0000000000011711

AUTHOR

Marko Käyhkö

showing 6 related works from this author

Minimum detection limits and applications of proton and helium induced X-ray emission using transition-edge sensor array

2017

Abstract We have determined minimum detection limits, MDLs, for elements 14 ⩽ Z ⩽ 86 using a transition-edge sensor array, TES array, and as a comparison using an Amptek X-123SDD silicon drift detector, SDD. This was done using a 3 MeV proton beam and a 5.1 MeV helium beam. MDLs were determined for a thin film sample on top of C substrate, and for a bulk sample containing mostly Al. Due to the higher peak-to-background ratio, lower detection limits were obtainable using the TES array for most of the elements. However, for elements 30 ⩽ Z ⩽ 45 the performance of the TES array was not as good as the SDD performance. This is due to the limitations of the TES used at energies >10 keV. The great…

helium-induced x-ray emissionNuclear and High Energy PhysicsSilicon drift detectorProtonAnalytical chemistrychemistry.chemical_element02 engineering and technologySubstrate (electronics)01 natural sciencesSensor array0103 physical sciencesPIXEThin film010306 general physicsInstrumentationHeliumPhysicsta114minimum detection limit021001 nanoscience & nanotechnologychemistryTransition edge sensor0210 nano-technologyTESBeam (structure)
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Broadband Ultrahigh-Resolution Spectroscopy of Particle-Induced X Rays: Extending the Limits of Nondestructive Analysis

2016

Nondestructive analysis (NDA) based on x-ray emission is widely used, for example, in the semiconductor and concrete industries. Here, we demonstrate significant quantitative and qualitative improvements in broadband x-ray NDA by combining particle-induced emission with detection based on superconducting microcalorimeter arrays. We show that the technique offers great promise in the elemental analysis of thin-film and bulk samples, especially in the difficult cases where tens of different elements with nearly overlapping emission lines have to be identified down to trace concentrations. We demonstrate the efficiency and resolving capabilities by spectroscopy of several complex multielement …

010302 applied physicsSuperconductivityPhysicsspectroscopyta114nondestructive analysisspektroskopiaNondestructive analysisGeneral Physics and Astronomyx-rays01 natural sciencesImaging phantomTheoretical physicsUltrahigh resolution0103 physical sciencesParticleAtomic physics010306 general physicsSpectroscopyPhysical Review Applied
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A new beamline for energy-dispersive high-resolution PIXE analysis using polycapillary optics

2019

Abstract A new beamline for high energy resolution PIXE measurements is presented. This new setup includes options for both in-air and vacuum measurements. For the high energy resolution transition-edge sensor array, a polycapillary lens is used for detecting low-energy X-rays down to 0.5 keV and to increase the effective solid angle. X-ray transmission of the polycapillary lens was characterized using two calibration standards. The gain obtained by adding a polycapillary lens was 1.6–2.3 at energies between 2.1 keV and 4.5 keV. From 1.04 to 1.74 keV the gain is increased to 2.1–3.0, and at energies 4.9–8.0 keV the gain is between 1.6 and 0.65. The measured gain agreed well with theoretical…

Nuclear and High Energy PhysicsMaterials scienceAstrophysics::High Energy Astrophysical PhenomenatutkimuslaitteetHigh resolutionAstrophysics::Cosmology and Extragalactic Astrophysics01 natural sciencesexternal-PIXElaw.inventionOpticsSensor arrayPolycapillary opticslaw0103 physical sciencesalkuaineanalyysiPIXE010306 general physicsHigh energy resolutionInstrumentationta114business.industrypolycapillary lens010401 analytical chemistrySolid angletransition-edge sensor0104 chemical sciencesLens (optics)BeamlineHigh Energy Physics::ExperimentbusinessEnergy (signal processing)Nuclear Instruments and Methods in Physics Research. Section B: Beam Interactions with Materials and Atoms
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Tang dynasty (618-907) bowl measured with PIXE

2017

Brownish bowl originating from an underwater shipwreck located near Belitung island in the Java Sea, some 600 km south-east from Singapore, has been measured with particle induced X-ray emission. This study was a pilot project for the – now a spin-off company – Recenart research team where one target was to evaluate the authenticity of the different type of art objects. PIXE measurements were done from three different material positions from a single bowl received from a customer. These locations were categorized as a bluish/greenish pigment (under glaze), thick glaze and the body clay. When the obtained data was compared to the other references from different dynasties and kiln sites, the …

Nuclear and High Energy Physicsta114KilnGlazeGhangsha kiln ware02 engineering and technologyBelitung shipwreck021001 nanoscience & nanotechnologyArchaeology0202 electrical engineering electronic engineering information engineeringPIXE020201 artificial intelligence & image processingTang dynasty0210 nano-technologyInstrumentationGeology
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Heavy ion induced Ti X-ray satellite structure for Ti, TiN, and TiO2 thin films

2018

Materials sciencebiologyta114Analytical chemistryX-ray02 engineering and technology021001 nanoscience & nanotechnologybiology.organism_classification01 natural sciencesspectrometryspektrometriatitaanithin films0103 physical sciencesHeavy ionSatellite (biology)titaniumThin filmohutkalvot010306 general physics0210 nano-technologySpectroscopyX-ray Spectrometry
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Hiukkasherätteinen röntgen-emissio ohutkalvojen analysoinnissa

2013

Tässä tutkielmassa tavoitteena oli analysoida ohutkalvoja hiukkasherätteisellä röntgen-emissiolla (PIXE) käyttäen apuna takaisinsirontaa. Erityisesti tavoitteena oli selvittää pystytäänkö PIXEllä saamaan lisätietoa tilanteissa, joissa pelkän takaisinsironnan avulla ei saada tarkkaa tietoa. Tähän tarkoitukseen tutkittiin kahta eri tapausta: lähekkäisten alkuaineiden suhteen määritys ja pienten epäpuhtauksien määritys. Lähekkäisten alkuaineiden analysoinnissa käytettiin GeCu-näytettä. Täs- sä tapauksessa 1,5 MeV:n takaisinsirontaspektristä ei pystytty erottamaan germaniumin ja kuparin piikkejä, mutta se pystyttiin tekemään 3,0 MeV:n energialla. PIXE-mittauksissa germaniumin ja kuparin piikit …

SEM-EDStakaisinsirontaPIXEohutkalvosirontaohutkalvotemissioHiukkasherätteinen röntgen-emissioRBS
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