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RESEARCH PRODUCT
TID and SEE Tests of an Advanced 8 Gbit NAND-Flash Memory
Fritz GliemH. SchmidtD. WalterReno Harboe-sorensenAri VirtanenB. Nicksonsubject
Non-volatile memoryHardware_MEMORYSTRUCTURESComputer scienceNand flash memorybusiness.industryGigabitHardware_ARITHMETICANDLOGICSTRUCTURESbusinessComputer hardwareFlash memoryHardware_LOGICDESIGNdescription
We report on the dose and operational mode dependence of error percentage, stand-by current, erase and write time of 8 Gbit / 4 Gbit NAND-flash memories as well as on their static, dynamic and SEFI cross sections.
year | journal | country | edition | language |
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2008-07-01 | 2008 IEEE Radiation Effects Data Workshop |