0000000000073065

AUTHOR

B. Nickson

showing 2 related works from this author

TID and SEE Tests of an Advanced 8 Gbit NAND-Flash Memory

2008

We report on the dose and operational mode dependence of error percentage, stand-by current, erase and write time of 8 Gbit / 4 Gbit NAND-flash memories as well as on their static, dynamic and SEFI cross sections.

Non-volatile memoryHardware_MEMORYSTRUCTURESComputer scienceNand flash memorybusiness.industryGigabitHardware_ARITHMETICANDLOGICSTRUCTURESbusinessComputer hardwareFlash memoryHardware_LOGICDESIGN2008 IEEE Radiation Effects Data Workshop
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Influence of beam conditions and energy for SEE testing

2012

GANIL/Applications industrielles; The effects of heavy-ion test conditions and beam energy on device response are investigated. These effects are illustrated with two types of test vehicles: SRAMs and power MOSFETs. In addition, GEANT4 simulations have also been performed to better understand the results. Testing to high fluence levels is required to detect rare events. This increases the probability of nuclear interactions. This is typically the case for power MOSFETs, which are tested at high fluences for single event burnout or gate rupture detection, and for single-event-upset (SEU) measurement in SRAMs below the direct ionization threshold. Differences between various test conditions (…

Nuclear and High Energy PhysicsMaterials scienceIon beamPopulationchemistry.chemical_elementPower MOSFETsIonOpticsXenonIonizationion beam energyStatic random-access memoryElectrical and Electronic Engineeringspecie effectPower MOSFETeducationShadow mappingPhysicseducation.field_of_studyRange (particle radiation)power MOSFETta114business.industrySRAMNuclear Energy and EngineeringOrders of magnitude (time)chemistry[PHYS.COND.CM-MS]Physics [physics]/Condensed Matter [cond-mat]/Materials Science [cond-mat.mtrl-sci]Atomic physicsspecies effectSRAM.businessBeam (structure)Energy (signal processing)Voltage2011 12th European Conference on Radiation and Its Effects on Components and Systems
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