6533b83afe1ef96bd12a7a89

RESEARCH PRODUCT

Cluster matching in time resolved imaging for VLSI analysis

subject

description

International audience; If scaling has the benefit of enabling manufacturers to design tomorrow's integrated circuits, from the failure analyst point of view it also has the drawback of making devices more complex. The test sequence for modern VLSI can be quite long, with thousands of vector. Dynamic photon emission databases can contain millions of photons representing thousands of state changes in the region of interest. Finding a candidate location where to perform physical analysis is quite challenging, especially if the fault occurs on a single vector. In this paper, we suggest a new methodology to find single vector fault in dynamic photon emission database. The process is applied at the post-acquisition level and is based on clustering algorithm and nearest neighbor research.