because accelerated ions generate positron-emitting isotopes by nuclear fragmentation in the human body. In heavy ion therapy, a major part of the PET signals is produced by β+-emitters generated via projectile fragmentation. A much higher intensity for the PET signal can be obtained using β+-radioactive beams directly for treatment. This idea has always been hampered by the low intensity of the secondary beams, produced by fragmentation of the primary, stable beams. With the intensity upgrade of the SIS-18 synchrotron and the isotopic separati…

carbon ionssädehoitoPETkuvantaminenparticle therapyionitlääketieteellinen fysiikkaradioactive ion beamspositroniemissiotomografiapositronitoxygen ionshiukkassäteily
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Ionilähdelaitteiston kehitys säteilytystestausta varten

2003

ionisoiva säteilyelektroniset piirithiukkassäteilyavaruustekniikka
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Single-event effects of space and atmospheric radiation on memory components

2017

Electronic memories are ubiquitous components in electronic systems: they are used to store data, and can be found in all manner of industrial, automotive, aerospace, telecommunication and entertainment systems. Memory technology has seen a constant evolution since the first practical dynamic Random- Access Memories (dynamic RAMs) were created in the late 60's. The demand for ever-increasing performance and capacity and decrease in power consumption was met thanks to a steady miniaturization of the component features: modern memory devices include elements barely a few tens of atomic layers thick and a few hundred of atomic layers wide. The side effect of this constant miniaturization was a…

koetusCOTSkäyttömuistitSRAMMRAMsingle-event effectmemoryRAMFRAMsäteilyfysiikkaradiation effectsflashmuistitsäteilynkestävyysradiation testingkosminen säteilyhiukkassäteilyflash-muistit
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New Capabilities of the FLUKA Multi-Purpose Code

2022

We would like to deeply thank the CERN Knowledge Transfer and Legal Service teams for their essential and extended support. Our appreciation also goes to the FLUKA.CERN Collaboration Board members for their strong commitment.

mallintaminendeuteronComputerSystemsOrganization_COMPUTERSYSTEMIMPLEMENTATIONSingle event effects (SEE)acceleratorQC1-999Materials Science (miscellaneous)beam-matter interactionBiophysicsGeneral Physics and Astronomysingle event effects (see)hiukkasfysiikkamedical physicshigh energy physicsFLUKAbenchmarkcrystal channelingbismuthsimulointiddc:530High energy physicsPhysical and Theoretical ChemistryHardware_REGISTER-TRANSFER-LEVELIMPLEMENTATIONMathematical Physicshiukkassäteilymonte carlo transportflukafacilityPhysicstietokoneohjelmatMonte Carlo transportComputing and Computersddc:Monte Carlo -menetelmätBeam-matter interactionsäteilyfysiikkaCrystal channelingaluminumbeamactivationMedical physicssimulationsParticle Physics - Experimentproton
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Particle radiation in microelectronics

2012

The unavoidable presence of particle radiation in space and on the ground combined with constantly evolving technology necessitates a deep understanding of the basic mechanisms underlying radiation effects in materials and electronic devices. This thesis provides an overview of the different radiation environments, with a review of the interaction mechanisms between energetic particles and matter. In this work a new semi-empirical model for estimating the electronic stopping force of solids for heavy ions is introduced. Radiation effects occurring in microelectronics due to particle radiation are also discussed with a brief introduction to radiation hardness assurance (RHA) testing of elect…

silicon dioxidemikroelektroniikkastopping forceradiaton effectselectronicssiliconfysiikkaheavy ionsrecombinationhiukkassäteily
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