6533b7cffe1ef96bd1258cca

RESEARCH PRODUCT

TID and SEE Tests of an Advanced 8 Gbit NAND-Flash Memory

Fritz GliemH. SchmidtD. WalterReno Harboe-sorensenAri VirtanenB. Nickson

subject

Non-volatile memoryHardware_MEMORYSTRUCTURESComputer scienceNand flash memorybusiness.industryGigabitHardware_ARITHMETICANDLOGICSTRUCTURESbusinessComputer hardwareFlash memoryHardware_LOGICDESIGN

description

We report on the dose and operational mode dependence of error percentage, stand-by current, erase and write time of 8 Gbit / 4 Gbit NAND-flash memories as well as on their static, dynamic and SEFI cross sections.

https://doi.org/10.1109/redw.2008.13