Search results for "synchrotron radiation"

showing 10 items of 146 documents

Crystallization of SrCO3 on a self-assembled monolayer substrate: an in-situ synchrotron X-ray study

2001

Self-assembled monolayers (SAMs) of alkanethiols on gold surfaces show great promise in controlling the nucleation and growth of inorganic minerals from solution. In doing so, they mimic the role of some biogenic macromolecules in natural biomineralisation processes. Crystallization on SAM surfaces is usually monitored ex-situ; by allowing the process to commence and to evolve for some time, removing the substrate from the mother solution, and then examining it using microscopy, diffraction etc. We present here for the first time, the use of high energy monochromatic synchrotron X-radiation in conjunction with a two dimensional detector to monitor in situ, in a time resolved fashion, the gr…

Strontium carbonateNucleationSynchrotron radiationSelf-assembled monolayerGeneral ChemistrySubstrate (electronics)Synchrotronlaw.inventionchemistry.chemical_compoundCrystallographychemistryChemical engineeringlawMonolayerMaterials ChemistryCrystallizationJournal of Materials Chemistry
researchProduct

Resolving the forbidden band of SF6

2013

Sulfur hexafluoride is an important molecule for modeling thermophysical and polarizability properties. It is also a potent greenhouse gas of anthropogenic origin, whose concentration in the atmosphere, although very low is increasing rapidly; its global warming power is mostly conferred by its strong infrared absorption in the ν3 S-F stretching region near 948 cm(-1). This heavy species, however, features many hot bands at room temperature (at which only 31% of the molecules lie in the ground vibrational state), especially those originating from the lowest, v6 = 1 vibrational state. Unfortunately, the ν6 band itself (near 347 cm(-1)), in the first approximation, is both infrared- and Raman…

Sulfur hexafluoridechemistry.chemical_compoundDipolechemistryInfraredPolarizabilityGeneral Physics and AstronomyInfrared spectroscopySynchrotron radiationRotational–vibrational spectroscopyPhysical and Theoretical ChemistryAtomic physicsHot bandPhys. Chem. Chem. Phys.
researchProduct

Synchrotron Mössbauer Reflectometry in Materials Science

1999

57Fe nuclear resonant scattering experiments are reported on iron-containing thin films using 14.41 keV synchrotron radiation at angles of grazing incidence around and slightly above the critical angle of the electronic total reflection. In partially oxidised α–Fe films of 20 nm original thickness various oxide and oxihydroxide phases are identified at different depth. In a [Fe/FeSi]10multilayer grown on Zerodur®substrate the Fe—Fe interlayer coupling varies with the distance from the substrate. The antiferromagnetic order of the top layers of this multilayer can be suppressed by external magnetic field. These examples demonstrate the efficiency of synchrotron Mossbauer reflectometry (SMR),…

Total internal reflectionMaterials scienceCondensed matter physicslawMössbauer spectroscopySynchrotron radiationSubstrate (electronics)Thin filmReflectometryHyperfine structureSynchrotronlaw.invention
researchProduct

Recent Achievement and Perspectives in Synchrotron Radiation X-Ray Absorption Spectroscopy

2003

During the last 20 years, x-ray absorption spectroscopy (XAS) has found extensive application in the materials science [1, 2, 3]. solution chemistry [4], biology [5]. therapeutic chemistry [6] and geochemistry. However. it is relatively recently XAS methods have been utilized for measurements on archaeological materials [7,8].

X-ray absorption spectroscopyAbsorption spectroscopyAnalytical chemistrySynchrotron radiationSolution chemistry
researchProduct

A new tool for nanoscale X-ray absorption spectroscopy and element-specific SNOM microscopy.

2007

Abstract Investigations of complex nanostructured materials used in modern technologies require special experimental techniques able to provide information on the structure and electronic properties of materials with a spatial resolution down to the nanometer scale. We tried to address these needs through the combination of X-ray absorption spectroscopy (XAS) using synchrotron radiation microbeams with scanning near-field optical microscopy (SNOM) detection of the X-ray excited optical luminescence (XEOL) signal. The first results obtained with the prototype instrumentation installed at the European Synchrotron Radiation Facility (Grenoble, France) are presented. They illustrate the possibi…

X-ray absorption spectroscopyMaterials scienceAbsorption spectroscopyXEOLGeneral Physics and AstronomySynchrotron radiationNanotechnologyCell BiologyXANESXANESlaw.inventionOptical microscopeStructural BiologylawZnO; ZnWO4MicroscopyGeneral Materials ScienceNear-field scanning optical microscopeSNOMNanoscopic scaleFilmsMicron (Oxford, England : 1993)
researchProduct

X-ray absorption spectroscopy of Cu-doped $WO_{3}$ films for use inelectrochemical metallization cell memory

2014

Abstract We have performed the first synchrotron radiation X-ray absorption spectroscopy (EXAFS/XANES) study of the local atomic and electronic structure around Cu and W ions in WO 3 /Cu/WO 3 /Si and WO 3 /Cu/Si multilayered structures, aimed for the application in the electrochemical metallization cell memory. The influence of low-temperature annealing at 135 °C has been investigated in details, and a structural model of Cu-doped WO 3 films is proposed.

