6533b856fe1ef96bd12b2727

RESEARCH PRODUCT

Low-Power, Subthreshold Reference Circuits for the Space Environment : Evaluated with -rays, X-rays, Protons and Heavy Ions

Charalambos M. AndreouDiego Miguel González-castañoSimone GerardinMarta BagatinFaustino Gómez RodriguezAlessandro PaccagnellaAlexander V. ProkofievArto JavanainenAri VirtanenValentino LiberaliCristiano CalligaroDaniel NahmadJulius GeorgiouCharalambos M. AndreouDiego Miguel González-castañoSimone GerardinMarta BagatinFaustino Gómez RodriguezAlessandro PaccagnellaAlexander V. ProkofievArto JavanainenAri VirtanenValentino LiberaliCristiano CalligaroDaniel NahmadJulius Georgiou

subject

02 engineering and technologyHardware_PERFORMANCEANDRELIABILITYgammasäteily7. Clean energy01 natural sciencesanalog single-event transient (ASET)Ionizationsingle-event effects (SEE)0202 electrical engineering electronic engineering information engineeringAnnan elektroteknik och elektronikElectronic circuitPhysicsprotonsSubthreshold conductionionisoiva säteilyröntgensäteilyGamma raygamma-raysHardware and ArchitectureAtomic physicsVoltage referencemikroelektroniikkaprotonitComputer Networks and Communicationslcsh:TK7800-8360voltage referenceIonheavy-ions0103 physical sciencesionizationradiation hardening by design (RHBD)X-raysHardware_INTEGRATEDCIRCUITSMicroelectronicsElectrical and Electronic Engineeringhiukkassäteilybandgap voltage reference (BGR)Other Electrical Engineering Electronic Engineering Information Engineering010308 nuclear & particles physicsbusiness.industry020208 electrical & electronic engineeringlcsh:Electronicsspace electronicstotal ionization dose (TID)Analog single-event transient (ASET); Bandgap voltage reference (BGR); CMOS analog integrated circuits; Gamma-rays; Heavy-ions; Ionization; Protons; Radiation hardening by design (RHBD); Reference circuits; Single-event effects (SEE); Space electronics; Total ionization dose (TID); Voltage reference; X-raysmikropiiritsäteilyfysiikkaControl and Systems Engineeringreference circuitsSignal ProcessingbusinessSpace environmentHardware_LOGICDESIGNCMOS analog integrated circuits

description

The radiation tolerance of subthreshold reference circuits for space microelectronics is presented. The assessment is supported by measured results of total ionization dose and single event transient radiation-induced effects under &gamma

yearjournalcountryeditionlanguage
2019-05-21
10.3390/electronics8050562http://urn.kb.se/resolve?urn=urn:nbn:se:uu:diva-389867