Search results for "integrated circuit"

showing 10 items of 130 documents

Experimental validation of a general model for three phase inverters operating in healthy and faulty modes

2012

The paper presents the experimental verification of a general mathematical model of Voltage Source Inverters (VSI) able to simulate fault conditions and which is also useful for the simulation of fault-tolerant systems for different applications. In general, in the past, the problem of faulty inverters modeling has been addressed specifically by considering faults on the different phases as separate cases. Furthermore, traditional models include only the faulty mode and not the healthy mode, so resulting then not able to predict transient phenomena. The model hereafter presented overcomes this drawback. It was formulated by introducing the concept of “healthy leg binary variables”. Such var…

EngineeringCorrectnessCircuit faults Fault tolerance Fault tolerant systems Integrated circuit modeling Inverters Mathematical model Vectorsbusiness.industryFault toleranceControl engineeringHardware_PERFORMANCEANDRELIABILITYSettore ING-IND/32 - Convertitori Macchine E Azionamenti ElettriciFault (power engineering)Fault indicatorStuck-at faultComputer Science::Hardware ArchitectureThree-phaseTransient (oscillation)Voltage sourcebusinessComputer Science::Operating SystemsComputer Science::Distributed Parallel and Cluster ComputingInternational Symposium on Power Electronics Power Electronics, Electrical Drives, Automation and Motion
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Design And Characterization Of Automated Color Sensor System

2017

Abstract The paper presents a color sensor system that can process light reflected from a surface and produce a digital output representing the color of the surface. The end-user interface circuit requires only a 3-bit pseudo flash analog-to-digital converter (ADC) in place of the conventional/typical design comprising ADC, digital signal processor and memory. For scalability and compactness, the ADC was designed such that only two comparators were required regardless of the number of color/wavelength to be identified. The complete system design has been implemented in hardware (bread board) and fully characterized. The ADC achieved less than 0.1 LSB for both INL and DNL. The experimental r…

EngineeringDigital signal processorComparatorlcsh:Tbusiness.industryInterface (computing)Process (computing)analog to digital converter (ADC)Integrated circuitlcsh:TechnologyColor sensorlaw.inventionEffective number of bitsControl and Systems Engineeringlawlight sensorlcsh:Technology (General)ScalabilityHardware_INTEGRATEDCIRCUITSElectronic engineeringlcsh:T1-995Systems designElectrical and Electronic Engineeringbusinessflash ADCInternational Journal on Smart Sensing and Intelligent Systems
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Simple Circuit Models for Studying Global Earthing Systems

2007

The paper proposes three simple circuit models for the simulation of the behaviour of a global earthing system during different fault events. The models allow one the evaluation of the maximum earth potential rise at every possible fault location and for every possible fault event. The three considered fault events are: single-line-to-earth fault inside a MV/LV substation, double-earth-fault in a MV line, single-line-to-earth fault inside a HV/MV station. After having illustrated the hypotheses at the basis of the study, the circuit models for the three fault events are presented and a numerical example shows how to use them in order to check the "global safety" of the interconnected earthi…

EngineeringEarth potential riseGroundbusiness.industryHardware_PERFORMANCEANDRELIABILITYEarthing systemFault (power engineering)Line (electrical engineering)Fault indicatorReliability engineeringStuck-at faultSettore ING-IND/33 - Sistemi Elettrici Per L'EnergiaGrounding Earth Circuit faults Substations Electrodes Integrated circuit interconnections Voltage Safety Paramagnetic resonance Fault locationFault modelbusiness
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Quasi-digital conversion for resistive devices: application in GMR-based IC current sensors

2013

Resistive devices, including sensors, are used in a huge range of applications within different scenarios. When a complete system is considered, a quasi-digital output is often recommendable. If the conversion is operated at device level, some problems such as noise disturbs, insertion losses and so on, can be reduced. In this work, we describe a resistance-tofrequency (R-f) converter with a suggested application in low current monitoring by means of GiantMagnetoResistance (GMR) sensors. Specific devices have been designed and microfabricated. The system has been tested by means of discrete components with a PCB. The complete microsystem monolithic integration in a standard CMOS technology …

