Search results for "integrated"

showing 10 items of 1783 documents

Spatial Bayesian Modeling Applied to the Surveys of Xylella fastidiosa in Alicante (Spain) and Apulia (Italy)

2020

The plant-pathogenic bacterium Xylella fastidiosa was first reported in Europe in 2013, in the province of Lecce, Italy, where extensive areas were affected by the olive quick decline syndrome, caused by the subsp. pauca. In Alicante, Spain, almond leaf scorch, caused by X. fastidiosa subsp. multiplex, was detected in 2017. The effects of climatic and spatial factors on the geographic distribution of X. fastidiosa in these two infested regions in Europe were studied. The presence/absence data of X. fastidiosa in the official surveys were analyzed using Bayesian hierarchical models through the integrated nested Laplace approximation (INLA) methodology. Climatic covariates were obtained from …

Xylella fastidiosa0106 biological scienceshierarchical Bayesian modelsDiurnal rangeLeaf scorchPlant Sciencelcsh:Plant cultureBayesian inference01 natural sciences010104 statistics & probabilityCovariatemedicinelcsh:SB1-11100101 mathematicsspecies distribution modelsXylella fastidiosabiologySpatial structurealmond leaf scorchintegrated nested Laplace approximation15. Life on landbiology.organism_classificationmedicine.diseaseConfounding effectstochastic partial differential equationGeographyolive quick declineSampling distributionXylella fastidiosaCartography010606 plant biology & botanyFrontiers in Plant Science
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"Table 2" of "Measurement of ZZ production in pp collisions at sqrt(s)=7 TeV and limits on anomalous ZZZ and ZZgamma couplings with the ATLAS detecto…

2014

The measured total cross sections. The first systematic uncertainty is the combined systematic uncertainty excluding luminosity, the second is the luminosity.

Z ProductionAstrophysics::High Energy Astrophysical PhenomenaP P --> Z0 Z0 XIntegrated Cross Section7000.0Astrophysics::Cosmology and Extragalactic AstrophysicsCross SectionSIGInclusiveProton-Proton ScatteringAstrophysics::Solar and Stellar AstrophysicsHigh Energy Physics::ExperimentZ pair ProductionAstrophysics::Galaxy Astrophysics
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"Table 1" of "Measurement of ZZ production in pp collisions at sqrt(s)=7 TeV and limits on anomalous ZZZ and ZZgamma couplings with the ATLAS detecto…

2014

The measured fiducial cross sections. The first systematic uncertainty is the combined systematic uncertainty excluding luminosity, the second is the luminosity.

Z ProductionAstrophysics::High Energy Astrophysical PhenomenaP P --> Z0 Z0 XIntegrated Cross Section7000.0Astrophysics::Cosmology and Extragalactic AstrophysicsCross SectionSIGInclusiveProton-Proton ScatteringAstrophysics::Solar and Stellar AstrophysicsHigh Energy Physics::ExperimentZ pair ProductionAstrophysics::Galaxy Astrophysics
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"Table 8" of "Determination of $alpha_{s}$ in second order {QCD} from hadronic $Z$ decays"

1992

The differential 2-jet rate D2 as a function of YCUT.

Z ProductionE+ E- --> HADRONSIntegrated Cross Section91.2E+ E- --> 2JET XE+ E- --> Z0 XJet ProductionCross SectionSIGInclusiveDijet ProductionE+ E- ScatteringExclusiveR measurement
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"Table 13" of "Measurement of the production cross section for Z/gamma* in association with jets in pp collisions at sqrt(s) = 7 TeV with the ATLAS d…

2014

Cross section for Inclusive Jet Multiplicity for the electron channel and the muon channel in the individual lepton fiducial regions and uncorrected for QED effects.

Z ProductionHigh Energy Physics::PhenomenologyIntegrated Cross SectionAstrophysics::Instrumentation and Methods for AstrophysicsAstrophysics::Cosmology and Extragalactic AstrophysicsJet ProductionCross SectionSIGInclusiveP P --> Z0 JET XP P --> GAMMA* JET XProton-Proton ScatteringHigh Energy Physics::ExperimentComputer Science::Information Theory
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"Table 5" of "Measurement of differential Z / gamma* + jet + X cross sections in p anti-p collisions at s**(1/2) = 1.96-TeV"

2008

Integrated cross section.. The second DSYS error is from the muon identification and the third from the luminosity measurement.

