6533b7d0fe1ef96bd125af40
RESEARCH PRODUCT
Frequency mapping in dynamic light emission with wavelet transform
Samuel ChefSabir JacquirStéphane BinczakPhilippe PerduKevin Sanchezsubject
Engineering[ INFO.INFO-TS ] Computer Science [cs]/Signal and Image Processing[INFO.INFO-TS] Computer Science [cs]/Signal and Image Processing[SPI.NANO] Engineering Sciences [physics]/Micro and nanotechnologies/MicroelectronicsComputerApplications_COMPUTERSINOTHERSYSTEMSContext (language use)02 engineering and technologyIntegrated circuit[ SPI.SIGNAL ] Engineering Sciences [physics]/Signal and Image processing01 natural scienceslaw.inventionReduction (complexity)[INFO.INFO-TS]Computer Science [cs]/Signal and Image Processinglaw0103 physical sciences0202 electrical engineering electronic engineering information engineeringComputer visionElectrical and Electronic Engineering[SPI.NANO]Engineering Sciences [physics]/Micro and nanotechnologies/MicroelectronicsSafety Risk Reliability and Quality[SPI.SIGNAL] Engineering Sciences [physics]/Signal and Image processing010302 applied physicsbusiness.industryTransistorAutocorrelationWavelet transformCondensed Matter PhysicsAtomic and Molecular Physics and Optics[SPI.TRON] Engineering Sciences [physics]/ElectronicsSurfaces Coatings and FilmsElectronic Optical and Magnetic MaterialsCharacterization (materials science)[ SPI.TRON ] Engineering Sciences [physics]/Electronics[SPI.TRON]Engineering Sciences [physics]/Electronics020201 artificial intelligence & image processingLight emission[ SPI.NANO ] Engineering Sciences [physics]/Micro and nanotechnologies/MicroelectronicsArtificial intelligencebusiness[SPI.SIGNAL]Engineering Sciences [physics]/Signal and Image processingdescription
International audience; Dynamic photon emission microscopy is an e cient tool to analyse today's integrated circuit. Nevertheless, the reduction of transistor's dimensions leads to more complex acquisitions where many spots can be seen. A frequency characterization of the whole acquired area can help to have a better understanding of it. With that purpose in mind, a new methodology to draw frequency mapping of dynamic light emission acquisition is reported. It is fully automated and based on wavelet transform and autocorrelation function. Regarding the possible use in an industrial context, the suggested method can help to localize abnormal emission activity and it gives some perspectives on automatic databases comparison.
year | journal | country | edition | language |
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2013-11-30 |