EngineeringElectric current measurementAnalog IC; Current measurement; GMR sensor; Oscillator; Resistance-to-frequency converter; Hardware and Architecture; Electrical and Electronic EngineeringOscillators (electronic)Noise (electronics)Electron devices:Enginyeria electrònica::Instrumentació i mesura::Sensors i actuadors [Àrees temàtiques de la UPC]Polychlorinated biphenylsMicrosystemElectronic engineeringOscillatorDigital conversionElectrical and Electronic EngineeringGMR sensorResistive touchscreenbusiness.industrySensorsElectrical engineeringElectromagnetisme -- MesuramentsAnalog ICResistance-to-frequency converterCMOS integrated circuitsCurrent measurementCMOSHardware and ArchitectureElectromagnetic measurementsvisual_artElectronic componentvisual_art.visual_art_mediumCurrent (fluid)business
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<title>Control and measuring buses with amplitude fiber optical sensors</title>

2004

This paper presents controlling-measuring buses (linear and quasi-linear) using amplitude properties of fiber-optics and fiber-optical sensors of typical and/or special construction. It refers to linear sensors and commonly used measuring OTDR method, as wel as to realizations with linear binary sensors in transmission networks. Presented advantages and parameters of such measuring structures. Presented main area of application buses and practical realizations, regarding typical needs in industrial measurements, points out technical and economical advantages, in opposition to difficult and expensive (but more accurate) technology of measuring networks based on polarization and interfering m…

EngineeringOptical fiberbusiness.industryOptical engineeringIntegrated circuitOptical time-domain reflectometerlaw.inventionSensor arraylawFiber optic sensorControl systemElectronic engineeringbusinessWireless sensor networkSPIE Proceedings
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Mixed signal system design (A project based course)

2014

This paper describes an undergraduate 10 ECTS course in the design of analog and digital microelectronic circuits based on a project. This is offered for the students of Electronics engineering in their 3 rd semester of the 6-semester bachelor-programme. The emphasis is given on the mixed signal aspects of the system design. From the project, students get practical experience in the mixed signal system design.

EngineeringProject basedbusiness.industryEmphasis (telecommunications)ComputingMilieux_COMPUTERSANDEDUCATIONElectronic engineeringSystems engineeringSystems designMixed-signal integrated circuitbusinessCourse (navigation)Microelectronic circuits10th European Workshop on Microelectronics Education (EWME)
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Analytical compact modeling of GMR based current sensors: Application to power measurement at the IC level

2010

An analytical compact model for giant magnetoresistance (GMR) based current sensors has been developed. Different spin-valve based full Wheatstone bridge sensors, with the current straps integrated in the chip, have been considered. These devices have been experimentally characterized in order to extract the model parameters. In this respect, we have focused on the sensors linear operation regime. The model, which allows the individual description of the magnetoresistive elements, has been implemented in a circuit simulator by means of a behavioral description language: Verilog-A. We also propose the use of the devices in a direct power measurement application at the integrated circuit (IC)…

EngineeringWheatstone bridgebusiness.industryElectrical engineeringGiant magnetoresistanceIntegrated circuitWattmeterCondensed Matter PhysicsChipElectronic circuit simulationElectronic Optical and Magnetic Materialslaw.inventionPower (physics)Computer Science::Hardware ArchitecturelawMaterials ChemistryElectronic engineeringCurrent sensorElectrical and Electronic EngineeringbusinessSolid-State Electronics
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New statistical post processing approach for precise fault and defect localization in TRI database acquired on complex VLSI

2013

International audience; Timing issue, missing or extra state transitions or unusual consumption can be detected and localized by Time Resolved Imaging (TRI) database analysis. Although, long test pattern can challenge this process. The number of photons to process rapidly increases and the acquisition time to have a good signal over noise ratio (SNR) can be prohibitive. As a result, the tracking of the defect emission signature inside a huge database can be quite complicated. In this paper, a method based on data mining techniques is suggested to help the TRI end user to have a good idea about where to start a deeper analysis of the integrated circuit, even with such complex databases.

