Messung der Zerst�ubungsraten an Nichtleitern und Bestimmung der Bindungsenthalpie von Kieselglas

1968

Elektronenmikroskopische Untersuchung von Transversalschnitten d�nner Schichten auf festen Unterlagen

1969

A method is described which allows to prepare transverse sections of thin films by means of an ion etching technique so that transmission electron micrographs of the film structure can be carried out. A section through a 6-layered optical film with a total thickness of 0.62 μm is shown as an example.

XPS study of leached glass surfaces

1990

Abstract By use of a special deconvolution algorithm, it was possible to decompose the XPS O 1s signal into several components reflecting different oxygen bonds. The influence of exposure in vacuo, environmental atmosphere, distilled water, and in a polish solution as corrosive media on the surface of different glasses has been studied. The O 1s signals of fused silica, Na 2 O· n SiO 2 glasses, a BaO·SiO 2 and a BaOB 2 O 3 SiO 2 glass (Schott SK 16) were analyzed. On the glass surfaces, leached layers were formed and analyzed qualitatively and semiquantitatively by XPS and optical and infrared methods. As a reference, virgin surfaces of samples broken in ultrahigh vacuum have been used. T…

Quantitative XPS analysis of leached layers on optical glasses

1993

The corrosion of optical glasses often reduces the utility of uncoated glasses as well as the adhesion of resistive coatings deposited onto corroded glasses. Photoelectron spectroscopy (XPS) was applied to study glass surfaces with respect to their surface corrosion. In particular, leaching by the influence of polish slurries, pure water, air and even residual gases inside a vacuum device was studied in detail. Pure quartz glass and different sodium and barium silicate glasses were broken in ultrahigh vacuum (4 × 10−10 mbar) for the determination of sensitivity factors of the different XPS signals. It was found that a quantitative determination of the surface composition of corroded and lea…

Discrete bond model (DBM) of sodium silicate glasses derived from XPS, Raman and NMR measurements

1993

In sodium silicate glasses, the fraction of differently bound Si species Q[i] (i = 0−4), depending on the number i of bridging oxygens bound to the quarternary silicon, is a function of stoichiometry and the Na/Si ratio. Sodium silicate glasses were investigated by high resolution X-ray photoelectron spectroscopy. To explain the differences in chemical shifts and linewidths of the O 1s signal of the bridging and the non-bridging oxygen as a function of alkali concentration, and extended glass model was developed. This new model takes into account the influence of the alkali concentration on the Q[i] distribution and on the appearance and concentrations of differently bound bridging oxygens …