0000000000142884
AUTHOR
Henri Mariette
Reduction of the internal electric field in GaN/AlN quantum dots grown on the a ‐plane of SiC substrates
We present a study of the emission of a multi-layer stack of self-assembled GaN/AlN quantum dots grown on the a -plane of 6H-SiC. We look for signatures of the internal electric field in the power dependence of the time-integrated and time-resolved photoluminescence spectra. The lack of a dynamical red-shift reveals that internal electric fields are significantly reduced in these dots. A band on the low energy side of the emission is observed whose intensity quenches fast when increasing the temperature. The polarization selection rules of the emission are examined in order to determine the physical nature of this band. (© 2005 WILEY-VCH Verlag GmbH & Co. KGaA, Weinheim)
Influence of strain in the reduction of the internal electric field in GaN/AlN quantum dots grown ona-plane 6H-SiC
The strain state of stacks of GaN/AIN quantum dots (QDs) grown on (0001) and (1120) 6H-SiC has been investigated by means of Raman spectroscopy. Depending on the orientation of the wurtzite axis with respect to the growth direction it is found that the piezoelectric contribution to the electrostatic potential may either reinforce that arising from the spontaneous polarization or oppose it. The experimental results are compared with a theoretical model for the strain and polarization field in QDs of both orientations that allows the calculation of the electrostatic potential in the QDs. Both the experimental results and the theoretical model indicate that the internal electric field and elec…