Engineering[ INFO.INFO-TS ] Computer Science [cs]/Signal and Image Processing[INFO.INFO-TS] Computer Science [cs]/Signal and Image Processing[SPI.NANO] Engineering Sciences [physics]/Micro and nanotechnologies/MicroelectronicsComputerApplications_COMPUTERSINOTHERSYSTEMS02 engineering and technologyIntegrated circuit[ SPI.SIGNAL ] Engineering Sciences [physics]/Signal and Image processingcomputer.software_genreFault (power engineering)01 natural sciencesSignalClusteringlaw.inventionFailure AnalysisDynamic Photon EmissionData acquisition[INFO.INFO-TS]Computer Science [cs]/Signal and Image Processinglaw0103 physical sciences0202 electrical engineering electronic engineering information engineering[SPI.NANO]Engineering Sciences [physics]/Micro and nanotechnologies/MicroelectronicsCluster analysis[SPI.SIGNAL] Engineering Sciences [physics]/Signal and Image processing010302 applied physicsVery-large-scale integrationDatabasebusiness.industryNoise (signal processing)Process (computing)VLSITime Resolved Imaging020201 artificial intelligence & image processing[ SPI.NANO ] Engineering Sciences [physics]/Micro and nanotechnologies/Microelectronicsbusinesscomputer[SPI.SIGNAL]Engineering Sciences [physics]/Signal and Image processing
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Frequency mapping in dynamic light emission with wavelet transform

2013

International audience; Dynamic photon emission microscopy is an e cient tool to analyse today's integrated circuit. Nevertheless, the reduction of transistor's dimensions leads to more complex acquisitions where many spots can be seen. A frequency characterization of the whole acquired area can help to have a better understanding of it. With that purpose in mind, a new methodology to draw frequency mapping of dynamic light emission acquisition is reported. It is fully automated and based on wavelet transform and autocorrelation function. Regarding the possible use in an industrial context, the suggested method can help to localize abnormal emission activity and it gives some perspectives o…

Engineering[ INFO.INFO-TS ] Computer Science [cs]/Signal and Image Processing[INFO.INFO-TS] Computer Science [cs]/Signal and Image Processing[SPI.NANO] Engineering Sciences [physics]/Micro and nanotechnologies/MicroelectronicsComputerApplications_COMPUTERSINOTHERSYSTEMSContext (language use)02 engineering and technologyIntegrated circuit[ SPI.SIGNAL ] Engineering Sciences [physics]/Signal and Image processing01 natural scienceslaw.inventionReduction (complexity)[INFO.INFO-TS]Computer Science [cs]/Signal and Image Processinglaw0103 physical sciences0202 electrical engineering electronic engineering information engineeringComputer visionElectrical and Electronic Engineering[SPI.NANO]Engineering Sciences [physics]/Micro and nanotechnologies/MicroelectronicsSafety Risk Reliability and Quality[SPI.SIGNAL] Engineering Sciences [physics]/Signal and Image processing010302 applied physicsbusiness.industryTransistorAutocorrelationWavelet transformCondensed Matter PhysicsAtomic and Molecular Physics and Optics[SPI.TRON] Engineering Sciences [physics]/ElectronicsSurfaces Coatings and FilmsElectronic Optical and Magnetic MaterialsCharacterization (materials science)[ SPI.TRON ] Engineering Sciences [physics]/Electronics[SPI.TRON]Engineering Sciences [physics]/Electronics020201 artificial intelligence & image processingLight emission[ SPI.NANO ] Engineering Sciences [physics]/Micro and nanotechnologies/MicroelectronicsArtificial intelligencebusiness[SPI.SIGNAL]Engineering Sciences [physics]/Signal and Image processing
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Sub-mA current measurement by means of GMR sensors and state of the art lock-in amplifiers

2015

Electric current measurement at the range of μA in integrated circuit has been traditionally carried out by micro-electronically engineered systems, such as current mirrors or charging capacitors. However, off-line, i.e., non-intrusive methods provide advantages related to size and power consumption. In this sense, giant magnetoresistance (GMR) magnetic sensors are optimal due to their sensitivity and CMOS compatibility. In this work, we make use of specifically designed CMOS GMR-based current sensors in combination with a custom electronic interface based on a low-voltage low-power lock-in amplifier, demonstrating the capability of this combination for current measurement in the range of μ…

Engineeringbusiness.industryAmplifierElectrical engineeringGiant magnetoresistanceSense (electronics)Integrated circuitlaw.inventionCapacitorCurrent mirrorCMOSHardware_GENERALlawCurrent sense amplifierElectronic engineeringbusiness2015 IEEE International Conference on Industrial Technology (ICIT)
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