Search results for "speckle"

showing 10 items of 123 documents

Resolution enhancement in quantitative phase microscopy

2019

Quantitative phase microscopy (QPM), a technique combining phase imaging and microscopy, enables visualization of the 3D topography in reflective samples, as well as the inner structure or refractive index distribution of transparent and translucent samples. Similar to other imaging modalities, QPM is constrained by the conflict between numerical aperture (NA) and field of view (FOV): an imaging system with a low NA has to be employed to maintain a large FOV. This fact severely limits the resolution in QPM up to 0.82λ/NA, λ being the illumination wavelength. Consequently, finer structures of samples cannot be resolved by using modest NA objectives in QPM. Aimed to that, many approaches, suc…

PhysicsDiffractionbusiness.industryResolution (electron density)02 engineering and technology021001 nanoscience & nanotechnology01 natural sciencesAtomic and Molecular Physics and OpticsNumerical aperture010309 opticsSpeckle patternOptics0103 physical sciencesMicroscopyNear-field scanning optical microscope0210 nano-technologybusinessRefractive indexImage resolutionAdvances in Optics and Photonics
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Displacement Measurement Through Digital Image Correlation and Digital Speckle Pattern Interferometry Techniques in Cold-Expanded Holes

2010

:  In this paper, the displacement field induced by the split-sleeve cold expansion of holes was measured using both digital image correlation (DIC) and digital speckle pattern interferometry (DSPI) techniques. Thus, the experimental results, which were evaluated on the inlet surface of a 6082-T6 aluminium plate, were compared with those from theoretical prediction. DIC provided accurate measurements up to the elastic–plastic boundary, whereas the DSPI technique highlighted the changes of displacement in the elastic domain. Prediction of the displacement based on the existing analytical model agreed with the experimental results achieved with both techniques. Possible explanations for the d…

PhysicsDigital image correlationbusiness.industryMechanical EngineeringBoundary (topology)Displacement basedDisplacement (vector)Speckle patternInterferometryOpticsMechanics of MaterialsElectronic speckle pattern interferometryDisplacement fieldbusinessStrain
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Human contrast sensitivity in coherent Maxwellian view: effect of coherent noise and comparison with speckle.

1997

Lasers have been used in vision for measuring the neural contrast sensitivity function (CSF) by forming interference fringes on the retina. We distinguish among three kinds of illumination with lasers: incoherent (without noise), Maxwellian or coherent (with coherent noise), and diffuse coherent (with speckle). The three have different characteristics and different CSF's. A coherent imaging system is designed to measure the CSF with fully coherent illumination. This is the CSF of the whole visual system, although it is measured with gratings imaged on the retina. It therefore differs from the neural CSF's measured by other authors with partially coherent illumination. However, the neural CS…

PhysicsMasking (art)business.industrymedia_common.quotation_subjectSpeckle noiseRefraction OcularLuminanceAtomic and Molecular Physics and OpticsRetinaElectronic Optical and Magnetic MaterialsContrast SensitivitySpeckle patternNoiseOpticsImage Processing Computer-AssistedContrast (vision)HumansComputer Vision and Pattern RecognitionSpatial frequencySpeckle imagingbusinessMathematicsmedia_commonJournal of the Optical Society of America. A, Optics, image science, and vision
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Coherent light scattering on nanofluids: computer simulation results.

2008

If coherent light is incident on a suspension containing nanoparticles, they act as scattering centers and the result of the far-field interference is a "speckled" image. The scattering centers have a complex movement of both sedimentation and Brownian motion. Consequently the speckle image is not static but presents time fluctuations. A computer code to simulate the dynamics of the coherent light scattering on nanofluids was written, tested, and used to calculate the far-field intensity variation for nanofluids having different particle size. The results are discussed and an alternative experimental method for fast nanoparticle size assessing is suggested as a possible application.

PhysicsScatteringbusiness.industryMaterials Science (miscellaneous)Industrial and Manufacturing EngineeringLight scatteringSpeckle patternsymbols.namesakeLight intensityNanofluidOpticsDynamic light scatteringsymbolsSpeckle imagingBusiness and International ManagementRayleigh scatteringbusinessApplied optics
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Three-Dimensional Mapping and Ranging of Objects Using Speckle Pattern Analysis

2010

In this chapter, we present two novel approaches for 3-D object shape measurement and range estimation based on digital image processing of speckle patterns. In the first one, 3-D mapping and range measurement are retrieved by projecting, through a ground glass diffuser, random speckle patterns on the object or on the camera for a transmissive and reflective configuration, respectively. Thus, the camera sensor records in time sequence different speckle patterns at different distances, and by using correlation operation between them, it is possible to achieve 3-D mapping and range finding. In the second one, the 3-D mapping and ranging are performed by sensing the visibility associated with …

PhysicsSpeckle patternInterferometrybusiness.industryReference beamDigital image processingVisibility (geometry)Speckle noiseComputer visionRangingArtificial intelligenceImage sensorbusiness
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Three-dimensional mapping and range measurement by means of projected speckle patterns.