Z ProductionPhysics::Instrumentation and DetectorsAstrophysics::High Energy Astrophysical PhenomenaIntegrated Cross SectionAstrophysics::Cosmology and Extragalactic AstrophysicsJet ProductionCross SectionSIGMuon productionInclusivePhysics::Accelerator PhysicsHigh Energy Physics::ExperimentPBAR P --> Z0 JET XPBAR P --> GAMMA* JET X1960.0
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Cluster matching in time resolved imaging for VLSI analysis

2014

International audience; If scaling has the benefit of enabling manufacturers to design tomorrow's integrated circuits, from the failure analyst point of view it also has the drawback of making devices more complex. The test sequence for modern VLSI can be quite long, with thousands of vector. Dynamic photon emission databases can contain millions of photons representing thousands of state changes in the region of interest. Finding a candidate location where to perform physical analysis is quite challenging, especially if the fault occurs on a single vector. In this paper, we suggest a new methodology to find single vector fault in dynamic photon emission database. The process is applied at …

[ INFO.INFO-TS ] Computer Science [cs]/Signal and Image ProcessingMatching (graph theory)[INFO.INFO-TS] Computer Science [cs]/Signal and Image ProcessingComputer science[SPI.NANO] Engineering Sciences [physics]/Micro and nanotechnologies/Microelectronics[ SPI.SIGNAL ] Engineering Sciences [physics]/Signal and Image processing02 engineering and technologyIntegrated circuitFault (power engineering)computer.software_genre01 natural sciencesk-nearest neighbors algorithmlaw.invention[INFO.INFO-TS]Computer Science [cs]/Signal and Image Processinglaw0103 physical sciences0202 electrical engineering electronic engineering information engineeringPoint (geometry)[SPI.NANO]Engineering Sciences [physics]/Micro and nanotechnologies/MicroelectronicsCluster analysisComputer Science::Databases[SPI.SIGNAL] Engineering Sciences [physics]/Signal and Image processing010302 applied physicsVery-large-scale integrationProcess (computing)Computer engineering[ SPI.NANO ] Engineering Sciences [physics]/Micro and nanotechnologies/Microelectronics020201 artificial intelligence & image processingData mining[SPI.SIGNAL]Engineering Sciences [physics]/Signal and Image processingcomputerProceedings of the 21th International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA)
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Design and Characterization of Automated Color Sensors System

2014

International audience; The paper presents a color sensor system that can process light reflected from a surface and produce a digital output representing the color of the surface. The end-user interface circuit requires only a 3-bit pseudo flash analog-to-digital converter (ADC) in place of the conventional/typical design comprising ADC, digital signal processor and memory. For scalability and compactness, the ADC was designed such that only two comparators were required regardless of the number of color/wavelength to be identified. The complete system design has been implemented in hardware (bread board) and fully characterized. The ADC achieved less than 0.1 LSB for both INL and DNL. The…

[ INFO.INFO-TS ] Computer Science [cs]/Signal and Image Processing[INFO.INFO-TS]Computer Science [cs]/Signal and Image Processing[INFO.INFO-TS] Computer Science [cs]/Signal and Image ProcessingHardware_INTEGRATEDCIRCUITS[ SPI.SIGNAL ] Engineering Sciences [physics]/Signal and Image processing[SPI.SIGNAL]Engineering Sciences [physics]/Signal and Image processing[SPI.SIGNAL] Engineering Sciences [physics]/Signal and Image processing
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Persistent random walks, variable length Markov chains and piecewise deterministic Markov processes *

2013

A classical random walk $(S_t, t\in\mathbb{N})$ is defined by $S_t:=\displaystyle\sum_{n=0}^t X_n$, where $(X_n)$ are i.i.d. When the increments $(X_n)_{n\in\mathbb{N}}$ are a one-order Markov chain, a short memory is introduced in the dynamics of $(S_t)$. This so-called "persistent" random walk is nolonger Markovian and, under suitable conditions, the rescaled process converges towards the integrated telegraph noise (ITN) as the time-scale and space-scale parameters tend to zero (see Herrmann and Vallois, 2010; Tapiero-Vallois, Tapiero-Vallois2}). The ITN process is effectively non-Markovian too. The aim is to consider persistent random walks $(S_t)$ whose increments are Markov chains with…

[MATH.MATH-PR] Mathematics [math]/Probability [math.PR]Variable length Markov chainProbability (math.PR)Semi Markov processesIntegrated telegraph noise[MATH.MATH-PR]Mathematics [math]/Probability [math.PR]Mathematics::ProbabilitySimple and double infinite combs.Variable memoryFOS: Mathematics[ MATH.MATH-PR ] Mathematics [math]/Probability [math.PR]Mathematics - ProbabilityPersistent random walkSimple and double infinite combsPiecewise Deterministic Markov Processes
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Near-field spectroscopy of low-loss waveguide integrated microcavities

2006

International audience; A scanning near-field spectroscopy method is used to observe loss reduction and Q-factor enhancement due to transverse-mode profile matching within photonic-crystal microcavities. Near-field measurements performed directly on cavity modes are compared with three-dimensional calculations and quantitative agreement is observed. (c) 2006 American Institute of Physics.

[PHYS.PHYS.PHYS-AO-PH]Physics [physics]/Physics [physics]/Atmospheric and Oceanic Physics [physics.ao-ph]Materials sciencePhysics and Astronomy (miscellaneous)business.industryPhotonic integrated circuitPhysics::OpticsNear and far field01 natural sciencesWaveguide (optics)010309 opticsOptics[ PHYS.PHYS.PHYS-AO-PH ] Physics [physics]/Physics [physics]/Atmospheric and Oceanic Physics [physics.ao-ph]Q factor0103 physical sciencesOptoelectronicsNear-field scanning optical microscope010306 general physicsbusinessSpectroscopyMicrophotonicsPhotonic crystalApplied Physics Letters
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