X-ray absorption spectroscopyMaterials scienceExtended X-ray absorption fine structureAbsorption spectroscopyAnnealing (metallurgy)Analytical chemistrySynchrotron radiationElectronic structureCondensed Matter PhysicsXANESElectronic Optical and Magnetic MaterialsMaterials ChemistryCeramics and Compositesddc:660Thin film
researchProduct

Chemical microimaging and microspectroscopy of surfaces with a photoemission microscope

1997

We applied element sensitive photoemission electron microscopy (PEEM) to investigate surfaces of devices built from complex materials. Conventional PEEM suffers from lack of information about the chemical composition of the imaged surface. Such information can be obtained by PEEM via tuning the photon energy to X-ray absorption edges. To apply spectromicroscopy we acquired and subtracted microscopic images using photon energies just below and at the edges. The resulting difference gives a micro-image of the lateral distribution of a specific element. Microspectroscopy is performed by recording the intensity of secondary electrons in selected spots during a sweep of the photon energy. We app…

X-ray absorption spectroscopyMaterials sciencePhotonMicroscopebusiness.industrySynchrotron radiationSurfaces and InterfacesPhoton energyCondensed Matter PhysicsSecondary electronsSurfaces Coatings and Filmslaw.inventionPhotoemission electron microscopyOpticslawMaterials ChemistrybusinessAbsorption (electromagnetic radiation)Surface Science
researchProduct

The polarization dependence of x‐ray photoelectron yield of a Au photocathode

1994

We report a measurement of the total photoelectron yield of gold as a function of the incident x‐ray polarization. Polarized x rays with energies of 2.5, 2.7, and 4.0 keV were used to excite a gold photocathode at a glancing incidence angle between 5° and 50°. Contrary to a previous report, we found no measurable polarization dependence for all three x‐ray energies. We conclude that the modulation factor, i.e., the fractional change of the total yield when the polarization state is varied, is less than 4%.

X-ray photoelectron spectroscopySolid-state physicsChemistryX-rayGeneral Physics and AstronomySynchrotron radiationAtomic physicsPhotoelectric effectPolarization (waves)PhotocathodeModulation factorJournal of Applied Physics
researchProduct

Using photoelectron emission microscopy with hard-X-rays

2001

We present several successful test cases of using photoelectron emission microscopy (PEEM) for photon energy up to 25 keV. First, the full extended X-ray absorption fine structure analysis was implemented in areas as small as 100 mum(2) for transition-metal K edge absorption spectra and, therefore, demonstrated the feasibility of combining structural and chemical analysis with hard-X-ray absorption spectroscopy with high lateral resolution. We also show that PEEM can be used in a transmission (radiography) mode as an imaging detector for hard-X-ray, This approach again leads to the unprecedented 0.3 mum lateral resolution, particularly critical for the use of coherence-based phase contrast …

X-ray spectroscopyX-ray absorption spectroscopyAbsorption spectroscopyExtended X-ray absorption fine structurebusiness.industryChemistrySynchrotron radiationSurfaces and InterfacesPhoton energyCondensed Matter PhysicsSurfaces Coatings and FilmsOpticsK-edgeX-ray photoelectron spectroscopyMaterials ChemistrybusinessSurface Science
researchProduct

High-resolution far-infrared synchrotron FTIR spectroscopy and analysis of the ν 7 , ν 19 and ν 20 bands of trioxane

2022

Rovibrational bands spectra of three ν20, ν7 and ν19 bands of 1, 3, 5 – trioxane (H2CO)3 were recorded in the 50–650 cm−1 range using a long path absorption cell coupled to a high resolution Fourier transform spectrometer and synchrotron radiation at the AILES beamline of the SOLEIL synchrotron. More than 16 000 lines were assigned with a dRMS better than 0.17 × 10−3 cm−1. Two different formalisms (tensorial and Watson) were used to derive accurate rotational and quartic parameters for the three bands and for the first time, a precise determination of Coriolis parameter and q+ l−doubling constant for both ν20 and ν19 perpendicular bands was obtained. Last, each set of spectroscopic paramete…

[CHIM.THEO] Chemical Sciences/Theoretical and/or physical chemistryLine positionsSynchrotron radiationHigh-Resolution Infrared SpectroscopyTensorial FormalismWatson’s Formalism
researchProduct