2008

We present a novel approach for three-dimensional (3D) measurements that includes the projection of coherent light through ground glass. Such a projection generates random speckle patterns on the object or on the camera, depending if the configuration is transmissive or reflective. In both cases the spatially random patterns are seen by the sensor. Different spatially random patterns are generated at different planes. The patterns are highly random and not correlated. This low correlation between different patterns is used for both 3D mapping of objects and range finding.

Physicsbusiness.industryMaterials Science (miscellaneous)Spectral densitySpeckle noiseIndustrial and Manufacturing EngineeringSpeckle patternInterferometryOpticsElectronic speckle pattern interferometrySpatial frequencySpeckle imagingBusiness and International ManagementbusinessProjection (set theory)Applied optics
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Self-trapping of speckled light beams

2008

A speckle beam of light breaks up into small fragments as it propagates in a standard self-focusing nonlinear material. Now, by exploiting the non-local thermal response of a material, it is possible to trap a speckle beam in a self-induced waveguide.

Physicsbusiness.industryPhysics::OpticsTrapping01 natural sciencesAtomic and Molecular Physics and OpticsElectronic Optical and Magnetic Materialslaw.invention010309 opticsNonlinear systemSpeckle patternComputer Science::GraphicsOpticslaw0103 physical sciencesThermalPhysics::Accelerator PhysicsLight beamOptoelectronics010306 general physicsbusinessWaveguideBeam (structure)ComputingMilieux_MISCELLANEOUS
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Displacement measurements in structural elements by optical techniques

2000

Speckle metrology and holographic interferometry (HI) have been used in several civil engineering applications. We present the results obtained by applying speckle photography (SP) to the study of two quadratic shearwalls with different boundary conditions, and the potential of the technique in the study of this kind of structures is described. The analysis of Young's fringes obtained with this technique at certain points on each shearwall provides the whole field of displacement measurements. HI has been used to measure the three components of absolute displacement, verifying that the bulging phenomenon does not affect the in-plane components when the applied load remains on the same plane…

Physicsbusiness.industryPlane (geometry)Mechanical EngineeringHolographic interferometryAtomic and Molecular Physics and OpticsDisplacement (vector)Finite element methodElectronic Optical and Magnetic MaterialsMetrologySpeckle patternOpticsElectronic speckle pattern interferometryBoundary value problemElectrical and Electronic EngineeringbusinessOptics and Lasers in Engineering
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Automatic analysis of speckle photography fringes

1997

Speckle interferometry is a technique adequate to metrological problems such as the measurement of object deformation. An automatic system of analysis of such measurements is given; it consists of a motorized x-y plate positioner controlled by computer, a CCD video camera, and software for image analysis. A fringe-recognition algorithm determines the spacing and orientation of the fringes and permits the calculation of the magnitude and direction of the displacement of the analyzed object point in images with variable degrees of illumination. For a 256 x 256 pixel image resolution, the procedure allows one to analyze from three fringes to a number of fringes that corresponds to 3 pixels/fri…

PixelImage qualitybusiness.industryComputer scienceOrientation (computer vision)Materials Science (miscellaneous)Astrophysics::Instrumentation and Methods for AstrophysicsVideo cameraSpeckle noiseImage processingHolographic interferometryIndustrial and Manufacturing Engineeringlaw.inventionOpticslawComputer Science::Computer Vision and Pattern RecognitionSpeckle imagingBusiness and International ManagementbusinessImage resolutionApplied Optics
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Superresolved imaging based on wavelength multiplexing of projected unknown speckle patterns

2015

We propose a method for resolution enhancement of a diffraction limited optical system based on the capture of a set of low resolution images. These images are obtained after projection of an ensemble of unknown speckle patterns on top of the high resolution object that is to be imaged. Each speckle pattern is generated by the same thin (and unknown) diffuser, but illuminated with a slightly different wavelength. From the ensemble of low resolution images, we obtain a system of equations that can be solved in an iterative manner that enables reconstruction of the high resolution object. As a result, we also achieve the projected high resolution speckle patterns used for the encoding.

Point spread functionPhysicsDiffractionbusiness.industryMaterials Science (miscellaneous)Resolution (electron density)Physics::OpticsSpeckle noiseIndustrial and Manufacturing EngineeringSpeckle patternOpticsSpatial frequencySpeckle imagingBusiness and International ManagementbusinessProjection (set theory)Applied Optics
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