Search results for "near-field optics"
showing 10 items of 46 documents
Time-resolved FDTD and experimental FTIR study of gold micropatch arrays for wavelength-selective mid-infrared optical coupling
2021
The work was partially supported by Sweden's innovation agency Vinnova (Large area CVD graphene-based sensors/IR-photodetectors 2020-00797) and EU CAMART2 project (European Union's Horizon 2020 Framework Programme H2020-WIDESPREAD-01-2016-2017-TeamingPhase2 under grant agreement No.739508). TY acknowledges European Regional Development Fund Project No. 1.1.1.2/VIAA/4/20/740.
Spatially resolved photonic transfer through mesoscopic heterowires
2002
We report spatially resolved observations of light wave propagation along high refraction index dielectric heterowires lying on a transparent substrate. The heterowires are made of linear chains of closely packed mesoscopic particles. The optical excitation of these heterowires is performed through channel waveguides featuring submicrometer transverse cross sections. Both numerical simulations and near-field optical images, recorded with a photon scanning tunneling microscope, agree to show that, at visible frequencies, tuning the periodicity of the heterowires controls the propagation length within a range of several micrometers.
Super-Resolution Scanning Near-Field Optical Microscopy
2007
Scanning near-field optical microscopy (SNOM) is a method to obtain information about the optical properties of a sample at a lateral resolution below the diffraction limit of far-field microscopy. In SNOM, a light source of a dimension which is small compared to the wavelength of light and which is held at a small distance from the sample is scanned across the surface of the sample. The modulation by the sample of the light emitted from the source is recorded as a signal. As a general rule one may say that the size of the source and the distance to the sample limit the resolution of SNOM. A radiating self-emitting point dipole may be regarded as an idealized SNOM source. With such a source…
Coupling evanescently low loss Silicon-on-insulator (SOI) ridge waveguides(WGs) including high Q nanocavities: For light control
2011
We have fabricated a multislotted optical nanoresonator with several spatial field distributions which are all addressable by the wavelength. The reported structure consists in an array of evanescently coupled single mode photonic crystal nanocavities. By using a scanning near-field optical microscope, we quantify the morphology of the different optical mode volumes and show that they consist in grids of light confined at the subwavelength scaleOver the last recent years, optical microcavities have proven their ability to slow down, control and even trap light inside an ultra small volume. Several approaches have led to quality factor (Q) records allowing to reach high photon life-time for …
Surface plasmon circuitry in opto-electronics
2012
This tutorial reviews the physics of surface plasmon circuitry in order to bring to the fore recently demonstrated applications of surface plasmon in optoelectronics such as on-board optical interconnects or routing in datacom networks.
<title>Study of color centers in optical fibers to be used for ITER plasma diagnostics</title>
2007
ABSTRACT The paper presents a comparative study, by off-line measurements of the irradiation induced optical attenuation in several large diameter (600 µm) optical fibers subjected to gamma-rays and neutron irradiation. The optical fiber samples fall into two categories: optical fibers with an enhanced UV transmission (high OH content core) and solarization resistant optical fibers. The irradiation conditions were as follows: a) gamma irradiation at a 60 Co source, with a dose rate of 0.33 kGy/h +/- 5%, up to the maximum total irradiation dose of 313 kGy; b) neutron irradiation (mean energy 5.2 MeV) using a deuteron beam (13 MeV) and a thick beryllium target, for a total fluence of 6x10 12 …
Observation of Light Confinement Effects with a Near-Field Optical Microscope.
1996
This Letter reports the experimental observation of light confinement effects by near-field optical microscopy. Depolarization effects giving rise to light confinement close to nanoscopic objects have been unambiguously observed in near-field optical images of subwavelength dielectric pads etched on a flat glass substrate. According to the incident polarization, this phenomenon leads to reverse contrasts in the near-field optical image of the same subwavelength objects.
Scanning optical microscopy modeling in nanoplasmonics
2012
International audience; One of the main purposes of nanoplasmonics is the miniaturization of optical and electro-optical components that could be integrable in coplanar geometry. In this context, we propose a numerical model of a polarized scanning optical microscope able to faithfully reproduce both photon luminescence and temperature distribution images associated with complex plasmonic structures. The images are computed, pixel by pixel, through a complete self-consistent scheme based on the Green dyadic functions (GDF) formalism. The basic principle consists in the numerical implementation of a realistic three-dimensional light beam acting as a virtual light tip able to probe the volume…
Diffractive optics for processing ultrashort light pulses
2011
In this work we combine, in principle, two disjoint optical fields, diffractive optics and ultrashort light radiation. This combination allows us to manipulate in a very unconventional manner femtosecond pulses and, on the other hand, to implement a set of novel applications. In our case we have focused our attention on material processing and biophotonics applications.
Applications of near-field optics to the characterization of optoelectronics components
1997
In the race towards purely optical communications, the necessity of producing integrated components is linked to the requirement for the precise characteriza-tion of optoelectronic components. Near-field detection techniques meet this requirement, AFM (Atomic Force Microscopy), for instance, can provide the topography of a given sample. In conjunction with these new tools, several different kinds of near-field optical microscopes (NFOM) have appeared. They enable the characteriza-tion of the components with a resolution better than that imposed by the Rayleigh criterion. This is primarily due to the fact that they are sensitive to the evanescent waves. This document presents several areas r…