Search results for "protonit"
showing 10 items of 43 documents
Low-Power, Subthreshold Reference Circuits for the Space Environment : Evaluated with -rays, X-rays, Protons and Heavy Ions
2019
The radiation tolerance of subthreshold reference circuits for space microelectronics is presented. The assessment is supported by measured results of total ionization dose and single event transient radiation-induced effects under &gamma
Bayesian inference of the fluctuating proton shape
2022
Using Bayesian inference, we determine probabilistic constraints on the parameters describing the fluctuating structure of protons at high energy. We employ the color glass condensate framework supplemented with a model for the spatial structure of the proton, along with experimental data from the ZEUS and H1 Collaborations on coherent and incoherent diffractive $\mathrm{J}/\psi$ production in e+p collisions at HERA. This data is found to constrain most model parameters well. This work sets the stage for future global analyses, including experimental data from e+p, p+p, and p+A collisions, to constrain the fluctuating structure of nucleons along with properties of the final state.
Proton hot spots and exclusive vector meson production
2022
We explore consequences of the existence of gluonic hot spots inside the proton for coherent and incoherent exclusive vector meson production cross sections in deep inelastic scattering. By working in the dilute limit of the Color Glass Condensate framework to compute the cross sections for Gaussian hot spots of fluctuating color charges and employing a non-relativistic vector meson wave function, we are able to perform large parts of the calculation analytically. We find that the coherent cross section is sensitive to both the size of the target and the structure of the probe. The incoherent cross section is dominated by color fluctuations at small transverse momentum transfer ($t$), by pr…
Color charge correlations in the proton at NLO: Beyond geometry based intuition
2021
Color charge correlators provide fundamental information about the proton structure. In this Letter, we evaluate numerically two-point color charge correlations in a proton on the light cone including the next-to-leading order corrections due to emission or exchange of a perturbative gluon. The non-perturbative valence quark structure of the proton is modelled in a way consistent with high-$x$ proton structure data. Our results show that the correlator exhibits startlingly non-trivial behavior at large momentum transfer or central impact parameters, and that the color charge correlation depends not only on the impact parameter but also on the relative transverse momentum of the two gluon pr…
Isospin-symmetry breaking in masses of ≃ Nuclei
2018
Effects of the isospin-symmetry breaking (ISB) beyond mean-field Coulomb terms are systematically studied in nuclear masses near the N=Z line. The Coulomb exchange contributions are calculated exactly. We use extended Skyrme energy density functionals (EDFs) with proton–neutron-mixed densities, to which we add new terms breaking the isospin symmetry. Two parameters associated with the new terms are determined by fitting mirror and triplet displacement energies (MDEs and TDEs) of isospin multiplets. The new EDFs reproduce MDEs for the T=12 doublets and T=1 triplets, and TDEs for the T=1 triplets. Relative strengths of the obtained isospin-symmetry-breaking terms are not consistent with the d…
0.1-10 MeV Neutron Soft Error Rate in Accelerator and Atmospheric Environments
2021
Neutrons with energies between 0.1-10 MeV can significantly impact the Soft Error Rate (SER) in SRAMs manufactured in scaled technologies, with respect to high-energy neutrons. Their contribution is evaluated in accelerator, ground level and avionic (12 km of altitude) environments. Experimental cross sections were measured with monoenergetic neutrons from 144 keV to 17 MeV, and results benchmarked with Monte Carlo simulations. It was found that even 144 keV neutrons can induce upsets due to elastic scattering. Moreover, neutrons in the 0.1-10 MeV energy range can induce more than 60% of the overall upset rate in accelerator applications, while their contribution can exceed 18% in avionics.…
Assessment of Proton Direct Ionization for the Radiation Hardness Assurance of Deep Submicron SRAMs Used in Space Applications
2021
Proton direct ionization from low-energy protons has been shown to have a potentially significant impact on the accuracy of prediction methods used to calculate the upset rates of memory devices in space applications for state-of-the-art deep sub-micron technologies. The general approach nowadays is to consider a safety margin to apply over the upset rate computed from high-energy proton and heavy ion experimental data. The data reported here present a challenge to this approach. Different upset rate prediction methods are used and compared in order to establish the impact of proton direct ionization on the total upset rate. No matter the method employed the findings suggest that proton dir…
Proton Direct Ionization Upsets at Tens of MeV
2023
Experimental monoenergetic proton single-event upset (SEU) cross sections of a 65-nm low core-voltage static random access memory (SRAM) were found to be exceptionally high not only at low energies ($ 3 MeV and extending up to tens of MeV. The SEU cross Section from 20-MeV protons exceeds the 200-MeV proton SEU cross Section by almost a factor of 3. Similarly, monoenergetic neutron cross sections at 14 MeV are about a factor of 3 lower than the 20-MeV proton cross section. Because of Monte Carlo (MC) simulations, it was determined that this strong enhancement is due to the proton direct ionization process as opposed to the elastic and inelastic scattering processes that dominate the SEU res…
Proton irradiation-induced reliability degradation of SiC power MOSFET
2023
The effect of 53 MeV proton irradiation on the reliability of silicon carbide power MOSFETs was investigated. Post-irradiation gate voltage stress was applied and early failures in time-dependent dielectric breakdown (TDDB) test were observed for irradiated devices. The applied drain voltage during irradiation affects the degradation probability observed by TDDB tests. Proton-induced single event burnouts (SEB) were observed for devices which were biased close to their maximum rated voltage. The secondary particle production as a result of primary proton interaction with the device material was simulated with the Geant4-based toolkit. peerReviewed
Proton Direct Ionization in Sub-Micron Technologies: Numerical Method for RPP Parameter Extraction
2022
This work introduces a numerical method to iteratively extract parameters of a rectangular parallelepiped (RPP) sensitive volume (SV) from experimental proton direct ionization SEU data. The method combines two separate numerical models. The first model estimates the average LET values for energetic ions, including protons and also heavy ions, in elemental solid targets. The second model describes the statistical variance in the energy deposition events of projectile-induced primary ionization within a RPP shaped target volume. To benchmark the method, simulated cross-section values based on RPP parameters derived with this method are compared with literature data from four SRAM devices. Th…